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Overcome noise measurement challenges with the highly accurate Keysight EXA Signal Analyzer
Purchase the highly accurate Keysight N9010B EXA signal analyzer and receive for FREE an internal preamplifier, digital processing memory, and fast sweep capability.

促销资料 2016-11-30

PDF PDF 263 KB
W2637A and W2638A LPDDR BGA Probes / W2639A Oscilloscope Adapter Board User's Guide
This manual details the user information for the W2637A / W2638A LPDDR BGA probes as well as the W2639A Oscilloscope Adapter Board.

用户手册 2016-08-01

PDF PDF 1.23 MB
ADS Video Tutorials
A collection of Keysight EESof EDA video playlists for Advanced Design System (ADS).

基本演示 2016-07-22

HTML HTML 12 KB
9500 AFM - Data Sheet
Data sheet for the new 9500AFM with quick Scan, New Nano Navigator software and New Auto Drive for quick automatic setting off parameters

产品资料 2016-07-21

PDF PDF 3.33 MB
N8811A I²S Protocol Triggering and Decode Option for Infiniium Series Oscilloscopes - Data Sheet
Keysight’s N8811A I²S triggering and decode software provides unique software-accelerated decoding to help you accurately debug audio designs with the I²S bus.

产品资料 2016-07-20

PDF PDF 1.08 MB
Advanced Design System (ADS) Platform Support Roadmap
Keysight EEsof EDA Advanced Design System (ADS) platform support roadmap.

选型指南 2016-07-20

PDF PDF 77 KB
E Pluribus Unum: An Integrated Design Flow for Phased Arrays
This article shows how a connected suite of standard tools can streamline the design process while enabling trade-offs in RF and digital beam forming performance.

专访 2016-07-20

T4010S Conformance Test System - Technical Overview
The T4010S LTE RF test systems are automated solutions for conformance test and design verification of LTE UE. This document covers key benefits, features, technical specifications and ordering info.

技术总览 2016-07-20

Low Frequency Noise Analyzer Technical Demo
A more technical dive on the new Advanced Low-Frequency Noise Analyzer with WaferPro Express, which offers the unique ability to measure and model device noise across wafers. This release features a new user interface and tight integration with Keysight's WaferPro Express software, a platform that performs automated wafer-level measurements of semiconductor devices.

基本演示 2016-07-20

Understanding LTE-Advanced Base Station Transmitter RF Conformance Testing - Application Note
This application note focuses on LTE-A basestation transmitter testing using the 3GPP RF conformance tests. Examples provided with MXA Signal Analyzer, multi-touch and the LTE-A measurement app.

应用说明 2016-07-19

PDF PDF 4.51 MB
Release Notes (Version 05.60.00802)
Release notes for version 05.60.00802 of the Infiniium 9000 Series, S-Series, 90000 Series, V-Series, and Z-Series oscilloscope software.

发布说明 2016-07-19

PDF PDF 140 KB
N1911A/N1912A P-Series Power Meters and N1921A/N1922A Wideband Power Sensors - Data Sheet
This data sheet contains technical specifications and information for the N1911A/N1912A P-Series Power Meters and N1921A/N1922A Power Sensors.

产品资料 2016-07-19

Keysight Seamlessly Integrates Low-Frequency Noise Measurements in Wafer Level Solution Platform
New Advanced Low-Frequency Noise Analyzer Offers Unique Ability to Measure and Model Device Noise Across Wafers.

新闻资料 2016-07-19

User's Guides, Programmer's Guides, and Online Help (Version 05.60.00802)
This installer places an "Infiniium Docs" folder shortcut on your desktop. In this folder you can find user's guides, programmer's guides, and other manuals that go with Infiniium oscilloscope system software.

帮助文件 2016-07-19

EXE EXE 444.76 MB
Release Notes (Version 05.60.00802)
Release notes for version 05.60.00802 of the N8900A Infiniium Offline oscilloscope analysis software.

发布说明 2016-07-19

PDF PDF 140 KB
3D Models for N2135A Programmable NFC 3-in-1 Antenna (IGES, SAT, Step, and PKG Formats)
3D models are useful when designing holding fixtures for the antenna. In the zip file are IGES, SAT, Step, and PKG format models.

技术总览 2016-07-18

ZIP ZIP 4.40 MB
Introducing the 2016 Advanced Low-Frequency Noise Analyzer
The new Advanced Low-Frequency Noise Analyzer Offers Unique Ability to Measure and Model Device Noise Across Wafers. This release features a new user interface and tight integration with Keysight's WaferPro Express software, a platform that performs automated wafer-level measurements of semiconductor devices.

基本演示 2016-07-18

Troubleshooting Clock Jitter – Picotest
Troubleshooting Clock Jitter from Keysight Technologies and Picotest

Solution Brief 2016-07-18

3D Models for N2134A Programmable NFC 3-in-1 Antenna (IGES, SAT, Step, and PKG Formats)
3D models are useful when designing holding fixtures for the antenna. In the zip file are IGES, SAT, Step, and PKG format models.

技术总览 2016-07-18

ZIP ZIP 4.38 MB
InfiniiVision 6000L Series Oscilloscopes 3D Model, Step Format
This is a Step format 3D model of the 6000L Series oscilloscope and rack mount kit for inclusion in your 3D models for rack mounting solutions, etc.

技术总览 2016-07-18

ZIP ZIP 2.36 MB
3D Models for N2116A Programmable NFC 3-in-1 Antenna (IGES, SAT, Step, and PKG Formats)
3D models are useful when designing holding fixtures for the antenna. In the zip file are IGES, SAT, Step, and PKG format models.

技术总览 2016-07-18

ZIP ZIP 4.16 MB
InfiniiVision 6000L Series Oscilloscopes 3D Model, SAT Format
This is a SAT format 3D model of the 6000L Series oscilloscope and rack mount kit for inclusion in your 3D models for rack mounting solutions, etc.

技术总览 2016-07-18

ZIP ZIP 2.95 MB
InfiniiVision 6000L Series Oscilloscopes 3D Model, IGES Format
This is a IGES format 3D model of the 6000L Series oscilloscope and rack mount kit for inclusion in your 3D models for rack mounting solutions, etc.

技术总览 2016-07-18

ZIP ZIP 3.53 MB
WaferPro Express Support Home
WaferPro Express support home page in Keysight EEsof EDA Knowledge Center.

用户手册 2016-07-15

Scanning Microwave Microscopy Solutions for Quantitative Semiconductor Device Characterization
Discussion of Scanning Microwave combined with Atomic Force Microscopy for calibrated measurements for Semiconductor devices

应用说明 2016-07-15

PDF PDF 3.31 MB

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