Contact an Expert

Technical Support

Electronic Measurement

Find by Product Model Number: Examples: 34401A, E4440A

1-8 of 8

Sort:
PCI Express Receiver Testing Responds To New Challenges - Article
PCI Express Receiver Testing Responds To New Challenges

Article 2015-03-24

AWG article - MWJ product feature
AWG article - MWJ product feature

Article 2014-10-14

2014 Global PXI Instrumentation Growth Excellence Leadership Award - Article Reprint
Frost & Sullivan honors Agilent as a growth leader in the PXI modular instrumentation market in 2014.

Article 2014-05-22

PDF PDF 598 KB
Enhancing microwave spectroscopy in astrophysics applications – Article
An arbitrary waveform generator is the key element in this faster and more accurate method.

Article 2013-11-15

A new approach for multi-emitter test signal generation – Article
A new capture and playback approach generates multi-emitter test signals using a combination of COTS test equipment and simulation software.

Article 2013-11-15

Meeting satellite testing challenges - Article
Satellites are now a critical part of the infrastructure supporting the incredible growth in demand for broadband data.

Article 2013-11-13

Improving Coverage for ECU Outliers - Article Reprint
This article explores how to catch electronic faults that typically escape with traditional serial testing, by using a multiple-channel voltage acquisition method that can enable faster parallel test.

Article 2012-08-24

PDF PDF 191 KB
Measurement of the Real Time Fill-Pattern at the Australian Synchrotron
This article describes the development, commissioning and operation of a Fill-Pattern Monitor (FPM) for the Australian Synchrotron that measures the real-time intensity distribution of the electron bunches in the storage ring.

Article 2008-03-05

PDF PDF 685 KB