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Emulating Analog Input Sensors in Automotive Electronics Functional Test - Article Reprint
This article discusses guidelines for evaluating the digital-analog converters for your automotive electronics functional test needs.

Article 2016-02-09

PDF PDF 318 KB
Reference Solutions - A New Approach to Test and Measurement Provisioning - Article Reprint
This article describes the Keysight Reference Solution approach to providing application specific HW and SW test configurations.

Article 2016-01-18

PDF PDF 565 KB
PXIe Measurement Accelerator Speeds RF Power Amplifier Test - Article Reprint
This article, reprinted with permission from Microwave Journal, describes the speed improvement provided by Keysight's M9451A PXIe Measurement Accelerator.

Article 2015-11-11

PDF PDF 1.63 MB
PCI Express Receiver Testing Responds To New Challenges - Article
PCI Express Receiver Testing Responds To New Challenges

Article 2015-03-24

AWG article - MWJ product feature
AWG article - MWJ product feature

Article 2014-10-14

2014 Global PXI Instrumentation Growth Excellence Leadership Award - Article Reprint
Frost & Sullivan honors Agilent as a growth leader in the PXI modular instrumentation market in 2014.

Article 2014-05-22

PDF PDF 598 KB
A new approach for multi-emitter test signal generation – Article
A new capture and playback approach generates multi-emitter test signals using a combination of COTS test equipment and simulation software.

Article 2013-11-15

Enhancing microwave spectroscopy in astrophysics applications – Article
An arbitrary waveform generator is the key element in this faster and more accurate method.

Article 2013-11-15

Meeting satellite testing challenges - Article
Satellites are now a critical part of the infrastructure supporting the incredible growth in demand for broadband data.

Article 2013-11-13

Improving Coverage for ECU Outliers - Article Reprint
This article explores how to catch electronic faults that typically escape with traditional serial testing, by using a multiple-channel voltage acquisition method that can enable faster parallel test.

Article 2012-08-24

PDF PDF 266 KB