这是我们认为您想要浏览的网页。 查看搜索结果:

 

与专家交流

技术支持

电子测量

按产品型号支持:

1-20 / 20

排序:
Keysight EEsof EDA Customer Education and Services
Brief overview of Keysight EDA Customer Education and Services.

培训资料 2016-07-20

2016 IEEE Symposium on Electromagnetic Compatibility and Signal Integrity
Ottawa, ON; July 25 - 29, 2016

展览会

Accuracy matters: Calibration Options for Lab Standards Webcast
Original broadcast May 19, 2016

网上直播

International Microwave Symposium (IMS) 2016
May 22-27, 2016; San Francisco, CA

展览会

Power Conversion Efficiency Measurement Methods Webcast
Original broadcast November 4, 2015

网上直播 -- 已存档的

Site Hazard, Safety & Risk Mitigation for Beginning Thermographers Webcast
Original broadcast September 30, 2015

网上直播 -- 已存档的

Multiport and Multi-site Test Optimization Techniques Webcast
Original broadcast June 3, 2015

网上直播 -- 已存档的

DynaFET: Advanced model for GaN/GaAs HEMTs from NVNA measurements and ANNs Webcast
Original broadcast September 4, 2014

网上直播 -- 已存档的

2011 年国际微波会议(IEEE MTT-S)—是德将在 Agilent Avenue 架起业界专家与领先公司之间的桥梁
2011 show, last June, 2011; Baltimore Convention Center

展览会

Innovations in EDA: Accurate Modeling of GaAs & GaN HEMT’s for Nonlinear Applications Webcast
Original broadcast May 7, 2013

网上直播 -- 已存档的

Automating On-Wafer Measurements with the new Agilent IC-CAP WaferPro
Originally broadcast Jan 27, 2011

网上直播 -- 已存档的

Hybrid-Active Load Pull with PNA-X and Maury Microwave
Original broadcast Jun 12, 2012

网上直播 -- 已存档的

Setting Up IC-CAP WaferPro For On-Wafer Measurements
Original broadcast June 22, 2011

网上直播 -- 已存档的

Fundamentals of Fast Pulsed IV Measurement Webcast
Original broadcast January 9, 2014

网上直播 -- 已存档的

MQA: Automating Library Validation
MQA is the industry standard qualification platform that assists modeling experts and model users to perform comprehensive model qualification with an knowledge-based, rules-driven approach.

研讨会演示 2013-10-22

PDF PDF 1.48 MB
Automating SPICE Library Validation
Recorded webcast and slide set for a Model Quality Assurance (MQA) webcast held on October 22, 2013.

研讨会演示 2013-10-22

Measurement Based FET Modeling using Artifical Neural Networks (ANN)
This presentation was given by Jianjun Xu with introduction by David Root as part of the Innovations in EDA Webcast Series.

研讨会演示 2012-02-07

PDF PDF 2.51 MB
Setting up IC-CAP WaferPro for On-Wafer Measurements
IC-CAP WaferProIs is an extremely powerful test plan suite, for on-Wafer DC/CV and RF device modeling measurements.

研讨会演示 2011-06-22

PDF PDF 3.07 MB
IC-CAP User Training
This 3-day course will show device modelers how to use Keysight EEsof EDA's IC-CAP software. Click on link to view full course description and class dates and locations.

课堂培训

Keysight EEsof EDA Customer Education and Services
Brief overview of Keysight EEsof EDA Customer Education and Services.

培训资料 2010-08-11