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Simplify DDR Validation with SI Methods

Article 2008-01-06

3GPP LTE: Introducing Single-Carrier FDMA
This article, published in issue 4 of the Agilent Measurement Journal, describes single-carrier FDMA for 3GPP LTE.

Article 2008-01-01

PDF PDF 491 KB
Productivity by Design: ADS 2008 Reduces Steps to Simulation and Verification
This Article by How-Siang Yap discusses the considerations for using ADS 2008 to double designer productivity when performing common design and development tasks.

Article 2008-01-01

PDF PDF 508 KB
Agilent Ultra Wideband Digital Receivers Powered by Acqiris Signal Analyzers Solutions

Article 2007-11-19

PDF PDF 72 KB
Testing HSUPA devices
By: Jeanne Fightmaster, Agilent Technologies Published with permissions of EETimes Asia

Article 2007-11-16

PDF PDF 404 KB
The Evolution of Vectorless Test
Written by Chris Jacobsen. Published with permission from Circuits Assembly, January 2007.

Article 2007-11-08

PDF PDF 263 KB
New measurement option expands Agilent’s leadership in noise figure analysis
There are many choices today for performing noise figure measurements of LNAs and transistors. The new PNA-X source-corrected method offers a technique that provides the most accurate noise figure measurements available today.

Article 2007-11-01

PDF PDF 1.05 MB
Unraveling Modulation Quality in Mobile WiMAX™ Uplink and Downlink with Multiple Zones and Bursts
An article written for Microwave Journal addressing the difficulty in ensuring that the modulation quality of the WiMAX radio is sufficient for optimum RF performance and that it will perform according to industry standards.

Article 2007-11-01

PDF PDF 762 KB
Agilent Acqiris High-Speed Analog Signal Averager Improves Mass Accuracy, Dynamic Range in oaTOFMS

Article 2007-11-01

PDF PDF 256 KB
Xray Choices for SMT Manufacturing
In many cases, there is a complementary choice of automated 3D X-ray and off-axis 2D X-ray inspection. This article explores this concept. Published with kind permission from SMT

Article 2007-11-01

PDF PDF 188 KB
First Pass Accuracy with Momentum GX for WiMAX Design
Archived article at Microwave Product Digest discussing the challenges for designers in meeting cost and power consumption goals, using 3D-Planar electromagnetic (EM) simulation technology.

Article 2007-11-01

How to test UMA/GAN-enabled mobile phones
By Jamie Allan and John Russell, Agilent Technologies Published with permissions of Mobile Handset DesignLine

Article 2007-10-29

Evaluating data transfer in HSDPA/W-CDMA nets
Published with permission from Global Sources October 2007

Article 2007-10-15

PDF PDF 2.84 MB
Germany’s Renowned Max Plank Institute Chooses Advanced Acqiris Data Acquisition
Article reprint from the June Focus Newsletter by Greg Tate.

Article 2007-10-10

PDF PDF 179 KB
Acqiris Gigahertz FADCs Help Astronomers Probe Deep Space Using Gamma Rays

Article 2007-10-09

PDF PDF 307 KB
The Utilization of X-ray to Effectively Test Quad Flat No-Lead Packages
Quad Flat No-Lead (QFN) packages are increasingly used on printed circuit boards. The QFN solder joint is hidden from most types of optical inspection test. This paper discusses how X-ray inspection can effectivly detect QFN joint defects.

Article 2007-09-20

PDF PDF 486 KB
What Makes Bit Error Ratio With Integrated CDR Beneficial?
What Makes Bit Error Ratio With Integrated CDR Beneficial? by Michael Fleischer, Agilent Technologies

Article 2007-09-04

PDF PDF 225 KB
Test Strategy Tips and Tricks
Written by Stacy Kalisz Johnson. Published with permission from Circuits Assembly, July 2007.

Article 2007-09-01

PDF PDF 236 KB
WiMAX™: Plotting A New Path To Global Broadband Mobility
Archived article at Canadian Electronics identifying innovations in test and measurement to support the innovations in the industry.

Article 2007-09-01

Perfecting Pulsed RF Radar Measurements
This paper examines the measurements and capabilities that are available for radar using modern spectrum analyzers, vector signal analyzers and power meters.

Article 2007-08-21

PDF PDF 100 KB
Evolving Packages Drive Test and Inspection
Written by Stacy Kalisz Johnson. Published with permission from Circuits Assembly, March 2007

Article 2007-08-11

PDF PDF 747 KB
CAD and Your Test System
Written by Stacy Kalisz Johnson. Published with permission from Circuits Assembly, November 2007.

Article 2007-08-11

PDF PDF 508 KB
Defect-Detection Strategies
Written by James Benson. Published with permission from Circuits Assembly, May 2007.

Article 2007-08-11

PDF PDF 985 KB
Going Beyond S-parameters with an Advanced Architecture for Vector Network Analysis

Article 2007-07-26

PDF PDF 624 KB
Limited Access Testing
Written by Stacy Kalisz Johnson. Published with permission from Circuits Assembly, July 2007.

Article 2007-07-01

PDF PDF 137 KB

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