전문가 상담

기술 지원

전자 측정

모델번호로 검색: 예제: 34401A, E4440A

상세 분류

상세분류 제거

산업/기술

분야별 검색결과

1-25 / 363

정렬방식:
IRCICA Creates a Telecommunications Test Platform for Industrial and Academic Research
IRCICA Creates a Telecommunications Test Platform for Industrial and Academic Research

기사 2014-10-16

MIT Lives Up to its Motto: Mind and Hand
MIT Lives Up to its Motto: Mind and Hand

기사 2014-09-21

HeatWave Technical Papers
Links to various technical papers related to HeatWave Electro-Thermal analysis software.

기사 2014-08-27

How Product Innovation Happens: Customer Frustrations Spark Oscilloscope Triggering Idea - Article
This article is about how zone touch trigger came about, it first appeared in the March 2014 issue of Modern Test & Measure.

기사 2014-08-08

PDF PDF 834 KB
Modeling, Extraction and Verification of VCSEL Model for Optical IBIS AMI
A technique of modeling and extraction of VCSEL devices for IBIS-AMI has been proposed.

기사 2014-08-04

PDF PDF 1.18 MB
Surviving State Disruptions Caused by Test: A Case Study - Article Reprint
This paper discusses new instructions for IEEE 1149.1 boundary scan tests that can remove "lobotomy problems" during tests.

기사 2014-08-01

PDF PDF 3.07 MB
In-Circuit Test (ICT): The King Is Dead; Long Live the King!
Reports of the demise of in-circuit testing have been exaggerated for at least 20 years. Despite this, ICT is still here and kicking. This paper discusses various reasons why the King lives on.

기사 2014-08-01

PDF PDF 201 KB
2014 Global PXI Instrumentation Growth Excellence Leadership Award - Article Reprint
Frost & Sullivan honors Agilent as a growth leader in the PXI modular instrumentation market in 2014.

기사 2014-05-22

PDF PDF 598 KB
Lightwave Tutorial Series on Complex Optical Modulation - Article
Agilent offers a tutorial series on complex optical modulation featured in Lightwave magazine, featuring for example the challenges of coherent signal detection.

기사 2014-05-22

Software, Connectivity Solutions
Agilent provides software that complements and augments the measurement hardware. The hardware solutions typically come with free software utilities to help simplify instrument operation. Agilent provides software for your entire design and test cycle – from simulation up to analysis and display of the data.

기사 2014-04-07

ECN article: Remote Wireless Test With LXI
Article reprinted with approval from ECN magazine.

기사 2014-04-07

Dayalbagh University in India develops ON-DEMAND Remote Laboratories

기사 2014-04-07

LXI Instrumentation applied to bioanalytical electrical characterization

기사 2014-04-07

The LXI System You Didn’t Know You Were Using
The Evaluation Engineering article talks about the strength and stealth of LXI and Ethernet connectivity.

기사 2014-04-07

System-Level Modelers Race The Design Cycle
Microwaves & RF article by Jean-Jacques DeLisle describes how effective system-level modeling and analysis is becoming more critical in virtually every RF system.

기사 2014-04-02

Wireless Test Sets for 4G and Beyond
An incredible amount of technology is packed into every smartphone and tablet. The list is long and getting longer: new and legacy cellular formats, multiple wireless-connectivity links, GPS capabilities, cameras, music players, Web browsers, and on and on.

기사 2014-03-14

애질런트 FieldFox 분석기: RF 교육 재정의

기사 2014-03-11

Faculty Spotlight Articles
Interesting news on universities that are using Keysight equipment to do unique and exciting things.

기사 2014-03-03

Harbin Institute of Technology Develops Interest in EE with Remote Teaching Lab
Program generates student interest in Electrical Engineering using an interactive flash tool and allow for remote access to engineering test equipment -- so they can study electrical engineering (EE) when it’s convenient for them. The labs also provide a mechanism for professors to monitor students’ progress and track results.

기사 2014-03-03

Tips and Advanced Techniques for Characterizing a 28 Gb/s Transceiver
This paper shows the right combination of measurement and simulation techniques, and how the previously existing barriers for using de-embedding have been eliminated.

기사 2014-02-18

PDF PDF 3.82 MB
Touchstone v2.0 SI/PI S-Parameter Models for Simultaneous Switching Noise (SSN) Analysis of DDR4
This paper presents a methodology to setup and analyze Simultaneous Switching Noise for DDR4 applications using Touchstone v2.0 models.

기사 2014-02-18

PDF PDF 8.07 MB
IBIS AMI Modeling of Retimer and Performance Analysis of Retimer based Active Serial Links
This paper presents a novel retimer modeling approach based on IBIS-AMI to capture the performance of a retimer that operates up to 15 Gbps.

기사 2014-02-18

PDF PDF 1.78 MB
De-Mystifying the 28 Gb/s PCB Channel: Design to Measurement
This paper demonstrates a design methodology for 28 Gb/s SERDES channels using Xilinx Virtex-7 Tx to show the required trade-offs that enable robust performance that is easy to verify with measurement.

기사 2014-02-18

PDF PDF 2.99 MB
Mechanism of Jitter Amplification in Clock Channels
In this paper. jitter amplification in clock channels is analyzed analytically using the techniques developed in "Frequency domain analysis of jitter amplification in clock channels."

기사 2014-02-18

PDF PDF 671 KB
Improving IBIS-AMI Model Accuracy: Model-to-Model and Model-to-Lab Correlation Case Studies
This paper presents case studies for model-to-model & model-to-lab correlation methods & compares favorable/unfavorable factors for both methods. 10G, 11.5G and 23G SerDes data are used as examples.

기사 2014-02-18

PDF PDF 3.28 MB

1 2 3 4 5 6 7 8 9 10 ... 다음