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2011 年国际微波会议(IEEE MTT-S)—是德将在 Agilent Avenue 架起业界专家与领先公司之间的桥梁
2011 show, last June, 2011; Baltimore Convention Center

展览会

Agilent EEsof EDA 客户教育与服务
Brief overview of Agilent EEsof EDA Customer Education and Services.

培训资料 2012-02-02

Genesys 网络研讨会--“如何设计”系列
Originally broadcast in 2009. Access the 6 WebEX recordings

网上直播 -- 已存档的

Keysight EEsof EDA 客户教育与服务
Keysight EEsof MMIC Design Symposium

研讨会

Automating On-Wafer Measurements with the new Agilent IC-CAP WaferPro
Originally broadcast Jan 27, 2011

网上直播 -- 已存档的

Automating SPICE Library Validation
Recorded webcast and slide set for a Model Quality Assurance (MQA) webcast held on October 22, 2013.

研讨会演示 2013-10-22

Create Complex and 2-Channel Signals with Trueform Generators Webcast
Original broadcast August 7, 2014

网上直播 -- 已存档的

DesignCon 2014
Jan 28-31, 2014; Santa Clara Convention Center Download papers presented, order the AEF DVD

展览会

DesignCon 2015
Jan 27-29, 2014; Santa Clara Convention Center

展览会

DynaFET: Advanced model for GaN/GaAs HEMTs from NVNA measurements and ANNs Webcast
Original broadcast September 4, 2014

网上直播 -- 已存档的

Fundamentals of Fast Pulsed IV Measurement Webcast
Original broadcast January 9, 2014

网上直播 -- 已存档的

Genesys Webcasts - "How-To-Design" series
Originally broadcast in 2009. Access the 6 WebEX recordings

网上直播 -- 已存档的

Hybrid-Active Load Pull with PNA-X and Maury Microwave
Original broadcast Jun 12, 2012

网上直播 -- 已存档的

IC-CAP User Training
This 3-day course will show device modelers how to use Keysight EEsof EDA's IC-CAP software. Click on link to view full course description and class dates and locations.

课堂培训

Innovations in EDA: Accurate Modeling of GaAs & GaN HEMT’s for Nonlinear Applications Webcast
Original broadcast May 7, 2013

网上直播 -- 已存档的

Keysight EEsof EDA Customer Education and Services
Brief overview of Keysight EEsof EDA Customer Education and Services.

培训资料 2010-08-11

Measurement Based FET Modeling using Artifical Neural Networks (ANN)
This presentation was given by Jianjun Xu with introduction by David Root as part of the Innovations in EDA Webcast Series.

研讨会演示 2012-02-07

PDF PDF 2.51 MB
MQA: Automating Library Validation
MQA is the industry standard qualification platform that assists modeling experts and model users to perform comprehensive model qualification with an knowledge-based, rules-driven approach.

研讨会演示 2013-10-22

PDF PDF 1.48 MB
New Techniques and Methods to Evaluate Power Device Switching Loss Webcast
Live broadcast Ocotber 14, 2014; 10am PT / 1pm ET

网上直播

Quickly Identify and Characterize Temperature Measurement Points Webcast
Live broadcast February 3, 2015; 10am PT / 1pm ET

网上直播

Setting up IC-CAP WaferPro for On-Wafer Measurements
IC-CAP WaferProIs is an extremely powerful test plan suite, for on-Wafer DC/CV and RF device modeling measurements.

研讨会演示 2011-06-22

PDF PDF 3.07 MB
Setting Up IC-CAP WaferPro For On-Wafer Measurements
Original broadcast June 22, 2011

网上直播 -- 已存档的