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USB 2.0 Compliance Testing with Infiniium Oscilloscopes - Application Note
This Application Note discusses the solution for the USB 2.0 test suite. The Keysight solution is the only one-box solution that uses the official USB-IF scripts for precompliance ans compliance testing.

Application Note 2014-08-03

Stressing 1 GbE Receivers on the Physcial Layer - Application Note
The optional 81150A and 81160A arbitrary bit-shape pattern generators allow designers to test in a minimum of time and at low cost the robustness of their devices with repeatable real-world signals.

Application Note 2014-08-01

Download latest J-BERT M8020A application notes to master your designs
Submit the form to begin downloading the application briefs

Application Note 2014-04-09

Generating Looped Test Patterns or PRBS Signals with a Preamble - Application Note
This paper explains how to setup a test pattern with a preamble, which is played once e. g. to bring the tested device into a test mode, and the test data, played several times to test for errors.

Application Note 2014-03-04

PDF PDF 1.10 MB
Measuring Jitter in Digital Systems (AN 1448-1) - Application Brief
This application note is for R&D designers and engineers working on high-speed digital designs. It addresses jitter measurements in digital circuits, how the different measurement techniques are best applied, and how these decisions may change as the data rates increase.

Application Note 2013-09-16

PDF PDF 1.78 MB
Radar Distance Test to Airborne Planes - Application Note
Keysight pulse pattern generators are used for testing military radar communication systems, and as demonstrated in this publication, the aviation industry.

Application Note 2013-04-11

PDF PDF 904 KB
Pulse Parameter Definitions - Application Note
Here you find the pulse parameter definitions of terms used in the instrument specifications of Pulse Pattern Generators. Model Nos: 81110A, 81111A, 81112A, 81150A, 81160A, 81130A, 81131A, 81132A, 81133A, 81134A, 81180B, M8190A

Application Note 2013-02-14

PDF PDF 793 KB
Testing Circuit Board Power Distribution Using Real World Distortions - Application Note
Noisy, fluctuating or, generally speaking, distorted DC power levels will affect the operation of Integrated Circuits (ICs). Here is a proposal how to test the immunity of compensation circuits.

Application Note 2012-11-26

PDF PDF 368 KB
81150A and 81160A Pulse Function Arbitrary Noise Generators - Application Note
The Keysight 81150A and 81160A are pulse function arbitrary noise generators in different speed classes. They permit maximum test efficiency in a wide spectrum of applications.

Application Note 2012-08-13

PCI Express Transmitter Electrical Validation and Compliance Testing - Application Note
This application note is intended for digital designers and developers validating electrical performance of PCI Express-based designs and working toward electrical compliance of PCI Express products.

Application Note 2011-10-28

PDF PDF 1.01 MB
81150A and 81160A Arbitrary Bit-Shape Pattern Generator Application Note
The optional 81150A and 81160A Arbitrary Bit-Shape Pattern Generators allow designers to test in a minimum of time and at low cost the robustness of their devices with repeatable real-world signals.

Application Note 2011-09-20

De-Emphasized Signal Generation with the 81250A ParBERT - Application Note
This application note covers the basics of de-emphasized signal generation while considering the possible application and testing situations best suited for the 81250A ParBERT.

Application Note 2009-01-15

PDF PDF 2.93 MB
PCI Express® Revision 2 - Receiver Testing With J-BERT N4903A and 81150A Pulse - Application Note
Receiver Testing With J-BERT N4903A and 81150A Pulse

Application Note 2008-12-03

PDF PDF 1000 KB
Using IVI For Your Instrument Driver - Application Note
This application note describes the use of IVI drivers in your test system to determine when IVI is the right choice

Application Note 2008-11-14

Upgrade to PCI Express 2.0© Receiver Test - Application Note
The 15431A is a filter set for the 81150A. It generates the random jitter profile for testing PCI Express 2.0 receivers, to be used in conjunction with the N4903A. This fact sheet explains the upgrade.

Application Note 2008-10-24

PDF PDF 348 KB
New Noise Technology and Its Application - Application Note
New Noise Technology and Its Application

Application Note 2008-09-12

PDF PDF 641 KB
Flexible Signal Conditioning with the Help of the Keysight 81134A Pulse Pattern Generator - App Note
This application note describes how to set up the Keysight 81134A 3.35GHz Pulse Pattern Generator for different signal conditions.

Application Note 2008-06-01

PDF PDF 893 KB
MOI for SATA RSG Tests, SATA Interoperability Program Rev. 1.3 - Application Note
Keysight Method Of Implementation for SATA RSG Tests, Serial ATA Interoperability Program Revision 1.3

Application Note 2008-05-30

PDF PDF 2.17 MB
Using Receiver Tolerance Testing to Assess the Performance of High-Speed Devices - App Note
Using Receiver Tolerance Testing to Assess the Performance of High-Speed Devices

Application Note 2007-06-19

PDF PDF 214 KB
Automated USB 2.0 Receiver Compliance Test and Characterization with the Keysight N5990A - App Note
Automated USB 2.0 Receiver Compliance Test and Characterization with the Keysight N5990A Software Platform: 8 pages

Application Note 2007-01-31

PDF PDF 272 KB
Simulation of Jittering Synchronization Signals for Video Interfaces (PN 4) - Application Note
This Product Note shows how Research and Development engineers use pulse generators of the Keysight 81100 Family for the development of interfaces ...

Application Note 2006-12-12

PDF PDF 382 KB
Calibrated Jitter, Jitter Tolerance Test and Jitter Laboratory with J-BERT N4903A - App Note
This application note describes the N4903A BERT characterization solution for emerging serial gigabit devices: it helps engineers make quick and accurate jitter tolerance tests, which have been complicated and hard to do in the past.

Application Note 2006-07-18

PDF PDF 5.33 MB
81110A Pulse Pattern Generator-Simulating Distorted Signals for Tolerance Testing - App Note
81110A Pulse Pattern Generator-Simulating Distorted Signals for Tolerance Testing

Application Note 2006-06-01

PDF PDF 396 KB
81100 Family of Pulse/Pattern Generators the Dual Clock Gbit Chip Test (PN 2) - Application Note
In this Product Note the principle is to deliver a variable clock to feed either your device(s), board(s) or instrument(s). Due to the two channel capability it is also possible to generate clocks which ...

Application Note 2004-10-18

PDF PDF 220 KB
81100 Family of Pulse Pattern/Generators Radar Distance Test to Airborne Planes (PN 1) - App Note
This Product Note describes how a trigger pulse train of double pulses is sent from the control tower's radar system to an airplane.

Application Note 2004-10-12

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