이 페이지를 찾으시나요? 추천 검색 결과 보기:

 

전문가 상담

기술 지원

전자 측정

모델 번호 입력:

상세 분류

상세분류 제거

산업/기술

분야별 검색결과

1-25 / 444

정렬방식:
Early Design Review or Boundary Scan in Enhancing Testability and Optimazation of Test Strategy
With complexities of PCB design scaling and manufacturing processes adopting to environmentally friendly practices raise challenges in ensuring structural quality of PCBs.

기사 2017-05-08

PDF PDF 624 KB
SRAM Cell Model Generation and Modeling Efficiency Take Center Stage in New Software Releases
Accurate and efficient modeling is critical to successful design, especially when it comes to the Static Random Access Memory (SRAM) cell, the minimum geometry devices in integrated circuit technology.

기사 2017-05-04

Villanova Professor and Students “Bang Heads” for Nanotechnology Research
Dr. Gang Feng, Associate Professor in the Department of Mechanical Engineering at Villanova University, is using advanced materials measurement technology to understand concussions, energy storage, and more.

기사 2017-04-21

Expanding IEEE Std 1149.1 Boundary-Scan Architecture Beyond Manufacturing Test of PCBA
This paper will discuss the expanded use of boundary-scan testing beyond the typical manufacturing test to capture structural defects on a components/devices in a Printed Circuit Board Assembly (PCBA)

기사 2017-04-01

PDF PDF 860 KB
Python Programming integration with IC-CAP
Learn what versions of IC-CAP are supported and see an example of how to get the MOSFET threshold voltage using Python in this blog post.

기사 2017-03-16

Ensuring High Signal Quality in PCIe Gen3 Channels
This Signal Integrity Journal article written by Keysight engineer, Anil Kumar Pandey includes the challenges of maintaining transmission channel signal quality in today's PCIe Gen3 Channels.

기사 2017-03-14

Internet of Things (IoT) Teaching Solution – IoT Fundamentals

기사 2017-03-14

Internet of Things (IoT) Teaching Solution – IoT Systems Design

기사 2017-03-14

Keysight Translator for QDART Test
Keysight Translator software for QDART

기사 2017-03-09

Heidi Barnes: DesignCon 2017 Engineer of the Year
EDN Network's Martin Rowe interviews Heidi Barnes, DesignCon 2017 Engineer of the Year.

기사 2017-02-23

Why Device Modeling Services?
IC design stands on the shoulders of device modeling and characterization.

기사 2017-02-03

Addressing The Challenges Facing IoT Adoption - Article Reprint
Addressing The Challenges Facing IoT Adoption - Article Reprint

기사 2017-01-23

PDF PDF 2.25 MB
Keysight One-Stop Calibration Capabilities – Americas
View our capabilities for dimensional / optical; electrical – DC, low frequency; electrical – optical; electrical – RF, microwave, millimeter wave; physical / mechanical

기사 2016-12-15

HUAWEI demonstrates 112 Gb/s PAM-4 optical signal transmission with M8196A AWG
112 Gb/s PAM-4 Optical Signal Transmission over 100-m OM4 Multimode Fiber for High-Capacity Data-Center

기사 2016-12-05

Integrating Multiple Technology Devices onto Laminate-Based Multi-Chip-Modules
Microwave Product Digest (MPD) featured article on "Integrating Multiple Technology Devices onto Laminate-Based Multi-Chip-Modules Using an Integrated Design Flow", written by Keefe Bohanan, Applications Engineer District Manager for Keysight EEsof EDA.

기사 2016-11-29

PDF PDF 3.90 MB
Direct-Synthesis Software Approach Facilitates Filter Design
This Microwaves & RF article discusses how Genesys software can be used to design filters with the direct-synthesis technique. A lowpass filter example is presented to illustrate the software’s capabilities.

기사 2016-11-28

Using DSP and RF circuit co-design to reduce risk and cost
For modern design organizations, it’s now more imperative than ever that they simulate both Digital Signal Processor (DSP) and RF circuits together at the system level using mixed signals.

기사 2016-10-11

Software plus signal generators and analyzers support IEEE 802.11p design and test
Jungik Suh, marketing program manager, Automotive & Energy Solutions, Keysight Technologies, provides input on several Keysight solutions for the connected-car arena for Evaluation Engineering's October print special report on automotive test.

기사 2016-10-05

A Quick Fix for Poor Capacitor, Inductor and DC/DC Impedance Measurements
Modern Test & Measure article by Steve Sandler (Picotest) explains why you need an extended range, partial S2p measurement and how to make this improved measurement.

기사 2016-10-03

Best Practices for Connector Models
Eric Bogatin, Signal Integrity Journal Editor, discusses best practices for connector modeling and measuring with Heidi Barnes, Keysight ADS application engineering specialist, and Jim Nadolny, Principle SI Engineer for Samtec.

기사 2016-09-30

Correlating simulation and measurement for a USB Type-C reference channel (Part 1)
This article from Electronic Products discusses a step-by-step process that signal integrity engineers can follow to ensure their success in designing with USB Type-C devices.

기사 2016-09-21

벡터 네트워크 분석기로 최대 THz까지 정확한 스펙트럼 분석 - 백서
이 백서는 MMW 및 sub-MMW VNA 솔루션에 새로운 PNA 스펙트럼 분석기 기능의 추가를 가능하게 만든 기술과 방법에 대해 집중적으로 다룹니다.

기사 2016-07-26

PDF PDF 4.12 MB
통합된 턴키 모델링 및 측정 시스템 – 기사 재인쇄(영어)
이 글은 Microwave Journal 2016년 3월호에 처음 게재되었습니다.

기사 2016-07-12

PDF PDF 4.70 MB
What is jitter?
Understand jitter basics and how to measure and then eliminate jitter from your designs.

기사 2016-06-19

Jitter Glossary
Key terms that will help you understand and tackle jitter in your designs.

기사 2016-06-15

1 2 3 4 5 6 7 8 9 10 ... 다음