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Electronic Measurement

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Determining the Best RF Simulation Tools as an RF Consulting Engineer
Independent consulting in RF and microwave engineering is a growing trend and many engineers are delivering their highly sought after RF expertise back to the industry.

Article 2015-06-08

PDF PDF 2.64 MB
Keysight EEsof EDA Newsletter - Product and Application News
Keep tabs on the latest product and application news and review the archives of the Keysight EEsof EDA Newsletter.

Newsletter 2015-06-01

Improving IBIS-AMI Model Accuracy: Model-to-Model and Model-to-Lab Correlation Case Studies - Articl
This DesignCon 2014 paper presents case studies for model-to-model & model-to-lab correlation methods & compares favorable/unfavorable factors for both methods. 10G, 11.5G and 23G SerDes data are used as examples.

Article 2015-04-02

PDF PDF 3.34 MB
A Nonlinear Model Complier for RF/MICROWAVE Engineers
This Article presents Genesys latest release which includes a powerful Verilog-A compiler technology and hence enhancing the accuracy of simulation.

Article 2015-03-18

PDF PDF 545 KB
HeatWave Case Studies
HeatWave Electro-Thermal simulation case studies.

Case Study 2014-09-18

HeatWave Technical Papers
Links to various technical papers related to HeatWave Electro-Thermal analysis software.

Article 2014-08-27

Modeling, Extraction and Verification of VCSEL Model for Optical IBIS AMI
A technique of modeling and extraction of VCSEL devices for IBIS-AMI has been proposed.

Article 2014-08-04

PDF PDF 1.18 MB
IBIS AMI Modeling of Retimer and Performance Analysis of Retimer based Active Serial Links
This paper presents a novel retimer modeling approach based on IBIS-AMI to capture the performance of a retimer that operates up to 15 Gbps.

Article 2014-08-04

PDF PDF 1.88 MB
Mechanism of Jitter Amplification in Clock Channels
In this paper. jitter amplification in clock channels is analyzed analytically using the techniques developed in "Frequency domain analysis of jitter amplification in clock channels."

Article 2014-08-04

PDF PDF 715 KB
De-Mystifying the 28 Gb/s PCB Channel: Design to Measurement
This paper demonstrates a design methodology for 28 Gb/s SERDES channels using Xilinx Virtex-7 Tx to show the required trade-offs that enable robust performance that is easy to verify with measurement.

Article 2014-08-04

PDF PDF 2.84 MB
Touchstone v2.0 SI/PI S-Parameter Models for Simultaneous Switching Noise (SSN) Analysis of DDR4
This article reprint presents a methodology to setup and analyze Simultaneous Switching Noise for DDR4 applications using Touchstone v2.0 models.

Article 2014-08-04

PDF PDF 8.20 MB
FEM Modeling of Gigahertz TEM Cells for Susceptibility Analysis of RFID Products
This paper presents a novel simulation methodology to model the coupling between a GTEM cell and an RF-ID antenna.

Article 2014-08-03

PDF PDF 816 KB
Matching Network Yin-Yang - Part 1
This Article by Randy Rhea covers basic matching concepts and matching network topologies, emphasizing methods for obtaining the desired performance with networks that are realizable in practice.

Article 2014-07-31

PDF PDF 554 KB
Designing RFID Tags Using Direct Antenna Matching
This Article by Cory Edelman and Murthy Upmaka describes the design challenges involved in RFID design and also focuses on the use of integrated EDA tools to optimally address the challenges.

Article 2014-07-31

PDF PDF 1.09 MB
Matching Network Yin-Yang - Part 2
This Article by Randy Rhea covers transmission line matching networks, plus a discussion of characteristics of the load affects matching bandwidth and the choice of network topologies.

Article 2014-07-31

PDF PDF 411 KB
RF SiP Design Verification Flow with Quadruple LO Down Converter SiP
This article reprint by HeeSoo Lee and Dean Nicholson outlines the design flow used for a System-in-Package component, using multiple die integrated into a single packaged device.

Article 2014-07-31

PDF PDF 505 KB
Practical Analysis of Backplane Vias - White Paper
This paper describes the methodology of using measurements on a test vehicle to build a high bandwidth, scalable model of long vias which includes the through and stub effects which can be used for system simulation.

Case Study 2014-07-31

PDF PDF 4.57 MB
New LDMOS Model Delivers Powerful Transistor Library - Part 2
This article reprint presents that the CMC (LDMOS FET) model can be scaled for a larger device, with a good fit for signal, power and distortion performance as illustrated by a 60W Doherty PA design example.

Article 2014-07-31

PDF PDF 699 KB
Symmetric and Asymmetric - Coupled Lines Band-Stop Filters at Ku/Ka Bands
This Article presents theory and design of coupled-line spur line band-stop filters, which are quite compact structures, lower radiation loss than conventional shunt stub and coupled-line filters.

Article 2014-07-31

PDF PDF 1.38 MB
Digital Predistortion Linearizes Wireless Power Amplifiers
This Article by Wan-Jong Kim, Shawn P. Stapleton, Jong Heon Kim, and Cory Edelman focuses on how digital predistortion linearizes wireless power amplifiers.

Article 2014-07-31

PDF PDF 1.81 MB
Using S-Parameter Data Effectively
This Article by Wilfredo Rivas-Torres focuses on how to incorporate Sparameters in the design process using a CAD approach.

Article 2014-07-31

PDF PDF 248 KB
Design and Characterization of Discontinuous RF/Microwave Passive Components
This Article by Dean Nicholson presents a design methodology proposed for designing and building RF circuits likely to contain discontinuous regions.

Article 2014-07-31

PDF PDF 1.43 MB
Accurate Simulation Models Yield High-Efficiency Power Amplifier Design
This Article by Sonoko Akamatsu, Charles Baylis, and Larry Dunleavy details the design goals and simulation- based processes for Power Amplifier Design.

Article 2014-07-31

PDF PDF 592 KB
New LDMOS Model Delivers Powerful Transistor Library - Part 1
This Article presents a new CMC LDMOS model that can accurately predicts both small-signal and nonlinear performance, and is scalable for devices of different sizes and power output capabilities.

Article 2014-07-31

PDF PDF 544 KB
Jitter Analysis: The Dual-Dirac Model, RJ/DJ, and Q-Scale - Application Note
This paper provides a complete description of the dual-Dirac model, how it is used in technology standards and a summary of how it is applied on different types of test equipment.

Article 2014-06-14

PDF PDF 515 KB

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