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PCI Express Receiver Testing Responds To New Challenges - Article
PCI Express Receiver Testing Responds To New Challenges

기사 2015-03-24

Performing LTE & LTE-Advanced RF Measurements with E7515A UXM Wireless Test Set - Application Note
This application note provides insights into example test procedures for RF testing of LTE and LTE-A UEs based on 3GPP TS 36.521-1 V12.2.0 (2014-06).

어플리케이션 노트 2015-03-24

PDF PDF 9.75 MB
Extended Service Period Solutions - Brochure
Keysight offers a variety of service and replacement options for thousands of older, critical instruments, including trade-ins, premium used equipment, and Extended Service Period Repair and Cal.

브로셔 2015-03-24

PDF PDF 525 KB
N9079A & W9079A TD-SCDMA X-Series Measurement Application - Technical Overview
The N9079A & W9079A X-Series measurement application adds one-button, standard-based power and modulation analysis for the design and manufacturing of TD-SCDMA devices.

기술 개요 2015-03-24

PDF PDF 2.91 MB
Keysight WaferPro Express
The Keysight WaferPro Express software performs automated wafer-level measurements of semiconductor devices such as transistors and circuit components. It provides turnkey drivers and test routines for a variety of instruments and wafer probers. Its user interface makes it easy to setup and run complex wafer-level test plans, while powerful customization capabilities are enabled by the new Python programming environment.

기본 데모 2015-03-24

N9071A and W9071A GSM/EDGE/EVO X-Series Measurement Application - Technical Overview
An overview of the GSM/EDGE/EVO (N/W9071A) X-Series measurement applications.

기술 개요 2015-03-24

PDF PDF 3.94 MB
Power Supply Rejection Ratio (PSRR) Measurements - Application Note
Power Supply Rejection Ratio (PSRR) measurements for power supply characterization, unique to Keysight’s portfolio of measurements, can be performed using InfiniiVision X-Series oscilloscopes.

어플리케이션 노트 2015-03-24

PDF PDF 1.52 MB
ISO 17025 Accredited Calibration Sites
Our published scope of accreditation covers the widest range of parameters to support our measurements in comparison to third party service providers

브로셔 2015-03-24

Automated X-Ray Inspection System Keysight Technologies - Technical Overview
This is a technical datasheet. Keysight has developed a sealed ultra-high vacumn X-ray tube that provides stable output throughout a significantly long life.

어플리케이션 노트 2015-03-24

PDF PDF 644 KB
E4982A LCR Meter 1 MHz to 3 GHz - Data Sheet
This literature is a data sheet of the E4982A. It describes the technical specifications of the E4982A.

데이터시트 2015-03-24

PDF PDF 777 KB
Press Releases | About Keysight
Keysight news and resources - Press Releases

보도자료 2015-03-24

Highly Integrated J-BERT Simplifies Testing for Next-Generation Data-Center, Long-Haul-Communication
Highly Integrated J-BERT Simplifies Testing for Next-Generation Data-Center, Long-Haul-Communication Applications

보도자료 2015-03-24

Atomic Force Microscopy Studies in Various Environments - Application Note
Overview of using the environmental chamber with water, humidity and gaseous vapors in Polymer research

어플리케이션 노트 2015-03-23

PDF PDF 5.80 MB
E8257D PSG Microwave Analog Signal Generator - Data Sheet
This datasheet includes information on the E8257D PSG RF Analog Signal Generator.

데이터시트 2015-03-23

PDF PDF 3.92 MB
7500 STM Scanner - Data Sheet

데이터시트 2015-03-23

PDF PDF 104 KB
SAS-3 Stimulus Remote Setup Guide
This document describes the steps to setup the stimulus remotely for the N5412D SAS-3 Compliance Test Software.

기본 데모 2015-03-23

PDF PDF 360 KB
Oscilloscopes in Aerospace/Defense Debugging MIL-STD 1553 serial buses - Brochure
Keysight's InfiniiVision 3000 X-Series oscilloscopes provide MIL-STD 1553 triggering and decoding, as well as eye-diagram mask test capability to help you debug your MIL-STD 1553 buses faster.

어플리케이션 노트 2015-03-23

Measure Parasitic Capacitance and Inductance Using TDR - White Paper
Time-domain reflectometry (TDR) is commonly used as a convenient method of determining the characteristic impedance of a transmission line or quantifiying reflections caused by discontinuities along or at the termination of a transmission line. TDR can also be used to measure quantities such as the input capacitiance of a voltage probe, the inductance of a jumper wire, the end-to-end capacitance of a resistor, or the effective loading of a PCI card.

기술 개요 2015-03-23

PDF PDF 1.58 MB
Extended Service Period Solution
Keysight’s knowledge and expertise provide three key benefits when it comes to per-incident services on products beyond their end-of-support date.

브로셔 2015-03-23

PDF PDF 505 KB
SATA Stimulus Remote Setup Guide
This document describes the steps to setup the stimulus remotely for the N5411B SATA6G Compliance Test Software.

기본 데모 2015-03-23

PDF PDF 485 KB
33391C Microwave Insulator (Bead) Assembly - Data Sheet
This data sheet describes the 33391C Microwave Insulator Assembly. It includes product features, description and technical specifications as well as mechanical drawings and SWR chart.

데이터시트 2015-03-23

PDF PDF 236 KB
E5071C-TDR Application Software Revision History

릴리스 노트 2015-03-23

PDF PDF 98 KB
Combining Atomic Force Microscopy with Scanning Electrochemical Microscopy - Application Note
Application note discussing the combined AFM-SECM approach with bifunctional probe provides topographical and correlated electrochemical information with high spatial and temporal resolution, thereby enabling the transformation of scanning probe microscopic techniques into multifunctional devices.

어플리케이션 노트 2015-03-22

PDF PDF 1.02 MB
M9393A PXIe Performance Vector Signal Analyzer - Data Sheet
This document provides the technical specifications and characteristics for the M9393A PXIe performance vector signal analyzer.

데이터시트 2015-03-22

E4982A LCR Meter, 1 MHz to 3 GHz - Configuration Guide
This configuration guide describes standard configurations, options, accessories and upgrades information for the E4982A RF LCR Meter.

구성 가이드 2015-03-20

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