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Atomic Force Microscopes, FE-SEM, Nanoindenters, UTM

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The Revolutionary Impact of the Oliver and Pharr Technique - Application Note
Explanation of the Oliver-Pharr method and how it can be used to obtain an equivalent Vickers hardness number

Notes d’application 2015-05-04

PDF PDF 343 KB
Tribology of Dental Enamel: Effect of Etching - Application Brief
In this summary, the nano-tribological behavior of the dental enamel as a function of acid etching is characterized using a nanoindenter.

Notes d’application 2015-05-04

PDF PDF 624 KB
Strain-Rate Sensitivity of Thin Metal Films by Instrumented Indentation – Application Note
A new technique for measuring strain-rate sensitivity by instrumented indentation is presented. This new technique is insensitive to thermal drift and can be used for thin films and other small volumes materials

Notes d’application 2015-05-03

PDF PDF 1.38 MB
How Much Indentation Testing is enough testing? - Application Note
Overview of how much testing is required to conclude a significant difference between two observation sets at a particular confidence level.

Notes d’application 2015-04-30

PDF PDF 552 KB
Tensile Deformation of Fibers Used in Textile Industry - Application Note
Discussion of UTM T150 used to test four different individual textile fibers — cotton, wool, polyester and rayon — under tensile loading.

Notes d’application 2015-04-30

PDF PDF 2.75 MB
In Situ Young’s Modulus and Strain-Rate Sensitivity of Lead Free SAC 105 Solder - Application Note
Overview of how to improve the mechanical reliability of solder joints in integrated circuits, by instrumented indentation to measure the Young’s modulus (E) and strain-rate sensitivity (m) of a common lead-free solder alloy.

Notes d’application 2015-04-30

PDF PDF 521 KB
Mechanical Testing of Carbon Nanotube Arrays - Application Note
Application note explores the mechanical Testing of Carbon Nanotube Arrays and shows the mode deformation and unusal features in the force displacement data.

Notes d’application 2015-04-28

PDF PDF 967 KB
Mechanical Testing of Shale by Instrumented Indentation - Application Note
Case study of acquiring mechanical properties of fractures in shale

Notes d’application 2015-04-28

PDF PDF 2.67 MB
Performance and Control of the Keysight Nano Indenter DCM - Application Note
Overview of the DCM performance and control on the G200

Notes d’application 2015-04-28

PDF PDF 4.95 MB
Using a Compact Low Voltage FE-SEM in Evaluating Materials Nano-Porosity - Application Note

Notes d’application 2015-04-10

PDF PDF 2.99 MB
Why Magnification is Irrelevant in Modern Scanning Electron Microscopes - Application Note
A detailed explanation on the relative importance of magnification in Field Emission Scanning Electron Microscopy

Notes d’application 2015-04-10

PDF PDF 2.90 MB
Potential of Low Voltage Scanning Electron Microscopy Use in Archaeology/History of Art - App Note

Notes d’application 2015-04-08

PDF PDF 6.94 MB
Atomic Force Microscopy Studies in Various Environments - Application Note
Overview of using the environmental chamber with water, humidity and gaseous vapors in Polymer research

Notes d’application 2015-03-23

PDF PDF 5.80 MB
Combining Atomic Force Microscopy with Scanning Electrochemical Microscopy - Application Note
Application note discussing the combined AFM-SECM approach with bifunctional probe provides topographical and correlated electrochemical information with high spatial and temporal resolution, thereby enabling the transformation of scanning probe microscopic techniques into multifunctional devices.

Notes d’application 2015-03-22

PDF PDF 1.02 MB
Compositional Mapping of Materials with Single Pass Kelvin Force Microscopy - Application Note
Applications of single-pass KFM showing that the mode complements phase imaging in compositional mapping of complex materials.

Notes d’application 2015-03-13

PDF PDF 8.09 MB
Young’s Modulus of Dielectric ‘Low-k’ Materials - Application Note
Overview of Youngs Modulus in the nanomechanical testing of dielectic low-k materials as deposited on silicon

Notes d’application 2015-03-12

PDF PDF 536 KB
Imaging Graphene via Low Voltage Field Emission Scanning Electron Microscopy - Application Note
Review of the excellent imagaing capabilities of low-voltage SEM for morphology invertigation of graphene

Notes d’application 2015-03-11

PDF PDF 5.74 MB
The Role of a Compact Low Voltage FE-SEM in MEMS Analysis - Application Note
Overview of the 8500 high resolution imaging for MEMS devices without the need for metal coating to dissipate charge buildup.

Notes d’application 2015-03-11

PDF PDF 5.66 MB
Different Contrast Mechanisms in SEM Imaging of Graphene - Application Note

Notes d’application 2015-02-24

PDF PDF 1.75 MB
Charging Mitigation Strategies in Imaging Insulating Polymer Spheres via Low Voltage Field Emission

Notes d’application 2015-02-24

PDF PDF 4.76 MB
Imaging Organic and Biological Materials with Low Voltage Scanning Electron Microscopy - App Note

Notes d’application 2015-02-20

PDF PDF 3.66 MB
Introduction to Scanning Microwave Microscopy - Application Note

Notes d’application 2015-02-12

PDF PDF 1.49 MB
High Resolution Scanning Probe Microscopy in Controlled Environments - Application Note
This Application Note reports investigations involving high resolution SPM experiments with Keysight Technologies SPMs working in a glove box environment without compromising the SPM performance.

Notes d’application 2015-02-02

PDF PDF 1.57 MB
Mapping the Mechanical Properties of SAC 305 Solder with Express Test - Application Note
The note discusses the use of nano-indentation to map the mechanical properties of a SAC 305 solder joint, because electronic reliability depends on mechanical integrity. Traditional nano-indentation testing time for such mapping, would have been prohibitively long but with the Express Test we were able to generate quantitative and highly resolved hardness maps in about an hour.

Notes d’application 2015-01-28

PDF PDF 778 KB
SMM EMPro - Application Note
In this application note, we describe electromagnetic (EM) simulations using Keysight Technologies’ EMPro software to support the interpretation of scanning microwave microscope (SMM) experiments.

Notes d’application 2015-01-20

PDF PDF 2.43 MB

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