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Villanova Professor and Students “Bang Heads” for Nanotechnology Research
Dr. Gang Feng, Associate Professor in the Department of Mechanical Engineering at Villanova University, is using advanced materials measurement technology to understand concussions, energy storage, and more.

Article 2017-04-21

Expanding IEEE Std 1149.1 Boundary-Scan Architecture Beyond Manufacturing Test of PCBA
This paper will discuss the expanded use of boundary-scan testing beyond the typical manufacturing test to capture structural defects on a components/devices in a Printed Circuit Board Assembly (PCBA)

Article 2017-04-01

PDF PDF 860 KB
Early Design Review or Boundary Scan in Enhancing Testability and Optimazation of Test Strategy
With complexities of PCB design scaling and manufacturing processes adopting to environmentally friendly practices raise challenges in ensuring structural quality of PCBs.

Article 2017-04-01

PDF PDF 417 KB
Python Programming integration with IC-CAP
Learn what versions of IC-CAP are supported and see an example of how to get the MOSFET threshold voltage using Python in this blog post.

Article 2017-03-16

Internet of Things (IoT) Teaching Solution – IoT Fundamentals

Article 2017-03-14

Ensuring High Signal Quality in PCIe Gen3 Channels
This Signal Integrity Journal article written by Keysight engineer, Anil Kumar Pandey includes the challenges of maintaining transmission channel signal quality in today's PCIe Gen3 Channels.

Article 2017-03-14

Internet of Things (IoT) Teaching Solution – IoT Systems Design

Article 2017-03-14

Keysight Translator for QDART Test
Keysight Translator software for QDART

Article 2017-03-09

Heidi Barnes: DesignCon 2017 Engineer of the Year
EDN Network's Martin Rowe interviews Heidi Barnes, DesignCon 2017 Engineer of the Year.

Article 2017-02-23

Why Device Modeling Services?
IC design stands on the shoulders of device modeling and characterization.

Article 2017-02-03

Addressing The Challenges Facing IoT Adoption - Article Reprint
Addressing The Challenges Facing IoT Adoption - Article Reprint

Article 2017-01-23

PDF PDF 2.25 MB
Keysight One-Stop Calibration Capabilities – Americas
View our capabilities for dimensional / optical; electrical – DC, low frequency; electrical – optical; electrical – RF, microwave, millimeter wave; physical / mechanical

Article 2016-12-15

HUAWEI demonstrates 112 Gb/s PAM-4 optical signal transmission with M8196A AWG
112 Gb/s PAM-4 Optical Signal Transmission over 100-m OM4 Multimode Fiber for High-Capacity Data-Center

Article 2016-12-05

Integrating Multiple Technology Devices onto Laminate-Based Multi-Chip-Modules
Microwave Product Digest (MPD) featured article on "Integrating Multiple Technology Devices onto Laminate-Based Multi-Chip-Modules Using an Integrated Design Flow", written by Keefe Bohanan, Applications Engineer District Manager for Keysight EEsof EDA.

Article 2016-11-29

PDF PDF 3.90 MB
Direct-Synthesis Software Approach Facilitates Filter Design
This Microwaves & RF article discusses how Genesys software can be used to design filters with the direct-synthesis technique. A lowpass filter example is presented to illustrate the software’s capabilities.

Article 2016-11-28

Using DSP and RF circuit co-design to reduce risk and cost
For modern design organizations, it’s now more imperative than ever that they simulate both Digital Signal Processor (DSP) and RF circuits together at the system level using mixed signals.

Article 2016-10-11

Software plus signal generators and analyzers support IEEE 802.11p design and test
Jungik Suh, marketing program manager, Automotive & Energy Solutions, Keysight Technologies, provides input on several Keysight solutions for the connected-car arena for Evaluation Engineering's October print special report on automotive test.

Article 2016-10-05

A Quick Fix for Poor Capacitor, Inductor and DC/DC Impedance Measurements
Modern Test & Measure article by Steve Sandler (Picotest) explains why you need an extended range, partial S2p measurement and how to make this improved measurement.

Article 2016-10-03

Best Practices for Connector Models
Eric Bogatin, Signal Integrity Journal Editor, discusses best practices for connector modeling and measuring with Heidi Barnes, Keysight ADS application engineering specialist, and Jim Nadolny, Principle SI Engineer for Samtec.

Article 2016-09-30

Correlating simulation and measurement for a USB Type-C reference channel (Part 1)
This article from Electronic Products discusses a step-by-step process that signal integrity engineers can follow to ensure their success in designing with USB Type-C devices.

Article 2016-09-21

Accurate Spectrum Analysis Up to THz with Your Vector Network Analyzer - White Paper
This white paper will focus on the addition of the new PNA spectrum analyzer capability into the MMW and sub-MMW VNA solution including the technology that made it possible and how it is accomplished.

Article 2016-07-26

PDF PDF 4.12 MB
Integrated, Turnkey Modeling and Measurement Systems - Article Reprint
This article first appeared in the March 2016 edition of Microwave Journal.

Article 2016-07-12

PDF PDF 4.70 MB
What is jitter?
Understand jitter basics and how to measure and then eliminate jitter from your designs.

Article 2016-06-19

Jitter Glossary
Key terms that will help you understand and tackle jitter in your designs.

Article 2016-06-15

Phased array beamforming software design, test, and measurement kit introduced by Keysight
Military & Aerospace Electronics article introduces the W1720EP phased array radar beamforming kit add-on software simulation personality for the SystemVue 2016.08 design and test and measurement environment.

Article 2016-06-13

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