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Using Network Analyzer Time-Domain Analysis to Verify and Troubleshoot Complex Components - Article
Microwave Product Digest May 2013 feature article that discusses using FieldFox's time domain analysis to troubleshoot complex components.

Article 2013-06-19

PDF PDF 1.60 MB
What is waveform update rate and why does it matter?
Explore this often overlooked oscilloscope performance specification to learn how to determine an oscilloscope’s update rate and what a fast update rate can mean for you.

Article 2013-06-03

Students “Learn by Doing” at Cal Poly

Article 2013-05-27

Celebrating 100 Years of Excellence in Engineering Education and Research

Article 2013-05-27

University of Hawaii using Agilent Equipment for Patient Monitoring Research

Article 2013-05-27

Yellow Jackets Buzz at the Speed of Light

Article 2013-05-27

Agilent and ITESM (Mexico) Collaborate to Prepare Students for Careers in Industry

Article 2013-05-27

Morgan State Strives to Make Engineering Education More Accessible

Article 2013-05-27

Popcorn and Oscilloscopes!

Article 2013-05-27

Keysight Test Equipment Hits the Ivy League

Article 2013-05-27

Agilent Technologies’ Instrumentation Powers World-Class EE Teaching Lab

Article 2013-05-27

Agilent Equipment Plays an Instrumental Role in Prototype Alternative Breast Imaging Technique

Article 2013-05-27

Artificial Retina Research at the University of Utah Provides Hope for the Blind

Article 2013-05-27

This Lab Makes My Job Easy

Article 2013-05-27

What is the difference between IEEE 802.11ac and 802.11ad?
Microwave & RF article, April 2013. The goal is for all IEEE 802.11 standards to be backward compatible and for 802.11ac and 802.11ad to be compatible at the medium-access-control (MAC) or data-link layer. They should differ only in physical-layer (PHY) characteristics. Read about how that goal is being attained.

Article 2013-04-23

Ensuring The Highest Quality Microwave Measurements - Article
High frequencies and stringent application specifications drives a number of critical challenges to be addressed in this article.

Article 2013-04-22

Incremental Redundancy in EGPRS
Incremental redundancy is implemented in EGPRS systems to achieve maximum efficiency in over-the-air interface... WirelessDesignMagazine.com article by Paul Mercy. Feb 2005. Acrobat PDF.

Article 2013-04-02

Enabling Simulation and Test of Custom OFDM Signals
Orthogonal frequency division multiplexing (OFDM) has become attractive for many current and emerging commercial applications because it provides a combination of data throughput, scalability, and robustness.

Article 2013-04-01

A Packaged 60 GHz Low-Power Transceiver with Integrated Antennas for Short-Range Communications
This paper describes a 60-GHz transceiver with integrated antennas for short range and low power wireless communications fabricated in a CMOS 65nm SOI technology.

Article 2013-03-25

PDF PDF 429 KB
Optimize Time Gating in Spectrum Analysis
Although various types of time gating exist, some applications are more appropriate for certain time-gating methods. Beyond making this determination, designers should know the latest techniques for gate triggering and measuring wide-bandwidth signals.

Article 2013-03-20

FEM Modeling of Gigahertz TEM Cells for Susceptibility Analysis of RFID Products
This paper presents a novel simulation methodology to model the coupling between a GTEM cell and an RF-ID antenna.

Article 2013-02-08

PDF PDF 796 KB
Automating Communications Measurement - Article
This article demonstrates how you can automate measurements, control instruments, develop GUI-based applications, and generate reports for the Agilent 33220A waveform generator using MATLAB software.

Article 2013-02-07

An Improved SDR FPGA Verification Methodology for Emerging OFDMA Waveforms - TechBriefs Article
An article on Improved SDR FPGA Verification Methodology for Emerging OFDMA Waveforms.

Article 2013-02-01

Designing Multiple-Throw Switches in a MMIC Configuration
A Chip Design article by P. Sreenivasa Rao, design flow verification expert at Agilent Technologies.

Article 2013-01-31

Agilent embraces GaN modeling in IC-CAP upgrade
EETimes Design Article highlights new capabilities in IC-CAP 2013.01.

Article 2013-01-09

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