Contact an Expert

Technical Support

Electronic Measurement

Find by Product Model Number: Examples: 34401A, E4440A

Refine the List

remove all refinements

By Industry/Technology

By Type of Content

1-25 of 367

Sort:
University of Utah
University of Utah

Article 2014-12-10

Frost & Sullivan 2014 Global Instrumentation Software Market Leadership Award – Article Reprint

Article 2014-11-14

PDF PDF 1.97 MB
Engineering Students in Brazil Learn with Hands-on Projects
Engineering Students in Brazil Learn with Hands-on Projects

Article 2014-10-28

IRCICA Creates a Telecommunications Test Platform for Industrial and Academic Research
IRCICA Creates a Telecommunications Test Platform for Industrial and Academic Research

Article 2014-10-16

AWG article - MWJ product feature
AWG article - MWJ product feature

Article 2014-10-14

MIT Lives Up to its Motto: Mind and Hand
MIT Lives Up to its Motto: Mind and Hand

Article 2014-09-21

HeatWave Technical Papers
Links to various technical papers related to HeatWave Electro-Thermal analysis software.

Article 2014-08-27

How Product Innovation Happens: Customer Frustrations Spark Oscilloscope Triggering Idea - Article
This article is about how zone touch trigger came about, it first appeared in the March 2014 issue of Modern Test & Measure.

Article 2014-08-08

PDF PDF 834 KB
Mechanism of Jitter Amplification in Clock Channels
In this paper. jitter amplification in clock channels is analyzed analytically using the techniques developed in "Frequency domain analysis of jitter amplification in clock channels."

Article 2014-08-04

PDF PDF 715 KB
IBIS AMI Modeling of Retimer and Performance Analysis of Retimer based Active Serial Links
This paper presents a novel retimer modeling approach based on IBIS-AMI to capture the performance of a retimer that operates up to 15 Gbps.

Article 2014-08-04

PDF PDF 1.88 MB
De-Mystifying the 28 Gb/s PCB Channel: Design to Measurement
This paper demonstrates a design methodology for 28 Gb/s SERDES channels using Xilinx Virtex-7 Tx to show the required trade-offs that enable robust performance that is easy to verify with measurement.

Article 2014-08-04

PDF PDF 2.86 MB
Modeling, Extraction and Verification of VCSEL Model for Optical IBIS AMI
A technique of modeling and extraction of VCSEL devices for IBIS-AMI has been proposed.

Article 2014-08-04

PDF PDF 1.18 MB
Improving IBIS-AMI Model Accuracy: Model-to-Model and Model-to-Lab Correlation Case Studies
This paper presents case studies for model-to-model & model-to-lab correlation methods & compares favorable/unfavorable factors for both methods. 10G, 11.5G and 23G SerDes data are used as examples.

Article 2014-08-04

PDF PDF 3.32 MB
In-Circuit Test (ICT): The King Is Dead; Long Live the King!
Reports of the demise of in-circuit testing have been exaggerated for at least 20 years. Despite this, ICT is still here and kicking. This paper discusses various reasons why the King lives on.

Article 2014-08-01

PDF PDF 201 KB
Surviving State Disruptions Caused by Test: A Case Study - Article Reprint
This paper discusses new instructions for IEEE 1149.1 boundary scan tests that can remove "lobotomy problems" during tests.

Article 2014-08-01

PDF PDF 3.07 MB
Comparing Boundary Scan Methods White Paper
The need for reusable tests is driving standalone boundary scan-ICT integration. This article first appeared in the September 2009 issue of Circuits Assembly and is reprinted with kind permission.

Article 2014-07-31

PDF PDF 2.75 MB
2014 Global PXI Instrumentation Growth Excellence Leadership Award - Article Reprint
Frost & Sullivan honors Agilent as a growth leader in the PXI modular instrumentation market in 2014.

Article 2014-05-22

PDF PDF 598 KB
Lightwave Tutorial Series on Complex Optical Modulation - Article
Keysight offers a tutorial series on complex optical modulation featured in Lightwave magazine, featuring for example the challenges of coherent signal detection.

Article 2014-05-22

Software, Connectivity Solutions
Agilent provides software that complements and augments the measurement hardware. The hardware solutions typically come with free software utilities to help simplify instrument operation. Agilent provides software for your entire design and test cycle – from simulation up to analysis and display of the data.

Article 2014-04-07

ECN article: Remote Wireless Test With LXI
Article reprinted with approval from ECN magazine.

Article 2014-04-07

Dayalbagh University in India develops ON-DEMAND Remote Laboratories

Article 2014-04-07

LXI Instrumentation applied to bioanalytical electrical characterization

Article 2014-04-07

The LXI System You Didn’t Know You Were Using
The Evaluation Engineering article talks about the strength and stealth of LXI and Ethernet connectivity.

Article 2014-04-07

System-Level Modelers Race The Design Cycle
Microwaves & RF article by Jean-Jacques DeLisle describes how effective system-level modeling and analysis is becoming more critical in virtually every RF system.

Article 2014-04-02

Wireless Test Sets for 4G and Beyond
An incredible amount of technology is packed into every smartphone and tablet. The list is long and getting longer: new and legacy cellular formats, multiple wireless-connectivity links, GPS capabilities, cameras, music players, Web browsers, and on and on.

Article 2014-03-14

1 2 3 4 5 6 7 8 9 10 ... Next