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Stay ALERT – Don’t Get Hurt

專文 2016-03-03

Testing a Network Communication PCBA from Prototype to Manufacturing - Article Reprint
Early implementation of BST can cut test costs and time.

專文 2016-02-17

PDF PDF 178 KB
The Boundary Scan Toolbox - Article Reprint
Find out how boundary scan can enable embedded and other value-added test in your toolbox.

專文 2016-02-16

PDF PDF 409 KB
New IEEE Standards for Board and System Tests - Article Reprint
This article highlights of changes to IEEE Std 1149.1, IEEE Std 1149.6, IEEE P1149.10 and IEEE P1838.

專文 2016-02-16

PDF PDF 190 KB
I'm a Board Test Engineer and I'm Loving It! - Article Reprint
Life on the road can be relentless, but it’s never boring. Find out why from this personal story of a test engineer.

專文 2016-02-12

PDF PDF 178 KB
Tester for Hire - Article Reprint
This article explores the possibility of renting test equipment to help electronics manufacturers juggle capacity according to production demand and available resources.

專文 2016-02-09

PDF PDF 381 KB
Testing the Internet of Things - Article Reprint
Connectivity is embedded in the electronics ecosystem. And test should be embedded in the devices that support it.

專文 2016-02-09

PDF PDF 79 KB
Manufacturing Test Solutions for SSDS - Article Reprint
A new system performs both ICT and boundary scan in high-volume settings.

專文 2016-02-09

PDF PDF 222 KB
Emulating Analog Input Sensors in Automotive Electronics Functional Test - Article Reprint
This article discusses guidelines for evaluating the digital-analog converters for your automotive electronics functional test needs.

專文 2016-02-09

PDF PDF 318 KB
Finding Fault - Article Reprint
testing mission-critical functions in automotive electronics.

專文 2016-02-05

PDF PDF 452 KB
Making Boundary Scan Easy - Article Reprint
Testing boundary scan devices no longer need be a laborious task.

專文 2016-02-03

PDF PDF 217 KB
Testing of Small Form-Factor Products - Article Reprint
Boundary scan and embedded test will need to make up for ICT gaps.

專文 2016-02-03

PDF PDF 546 KB
Automating In-Circuit Test - Article Reprint
Inline ICT is not as cumbersome as it used to be, and in the longer run, will help manufacturers save costs.

專文 2016-02-02

PDF PDF 87 KB
Testing New Grounds in Automotive Electronics - Article Reprint
Manufacturers are increasingly designing products for ease of test.

專文 2016-02-02

PDF PDF 279 KB
ECN article: Remote Wireless Test With LXI
Article reprinted with approval from ECN magazine.

專文 2014-04-07

LXI Instrumentation applied to bioanalytical electrical characterization

專文 2014-04-07

University of Hawaii using Keysight Equipment for Patient Monitoring Research

專文 2013-05-27

Artificial Retina Research at the University of Utah Provides Hope for the Blind

專文 2013-05-27

Electromagnetic Interference Meets Its Match
NVIDIA Summer 2010 article on how gaming-inspired 3D glasses and a GPU-accelerated simulation using Agilent's EMPro impact products we use every day.

期刊 2010-06-24

Positron Emission Tomography Imaging Using Agilent Acqiris U1067A High-Speed PCI

專文 2008-05-15

PDF PDF 73 KB