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Frequency Domain Analysis for Oscilloscopes
Get the MathWorks Limited License for Application Example, user manual, and app install file for N8832A Frequency Domain Analysis

Article 2014-08-19

ZIP ZIP 2.31 MB
How Product Innovation Happens: Customer Frustrations Spark Oscilloscope Triggering Idea - Article
This article is about how zone touch trigger came about, it first appeared in the March 2014 issue of Modern Test & Measure.

Article 2014-08-08

PDF PDF 834 KB
IRCICA Creates a Telecommunications Test Platform for Industrial and Academic Research
IRCICA Creates a Telecommunications Test Platform for Industrial and Academic Research

Article 2014-08-05

Lightwave Tutorial Series on Complex Optical Modulation - Article
Agilent offers a tutorial series on complex optical modulation featured in Lightwave magazine, featuring for example the challenges of coherent signal detection.

Article 2014-05-22

2014 Global PXI Instrumentation Growth Excellence Leadership Award - Article Reprint
Frost & Sullivan honors Agilent as a growth leader in the PXI modular instrumentation market in 2014.

Article 2014-05-22

PDF PDF 598 KB
Dayalbagh University in India develops ON-DEMAND Remote Laboratories

Article 2014-04-07

The LXI System You Didn’t Know You Were Using
The Evaluation Engineering article talks about the strength and stealth of LXI and Ethernet connectivity.

Article 2014-04-07

ECN article: Remote Wireless Test With LXI
Article reprinted with approval from ECN magazine.

Article 2014-04-07

Software, Connectivity Solutions
Agilent provides software that complements and augments the measurement hardware. The hardware solutions typically come with free software utilities to help simplify instrument operation. Agilent provides software for your entire design and test cycle – from simulation up to analysis and display of the data.

Article 2014-04-07

LXI Instrumentation applied to bioanalytical electrical characterization

Article 2014-04-07

System-Level Modelers Race The Design Cycle
Microwaves & RF article by Jean-Jacques DeLisle describes how effective system-level modeling and analysis is becoming more critical in virtually every RF system.

Article 2014-04-02

Wireless Test Sets for 4G and Beyond
An incredible amount of technology is packed into every smartphone and tablet. The list is long and getting longer: new and legacy cellular formats, multiple wireless-connectivity links, GPS capabilities, cameras, music players, Web browsers, and on and on.

Article 2014-03-14

Harbin Institute of Technology Develops Interest in EE with Remote Teaching Lab
Program generates student interest in Electrical Engineering using an interactive flash tool and allow for remote access to engineering test equipment -- so they can study electrical engineering (EE) when it’s convenient for them. The labs also provide a mechanism for professors to monitor students’ progress and track results.

Article 2014-03-03

Faculty Spotlight Articles
Interesting news on universities that are using Keysight equipment to do unique and exciting things.

Article 2014-03-03

Touchstone v2.0 SI/PI S-Parameter Models for Simultaneous Switching Noise (SSN) Analysis of DDR4
This paper presents a methodology to setup and analyze Simultaneous Switching Noise for DDR4 applications using Touchstone v2.0 models.

Article 2014-02-18

PDF PDF 8.07 MB
De-Mystifying the 28 Gb/s PCB Channel: Design to Measurement
This paper demonstrates a design methodology for 28 Gb/s SERDES channels using Xilinx Virtex-7 Tx to show the required trade-offs that enable robust performance that is easy to verify with measurement.

Article 2014-02-18

PDF PDF 2.99 MB
Tips and Advanced Techniques for Characterizing a 28 Gb/s Transceiver
This paper shows the right combination of measurement and simulation techniques, and how the previously existing barriers for using de-embedding have been eliminated.

Article 2014-02-18

PDF PDF 3.82 MB
Improving IBIS-AMI Model Accuracy: Model-to-Model and Model-to-Lab Correlation Case Studies
This paper presents case studies for model-to-model & model-to-lab correlation methods & compares favorable/unfavorable factors for both methods. 10G, 11.5G and 23G SerDes data are used as examples.

Article 2014-02-18

PDF PDF 3.28 MB
Mechanism of Jitter Amplification in Clock Channels
In this paper. jitter amplification in clock channels is analyzed analytically using the techniques developed in "Frequency domain analysis of jitter amplification in clock channels."

Article 2014-02-18

PDF PDF 671 KB
IBIS AMI Modeling of Retimer and Performance Analysis of Retimer based Active Serial Links
This paper presents a novel retimer modeling approach based on IBIS-AMI to capture the performance of a retimer that operates up to 15 Gbps.

Article 2014-02-18

PDF PDF 1.78 MB
Modeling, Extraction and Verification of VCSEL Model for Optical IBIS AMI
A technique of modeling and extraction of VCSEL devices for IBIS-AMI has been proposed.

Article 2014-02-18

PDF PDF 947 KB
Overcoming the Challenges of Designing and Testing Phased-Array Radar Systems
Microwave Product Digest (MPD) featured article for January 2014 written by Dingqing Lu of Agilent Technologies.

Article 2014-01-27

Using Channel Coding to Verify and Increase the Performance of Channel-Coding Algorithms
An advanced simulation methodology and environment can now be used to verify and measure the efficiency of algorithms under real-world communication scenarios, saving engineers both significant time and cost.

Article 2013-12-09

University of Michigan Engineering Students See the Music
University of Michigan Engineering Students See the Music

Article 2013-12-08

3D FEM simulations of a scanning microwave microscope cantilever for imaging at the nanoscale
APPLIED PHYSICS LETTERS 103, 213106 (2013) - A theoretical analysis and numerical validation of a calibration algorithm for scanning microwave microscopy (SMM) imaging at the nanoscale.

Article 2013-11-19

PDF PDF 1.52 MB

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