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86100D DCA-X Wide-Bandwidth Oscilloscope Family - Configuration Guide
See how to configure your Keysight sampling oscilloscope with additional options to speed your testing.

구성 가이드 2016-07-20

PDF PDF 3.80 MB
N5465A InfiniiSim Waveform Transformation Toolset for Infiniium Oscilloscopes - Data Sheet
InfiniiSim is co-simulation software that derives transfer functions to convert or filter an acquisition to show a waveform at a different circuit location or different circuit rendering than probed.

데이터시트 2016-07-20

N8811A I²S Protocol Triggering and Decode Option for Infiniium Series Oscilloscopes - Data Sheet
Keysight’s N8811A I²S triggering and decode software provides unique software-accelerated decoding to help you accurately debug audio designs with the I²S bus.

데이터시트 2016-07-20

PDF PDF 1.08 MB
Low Frequency Noise Analyzer Technical Demo
A more technical dive on the new Advanced Low-Frequency Noise Analyzer with WaferPro Express, which offers the unique ability to measure and model device noise across wafers. This release features a new user interface and tight integration with Keysight's WaferPro Express software, a platform that performs automated wafer-level measurements of semiconductor devices.

기본 데모 2016-07-20

SystemVue Electronic System-Level (ESL) Design Software
SystemVue ESL design software is a multi-domain modeling implementation and verification cockpit for electronic system-level (ESL) design.

브로셔 2016-07-19

PDF PDF 1.72 MB
Understanding LTE-Advanced Base Station Transmitter RF Conformance Testing - Application Note
This application note focuses on LTE-A basestation transmitter testing using the 3GPP RF conformance tests. Examples provided with MXA Signal Analyzer, multi-touch and the LTE-A measurement app.

어플리케이션 노트 2016-07-19

PDF PDF 4.51 MB
In-Vehicle bus analysis Signal monitoring & protocol analysis of CXPI, CAN, CAN-FD, LIN, FlexRay and

브로셔 2016-07-19

PDF PDF 351 KB
Keysight Seamlessly Integrates Low-Frequency Noise Measurements in Wafer Level Solution Platform
New Advanced Low-Frequency Noise Analyzer Offers Unique Ability to Measure and Model Device Noise Across Wafers.

보도자료 2016-07-19

Power Meters and Power Sensors - Brochure
This is a comprehensive brochure that covers Keysight’s wide range of power meters and sensors for RF and microwave applications.

브로셔 2016-07-19

PDF PDF 11.93 MB
N1911A/N1912A P-Series Power Meters and N1921A/N1922A Wideband Power Sensors - Data Sheet
This data sheet contains technical specifications and information for the N1911A/N1912A P-Series Power Meters and N1921A/N1922A Power Sensors.

데이터시트 2016-07-19

InfiniiVision 6000L Series Oscilloscopes 3D Model, IGES Format
This is a IGES format 3D model of the 6000L Series oscilloscope and rack mount kit for inclusion in your 3D models for rack mounting solutions, etc.

기술 개요 2016-07-18

ZIP ZIP 3.53 MB
3D Models for N2135A Programmable NFC 3-in-1 Antenna (IGES, SAT, Step, and PKG Formats)
3D models are useful when designing holding fixtures for the antenna. In the zip file are IGES, SAT, Step, and PKG format models.

기술 개요 2016-07-18

ZIP ZIP 4.40 MB
InfiniiVision 6000L Series Oscilloscopes 3D Model, Step Format
This is a Step format 3D model of the 6000L Series oscilloscope and rack mount kit for inclusion in your 3D models for rack mounting solutions, etc.

기술 개요 2016-07-18

ZIP ZIP 2.36 MB
Introducing the 2016 Advanced Low-Frequency Noise Analyzer
The new Advanced Low-Frequency Noise Analyzer Offers Unique Ability to Measure and Model Device Noise Across Wafers. This release features a new user interface and tight integration with Keysight's WaferPro Express software, a platform that performs automated wafer-level measurements of semiconductor devices.

기본 데모 2016-07-18

Troubleshooting Clock Jitter – Picotest
Troubleshooting Clock Jitter from Keysight Technologies and Picotest

솔루션 개요 2016-07-18

3D Models for N2134A Programmable NFC 3-in-1 Antenna (IGES, SAT, Step, and PKG Formats)
3D models are useful when designing holding fixtures for the antenna. In the zip file are IGES, SAT, Step, and PKG format models.

기술 개요 2016-07-18

ZIP ZIP 4.38 MB
InfiniiVision 6000L Series Oscilloscopes 3D Model, SAT Format
This is a SAT format 3D model of the 6000L Series oscilloscope and rack mount kit for inclusion in your 3D models for rack mounting solutions, etc.

기술 개요 2016-07-18

ZIP ZIP 2.95 MB
3D Models for N2116A Programmable NFC 3-in-1 Antenna (IGES, SAT, Step, and PKG Formats)
3D models are useful when designing holding fixtures for the antenna. In the zip file are IGES, SAT, Step, and PKG format models.

기술 개요 2016-07-18

ZIP ZIP 4.16 MB
Online Help, Automated NFC Test Software
Describes how to use the automated NFC test software application.

도움말 파일 2016-07-15

CHM CHM 2.60 MB
Online Help, Automated NFC Test Software (PDF Version)
This is a printable PDF version of the Automated NFC Test Software online help.

도움말 파일 2016-07-15

PDF PDF 2.95 MB
E4727A Advanced Low-Frequency Noise Analyzer
The E4727A Advanced Low-Frequency Noise Analyzer supports wafer mapping measurement and data analysis of flicker noise and random telegraph noise.

데이터시트 2016-07-15

Power Supply Control Loop Response (Bode Plot) Measurements - Application Note
Unique to Keysight’s portfolio of measurements are frequency response measurements including Control Loop Response (Bode) and can be performed using InfiniiVision X-Series oscilloscopes.

어플리케이션 노트 2016-07-15

Scanning Microwave Microscopy Solutions for Quantitative Semiconductor Device Characterization
Discussion of Scanning Microwave combined with Atomic Force Microscopy for calibrated measurements for Semiconductor devices

어플리케이션 노트 2016-07-15

PDF PDF 3.31 MB
Power Supply Rejection Ratio (PSRR) Measurements - Application Note
Power Supply Rejection Ratio (PSRR) measurements for power supply characterization, unique to Keysight’s portfolio of measurements, can be performed using InfiniiVision X-Series oscilloscopes.

어플리케이션 노트 2016-07-15

WaferPro Express Support Home
WaferPro Express support home page in Keysight EEsof EDA Knowledge Center.

사용자 매뉴얼 2016-07-15

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