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Electronic Measurement

Find by Product Model Number: Examples: 34401A, E4440A

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EMV Level 1 Secure Payment Testing – FIME
EMV Level 1 Secure Payment Testing from FIME and Keysight.

Solution Brief 2014-08-04

Articulated Robotic Near-Field Electromagnetic Scanning System – APREL
Articulated Robotic Near-Field Electromagnetic Scanning System – APREL and Keysight.

Solution Brief 2014-08-04

PXI Functional Test - TTCI
PXI Functional Test Solution from TTCI and Keysight.

Solution Brief 2014-05-14

Test Instrument Emulator - WinSoft
Test Instrument Emulation Solution from WinSoft and Keysight.

Solution Brief 2014-05-14

Functional Test - TTCI
Functional Test Solutions from TTCI and Keysight.

Solution Brief 2014-05-14

A-GPS OTA Measurements for CTIA Certification - MVG
A-GPS OTA Multi-Probe Antenna Measurement Solutions for CTIA Certification from Microwave Vision Group and Keysight

Solution Brief 2014-04-30

Burn-In Test - LXinstruments
Burn-in Testing Solutions from LXinstruments and Keysight.

Solution Brief 2014-04-30

Open Test Platform - LXinstruments
LXI Functional Test Solutions from LXinstruments and Keysight.

Solution Brief 2014-04-30

A-GPS OTA Measurements for CTIA Certification – ETS-Lindgren
A-GPS OTA Antenna Measurement Solution for CTIA Certification from ETS-Lindgren and Keysight

Solution Brief 2014-04-29

Real-Time Near-Field Cell Phone Antenna Measurements - EMSCAN
Real-Time Near-Field Cell Phone Antenna Measurements from EMSCAN and Keysight

Solution Brief 2014-04-16

Modular Functional Test – Circuit Check
Modular Functional Test Solutions from Circuit Check and Keysight

Solution Brief 2014-04-16

Satellite Test Solution – AAI
Satellite Payload and Panel Test Solution from AAI and Keysight Technologies

Solution Brief 2014-04-09

Mobile Phone Load Pull Measurements - Maury Microwave
Automated Mobile Phone Load Pull Measurement Solution from Maury Microwave and Keysight

Solution Brief 2014-04-02

The World’s Highest Pin Count In-Circuit Test Solutions – Solution Sources Programming
The World’s Highest Pin Count In-Circuit Test Solutions from Solution Sources and Keysight

Solution Brief 2013-09-18