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Increase RF and Microwave Test Efficiency and Throughput
Live broadcast October 11, 2017; 10am PT / 1pm ET

Webcast

Compound Semiconductor IC Symposium (CSICS) 2017
October 22-25, 2017; Miami, FL

Tradeshow

Modulated Amplifier Test Using PNA
New communications systems in 5G and Satcom require wideband modulation. Creating these signals is challenging and analyzing them involves characterizing non-linear behavior which is often limited by system noise floor. This paper discusses a new coherent measurement method that relies on knowing the period of the ACPR or NPR waveform and allows up to 20 dB improvement in ACPR or NPR detection. This method can also be used to improve power measurement of low level modulated signals and greatly reduce noise effects.

Seminar Materials 2017-09-05

PDF PDF 3.56 MB
High Performance Millimeter-wave Component Test Solution
With the increased demand to transfer large amounts of data at high speeds, there is an increasing need to utilize millimeter wave frequency band for information transfer. This in turn places high demand on designers and manufacturers in the industry to fully characterize and test both active and passive components at the millimeter wave frequencies, and current systems often lack the performance or bandwidth needed to fully understand component performance. This paper focuses on these measurement techniques.

Seminar Materials 2017-09-05

PDF PDF 4.10 MB
Complex Measurements on Differential, Multiport, and IQ Devices
Multiport devices with multiple inputs and outputs, such as differential amplifiers, multiport phase shifters, IQ mixers and Doherty amplifiers may require simultaneous multiple phase-controlled inputs and simultaneous measurements at multiple outputs, with phase correlation over different frequency bands. There is also the need to control DC inputs or measure DC parameters at the same time. Learn now advances to the differential and IQ measurement application makes these previously extremely-challenging measurements almost trivial.

Seminar Materials 2017-09-05

PDF PDF 3.19 MB
OTA: Over the Air Test Solutions for Emerging Wireless
The development of multi-antenna phased arrays, millimeter-wave radios and highly-integrated systems for 5G means that OTA test solutions must be easy to use, cost-effective, and have measurement capabilities appropriate for the users’ needs. This paper will step through the additional test challenges presented with 5G at millimeter wave and discuss potential solutions.

Seminar Materials 2017-09-05

PDF PDF 1.74 MB
Uncertainty and Verification of Noise Figure for Y-factor and Cold Noise Techniques
Correlating noise figure measurements between design and manufacturing is becoming more difficult and more important. LNA’s are increasingly integrated with other components such as switches, filters and power amplifier to form a Front-End-Module (FEM) used in wireless devices, These test systems must accommodate more complicated test scenarios than a simple LNA requires. This paper discusses the key contributions to NF measurement uncertainty in a straight-forward way that illustrates how errors accumulate in the two major methods (Y-factor and Cold Source).

Seminar Materials 2017-09-05

PDF PDF 2.84 MB
Next Generation Modular Software and Hardware for Aerospace/Defense and Wireless Applications
Understand how Keysight’s new scalable software defined instrument platform can help you get your products from R&D and DVT to manufacturing with the fastest time to market, highest quality, and lowest cost of test. This new instrument platform is the foundation for solutions to address challenges for aerospace/defense and wireless applications, including Over-the-Air (OTA) test, massive-MIMO, and even cloud-based test methodologies.

Seminar Materials 2017-09-05

PDF PDF 3.49 MB
Accuracy Matters
What do you do with the result after you take a measurement? Often, people compare the result to a specification and make a “Pass” or “Fail” decision to ship or reject the item under test. They don’t teach you in school how accuracy affects the risk of incorrect Pass/Fail decisions. We will.

Seminar Materials 2017-09-05

PDF PDF 951 KB
Ixia – “5G for Dummies” eBook
Ixia – “5G for Dummies” eBook

Seminar Materials 2017-08-30

PDF PDF 4.31 MB
Be Prepared for Next Generation MIPI Physical Layer Design and Evaluation Webcast
Original broadcast August 24, 2017

Webcast - recorded

Medical Wireless Technology Applications Offer Opportunities and Challenges
Original broadcast July 18, 2017

Webcast

Smart Testing to Limit Your Risk Exposure in Wireless Medical Devices
Original broadcast August 23, 2017

Webcast - recorded

Advanced Measurement Seminar 2017
Various dates and locations in 2017

Seminar

FieldFox Handheld Analyzers Education Series
Series of live and on-demand webcasts

Webcast

International Microwave Symposium (IMS) 2017
June 4 - 9, 2017; Honolulu, Hawaii

Tradeshow

RF & Microwave Measurement Fundamentals
This 4-day class studies the principles of microwaves on transmission lines and power measurements, signal sources, mixers and modulation techniques, and the use of signal types in test applications.

Classroom Training

Automating Everyday Test and Measurement Tasks in Minutes
Live broadcast July 19, 2017; 10am PT / 1pm ET

Webcast

Tutorials in Signal Integrity - Webcast Library
Upcoming, live webcasts and past, on-demand webcasts.

Webcast

USB Type-C Physical Layer Design Webcast
Live broadcast November 9, 2017; 10am PT / 1pm ET

Webcast - recorded

Characterization and Modeling Challenges for Advanced Semiconductor Technologies - Seminar Materials
Seminar materials from the "Characterization and Modeling Challenges for Advanced Semiconductor Technologies" seminar.

Seminar Materials 2017-08-14

What's New in Keysight Technologies' Device Modeling Portfolio 2017
Highlights of new capabilities in Keysight's end-to-end device modeling portfolio, Power Electronics modeling solution preview, Wafer-level 1/f noise & Random Telegraph Noise (RTN) measurement solutions, Model Builder Program (MBP), and Model Quality Assurance (MQA).

Seminar Materials 2017-08-10

PDF PDF 3.19 MB
Automatable RTN Measurement Using the B1500A Semiconductor Parameter Analyzer
As device lithographies have continued to shrink, understanding the impact of random telegraph noise (RTN) on integrated circuits has become increasingly important. Due to its innate random nature and dependence on applied voltage, characterizing RTN on a process requires many measurements to be made across a wafer at multiple gate-to-source biases. This section will cover the basics of RTN measurement and outline a cost-effective Keysight solution using WaferPro Express and the B1500A Semiconductor Device Analyzer.

Seminar Materials 2017-08-10

PDF PDF 2.41 MB
Python-driven Table Generation in Automated Device Model Validation
MQA is a well-known, automated SPICE model validation software that enables engineers to check and analyze SPICE model libraries, compare different models, and generate quality assurance (QA) reports in a complete and efficient way. MQA 2017 extends these capabilities by introducing the Python Report Formatting System (PyRFS) module, which allows engineers to customize tables—either generate new tables or update existing tables—in .csv and .xlsx file formats.

Seminar Materials 2017-08-10

PDF PDF 2.41 MB
How to Extract BSIM4 DC Model
Model Builder Program(MBP) 2017 improves the model extraction process through the use of special utilities and scripting. This new, improved modeling process will be demonstrated on a BSIM4 transistor.

Seminar Materials 2017-08-10

PDF PDF 955 KB

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