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Data Acquisition Modules - DAQ

Find by Product Model Number: Examples: 34401A, E4440A

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Advanced Passive Intermodulation (PIM) Measurement System Webcast
Original broadcast August 29, 2013

Webcast - recorded

Automating On-Wafer Measurements with the new Agilent IC-CAP WaferPro
Originally broadcast Jan 27, 2011

Webcast - recorded

Developing Modular PXI and AXIe Tests for Measurement and Analysis Webcast
Original broadcast June 12, 2014

Webcast - recorded

Modern Remote and Wireless Test Setup and Considerations
This seminar describes remote/wireless test setups and configurations with LXI compliant instruments with low cost, off the shelf network products. We review local and long distance wireless test, security hurdles and using smart devices and clouds.

Webcast - recorded

The Importance and Value of PXI Multi-Vendor Interoperability
Original broadcast March 28, 2012

Webcast - recorded