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Atomic Force Microscopes, FE-SEM, Nanoindenters, UTM

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Creep Activation Energy of SAC305 Using Nano-Indentation - Application Note
The note discusses the use of nano-indentation to map the mechanical properties of a SAC 305 solder joint, because electronic reliability depends on mechanical integrity. Traditional nano-indentation testing time for such mapping, would have been prohibitively long but with the Express Test we were able to generate quantitative and highly resolved hardness maps in about an hour.

Notes d’application 2015-01-22

PDF PDF 292 KB
SMM EMPro - Application Note
In this application note, we describe electromagnetic (EM) simulations using Keysight Technologies’ EMPro software to support the interpretation of scanning microwave microscope (SMM) experiments.

Notes d’application 2015-01-20

PDF PDF 2.43 MB
Measuring Stress-Strain Curves for Shale Rock by Dynamic Instrumented Indentation - Application Note
Study of Dynamic instrumented indentation as an ideal way to measure the mechanical properties of shale rock. Note includes samples that can be just a few millimeters in extent, and shows that ion-milling is an adequate method of surface preparation. The note proves that test forces greater than 300mN, the primary results (reduced modulus and hardness) are accurate, repeatable, and relevant.

Notes d’application 2015-01-19

PDF PDF 1.17 MB
A Comparative Microscopy Imaging Study on Tissue Specimens - Application Note

Notes d’application 2015-01-17

PDF PDF 1.92 MB
Introduction to SECM and Combined AFM-SECM - Application Note
Introduction to Scanning electrochemical microscopy (SECM) is a powerful scanning probe technique, which is suitable for investigating surface reactivity, and processes at the solid/liquid as well as liquid/liquid interface.

Notes d’application 2015-01-11

PDF PDF 607 KB
Combining Atomic Force Microscopy with Scanning Electrochemical Microscopy - Application Note
Application note discussing the combined AFM-SECM approach with bifunctional probe provides topographical and correlated electrochemical information with high spatial and temporal resolution, thereby enabling the transformation of scanning probe microscopic techniques into multifunctional devices.

Notes d’application 2015-01-11

PDF PDF 1.02 MB
Using Nanomeasurement Systems for Nanoscale Investigations of Graphene - Application Note

Notes d’application 2015-01-07

PDF PDF 7.95 MB
Mechanical Characterization of Sol Gel Coatings Using a Nano Indenter G200 - Application Note
A case study on Nanomechanical Characterization of Sol Gel Coatings.

Notes d’application 2014-12-29

PDF PDF 1.33 MB
Mechanical Properties Measurement on Individual Composite Micro-Fibers - Application Brief
Study of characterization of mechanical properties of bicomponent micro-fibers, consisting of nylon 6 nano-islands in a PET sea, under tensile loading.

Notes d’application 2014-12-29

PDF PDF 495 KB
Effect of Annealing on 50nm Gold Films - Application Note
Overview of Express Test used to evaluate the effect of annealing on 50nm gold films. The note proves that vacuum annealing for three hours (sub 300°C) causes the hardness to decrease by 4.3% – 6.7% with99.9% confidence.

Notes d’application 2014-12-18

PDF PDF 610 KB
Differentiating Surface Mechanical Properties with Dynamic Lateral Force Microscopy-Application Note

Notes d’application 2014-12-16

PDF PDF 2.06 MB
Lithium/Polymer Battery Mapping-Express Test - Application Note
Investigation of the the mechanical properties of a lithium rechargeable battery cathode by using both the classic XP CSM and the new DCM Express Test method.

Notes d’application 2014-12-16

PDF PDF 1.90 MB
Electrical Measurement - Application Note
Overview of electrical measurements using AFM in various modes

Notes d’application 2014-12-15

PDF PDF 4.11 MB
SMM Imaging of Dopant Structures of Semiconductor Devices - Application Note

Notes d’application 2014-12-10

PDF PDF 2.33 MB
Attaching Antibodies to MAC Levers with the Bifunctional Amine-Amine Reactive PEG Tether - App Note

Notes d’application 2014-12-08

PDF PDF 742 KB
Attaching Antibodies to AFM Probes with Sulfhydryl Reactive PEG Tether NHS-PEG18-PDP - App Note

Notes d’application 2014-12-08

PDF PDF 329 KB
Scanning Microwave Microscope Mode - Application Note

Notes d’application 2014-12-04

PDF PDF 320 KB
Rapid Characterization of Elastic Modulus - Application Note
Overview of Express Test Option for G200 NanoIndenter and how it increases instrument productivity by more than two orders of magnitude with ultra-fast indentation.

Notes d’application 2014-11-07

PDF PDF 166 KB
Nanotribological Studies of Lubricating Thin Films by Friction Force Microscopy - Application Note

Notes d’application 2014-09-04

PDF PDF 1.43 MB
Imaging Graphene via Low Voltage Field Emission Scanning Electron Microscopy - Application Note
Review of the excellent imagaing capabilities of low-voltage SEM for morphology invertigation of graphene

Notes d’application 2014-08-02

PDF PDF 692 KB
Imaging and Testing Dry and Hydrated Mouse Lung Endothelial Cells with a Nanoindenter
Review of new test method to scan and indent cells in liquid.

Notes d’application 2014-07-31

PDF PDF 339 KB
Quantitative Mechanical Measurements at the Nano-Scale Using the DCMII - Application Note

Notes d’application 2014-07-31

PDF PDF 545 KB
Evaluation of Bearing Materials Using Nano-Scale Wear Testing - Application Note
This is a study of miniature ball bearings made of steel, polytetrafluoroethylene (PTFE) reinforced with graphite, and polyether ether ketone (PEEK) are evaluated by means of nano-indentation and nano- wear testing

Notes d’application 2014-06-20

PDF PDF 1.08 MB
New Investigations into Energy: Keysight Nanomeasurement Systems - Application Note
The data presented demonstrates just a few of the ways in which the latest atomic force microscopy (AFM), nanoindentation, and field-emission scanning electron microscope can be utilized to enhance energy-related materials research.

Notes d’application 2014-04-24

PDF PDF 2.58 MB
Rapid Mechanical Properties of Multi-layer Film Stacks - Application Note
In this note, we measure the mechanical properties of 50nm films with remarkable precision and accuracy. The precision is due to Express Test, which performs indentations at a rate of one per second, thereby allowing many indentations to be included in the final determination of modulus and hardness.

Notes d’application 2014-02-17

PDF PDF 2.29 MB

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