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Calibration to Lab Standards Back-to-Basics Webcast
Live broadcast May 19, 2016; 10am PT / 1pm ET

网上直播

International Microwave Symposium (IMS) 2016
May 22-27, 2016; San Francisco, CA

展览会

Keysight EEsof EDA Customer Education and Services
Brief overview of Keysight EDA Customer Education and Services.

培训资料 2015-12-07

Power Conversion Efficiency Measurement Methods Webcast
Original broadcast November 4, 2015

网上直播 -- 已存档的

Site Hazard, Safety & Risk Mitigation for Beginning Thermographers Webcast
Original broadcast September 30, 2015

网上直播 -- 已存档的

DesignCon 2015
Download Keysight's papers from Technical Conference; Jan 27-29, 2015; Santa Clara Convention Center

展览会

Multiport and Multi-site Test Optimization Techniques Webcast
Original broadcast June 3, 2015

网上直播 -- 已存档的

Successfully Make Power and AC Line Disturbance Measurements Webcast
Original broadcast June 25, 2015

网上直播 -- 已存档的

DynaFET: Advanced model for GaN/GaAs HEMTs from NVNA measurements and ANNs Webcast
Original broadcast September 4, 2014

网上直播 -- 已存档的

2011 年国际微波会议(IEEE MTT-S)—是德将在 Agilent Avenue 架起业界专家与领先公司之间的桥梁
2011 show, last June, 2011; Baltimore Convention Center

展览会

Innovations in EDA: Accurate Modeling of GaAs & GaN HEMT’s for Nonlinear Applications Webcast
Original broadcast May 7, 2013

网上直播 -- 已存档的

Automating On-Wafer Measurements with the new Agilent IC-CAP WaferPro
Originally broadcast Jan 27, 2011

网上直播 -- 已存档的

Setting Up IC-CAP WaferPro For On-Wafer Measurements
Original broadcast June 22, 2011

网上直播 -- 已存档的

Hybrid-Active Load Pull with PNA-X and Maury Microwave
Original broadcast Jun 12, 2012

网上直播 -- 已存档的

Fundamentals of Fast Pulsed IV Measurement Webcast
Original broadcast January 9, 2014

网上直播 -- 已存档的

MQA: Automating Library Validation
MQA is the industry standard qualification platform that assists modeling experts and model users to perform comprehensive model qualification with an knowledge-based, rules-driven approach.

研讨会演示 2013-10-22

PDF PDF 1.48 MB
Automating SPICE Library Validation
Recorded webcast and slide set for a Model Quality Assurance (MQA) webcast held on October 22, 2013.

研讨会演示 2013-10-22

Genesys 网络研讨会--“如何设计”系列
Originally broadcast in 2009. Access the 6 WebEX recordings

网上直播 -- 已存档的

Measurement Based FET Modeling using Artifical Neural Networks (ANN)
This presentation was given by Jianjun Xu with introduction by David Root as part of the Innovations in EDA Webcast Series.

研讨会演示 2012-02-07

PDF PDF 2.51 MB
Agilent EEsof EDA 客户教育与服务
Brief overview of Agilent EEsof EDA Customer Education and Services.

培训资料 2012-02-02

Keysight EEsof EDA 客户教育与服务
Keysight EEsof MMIC Design Symposium

研讨会

Setting up IC-CAP WaferPro for On-Wafer Measurements
IC-CAP WaferProIs is an extremely powerful test plan suite, for on-Wafer DC/CV and RF device modeling measurements.

研讨会演示 2011-06-22

PDF PDF 3.07 MB
IC-CAP User Training
This 3-day course will show device modelers how to use Keysight EEsof EDA's IC-CAP software. Click on link to view full course description and class dates and locations.

课堂培训

Keysight EEsof EDA Customer Education and Services
Brief overview of Keysight EEsof EDA Customer Education and Services.

培训资料 2010-08-11