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Save Up to 50% When You Configure a Calibrated Wideband Mm-Wave Signal Generator - Promotion Flyer
For a limited time, you will receive 50% off high-performance millimeter-wave signal generation hardware when you buy Signal Optimizer software.

Material promocional 2017-03-31

PDF PDF 432 KB
Switching to Keysight Oscilloscopes? Save now!
Save now! See Promotion Details

Catálogo 2016-12-31

Bulletins - About Keysight
Recent communications, electronics test and measurement focused news releases.

Documentación de prensa 2016-12-05

Temperature Measurement Solution for Solar Cell and Module Testing - Application Note
This application note discuss a test solution for hearable. This application note may help you if you are R&D engineers, test engineers or test lab personnel who responsible for testing Hearables.

Nota de aplicación 2016-12-02

PDF PDF 1.81 MB
N1245B Monolithic Laser Combiner (MLC400B) - Data Sheet
The MLC400B monolithic laser combiner offers unmatched innovation in confocal and fluorescence microscopy, while the fixed mounting system guarantees permanent laser alignment.

Hoja de datos 2016-12-01

PDF PDF 711 KB
E8267D Option SP2 – User’s Guide
The Dynamic Sequencing Option SP2 enhances the “segment advance” ARB capability to allow jumping to any of the 256 different segments in ARB Waveform Memory. The next segment to be played is determined dynamically via an 8-bit value input on pdata(7..0) and is strobed in using the patt_trig_in2 signal.

Manual del usuario 2016-12-01

PDF PDF 1.11 MB
Command Expert 1.6 Update 1 Release Notes
Learn about Command Expert 1.6 Update 1

Nota de actualización 2016-12-01

E8267D Option SP1 – User’s Guide
E8267D Option SP1 provides connectivity to Signal Studio for Jitter Injection on the E8267D. The software has pre-defined rates and deviations according to Table 3.3 ITU-T G.8251 (10/02) input jitter tolerance limit on the Optical Transport Network (OTN). The user can set up custom rates, deviations, and waveform types such as, sinusoidal, square, saw tooth, exponential, triangle and custom. These periodic jitter types can also be summed with random jitter for a composite clock signal.

Manual del usuario 2016-12-01

PDF PDF 950 KB
N8834A MultiScope Application - Data Sheet
N8834A MultiScope application enables Infiniium real-time oscilloscope users to bring multiple scopes together for measurement on a single timebase.

Hoja de datos 2016-12-01

Keysight EEsof EDA Newsletter - Product and Application News
Keep tabs on the latest product and application news and review the archives of the Keysight EEsof EDA Newsletter.

Boletín de noticias 2016-12-01

N9040B UXA X-Series Signal Analyzer, Muliti-touch - Data Sheet
The UXA data sheet provides a summary of key performance parameters and specification for N9040B UXA signal analyzers.

Hoja de datos 2016-12-01

86120D and 86122C Multi-Wavelength Meters - Data Sheet
This publication describes the technical specifications and ordering information for the 86120D and 86122C Multi-Wavelength Meter.

Hoja de datos 2016-12-01

PDF PDF 849 KB
Synthesis Made Easy With Keysight Genesys
Learn how to quickly design many different RF circuits with various topologies in these short tutorial videos. These step-by-step tutorials walk you through the steps to accelerate your routine design tasks from hours to minutes with automatic RF circuit and system synthesis tools.

Demostración básica 2016-12-01

E7760A Wideband Transceiver Software Release Descriptions
Release Notes

Nota de actualización 2016-11-30

PDF PDF 166 KB
Simplify PAM-4 receiver test with M8040A 64Gbaud BERT – Video
Overview of the M8040A 64Gbaud high-performance BERT for PAM-4 and NRZ. This video explains target applications and shows key capabilities and output performance.

Demostración básica 2016-11-30

Testing 5G: Time to Throw Away the Cables - Article Reprint Microwave Journal
This article describes the test challenges of 5G technology, and sets the scene for what lies ahead to test 5G at mmWave frequencies, almost all over the air (OTA) without cables.

Nota de aplicación 2016-11-30

PDF PDF 3.25 MB
N4917B Optical Receiver Stress Test Solution – Video
This video provides an overview about Keysight’s automated 100G optical receiver stress test solution N4917B. See why Keysight’s N4917B solution can help to significantly speed up the LR4, ER4 and SR4 optical receiver compliance test for 100G.

Demostración básica 2016-11-30

Reducing the Cost of Test through Strategic Asset Management - Article Reprint
This paper explores the balance of the three fundamental aspects that make up asset management and will focus on how to implement strategies to lower the total cost of ownership for test.

Artículo 2016-11-30

PDF PDF 821 KB
Release Notes for MD2 High-Speed Digitizer Software 2.1

Nota de actualización 2016-11-29

PDF PDF 148 KB
Integrating Multiple Technology Devices onto Laminate-Based Multi-Chip-Modules
Microwave Product Digest (MPD) featured article on "Integrating Multiple Technology Devices onto Laminate-Based Multi-Chip-Modules Using an Integrated Design Flow", written by Keefe Bohanan, Applications Engineer District Manager for Keysight EEsof EDA.

Artículo 2016-11-29

PDF PDF 3.90 MB
Switch to the Keysight EXA X-Series Signal Analyzer
Switch to the Keysight EXA X-Series Signal Analyzer

Retos y Oportunidades 2016-11-29

W3301A LPDDR3 178-ball Rigid BGA Interposer - Data Sheet
The W3301A LPDDR3 BGA interposer enables probing of embedded memory LPDDR3 178-ball DRAM from the ball grid array with Keysight U4164A logic analyzers.

Hoja de datos 2016-11-29

PDF PDF 1.97 MB
Switch to the Keysight MXA Signal Analyzer
Switch to the Keysight MXA Signal Analyzer

Retos y Oportunidades 2016-11-29

Using Fast-Sweep Techniques to Accelerate Spur Searches - Application Note
This application note describes how to achieve significant speed improvements in signal analysis for spur searches.

Nota de aplicación 2016-11-29

Keysight to Demonstrate Latest 5G, 802.11ad Design and Test Solutions at IEEE Globecom 2016
Keysight announces it will demonstrate a wide range of first-to-market design, test and characterization solutions at IEEE Globecom 2016, Washington D.C., Dec. 4 – 7.

Documentación de prensa 2016-11-29

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