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LTE-Advanced Design & Test Challenges - Carrier Aggregation
Original broadcast August 23, 2012

Webcast - recorded

LTE and the Evolution to LTE-Advanced Fundamentals Webcast Series
Original webcasts March 26 & 28, 2013

Webcast - recorded

Your LTE Devices Need to Pass Conformance Tests – Now What?
Original broadcast May 23, 2013

Webcast - recorded

Understanding Probability of Intercept for Intermittent Signals Webcast
Original broadcast March 21, 2013

Webcast - recorded

Moving forward to LTE-Advanced with Heterogeneous Networks
Original broadcast on January 24, 2013

Webcast - recorded

Reflections of the Future: Trends in Radar and their Impact on Test Webcast
Original broadcast April 18, 2013

Webcast - recorded

Overcome LTE-A UE Design Test Challenges with Keysight’s New UXM
Original broadcast February 13, 2014

Webcast - recorded

Power measurements & analysis using Agilent InfiniiVision 3000 X-Series oscilloscopes (Italiano)
The webcast will discuss in detail some power supply measurements that are commonly used and how Keysight’s InfiniiVision 3000 X-Series oscilloscope can help characterise switching power supplies automatically, consistently, and fast.

Webcast - recorded

Debugging automotive serial buses using an Agilent InfiniiVision Series oscilloscope (Italiano)
We will give an overview of the timing and protocol structure of the LIN, CAN and FlexRay buses. We will show Keysight’s Hardware based decoding to capture random errors and time-correlate data transfer information with the physical layer.

Webcast - recorded

Debugging Serial Buses using an InfiniiVision Series Oscilloscope
EMEA Web seminar - Debugging Serial Buses using an InfiniiVision Series Oscilloscope

Webcast - recorded

Think Outside the Box: PC-based Oscilloscope Analysis Software
Ever wish you could do additional signal viewing, analysis and documentation tasks away from your scope and target system? With Keysight’s InfiniiView oscilloscope analysis software, now you can.

Webcast - recorded

Radar Pulse Measurements using NEW Peak Power Analyzer
The new 8990A has higher performance coupled with more features offering better value. Seminar will highlight some key features and illustrate how the new peak power analyzer is used to perform efficient pulse characterization in various applications

Webcast - recorded

IEEE 802.11ad PHY Layer Testing
This web seminar will start with a brief tutorial introduction to the IEEE 802.11ad PHY layer. We will then review a variety of modulation analysis measurements and consider what can each of them tell us about the device under test.

Webcast - recorded

Physical Layer design challenges for PCI Express® 3.0 and 2.0 designs
You will learn advanced techniques for PCI Express phy-layer validation covering the latest PCIe 3.0 specification requirements as well as practical extensions to PCIe 2.0 and 1.1 designs. This seminar analyzes transmitter and receiver performance.

Webcast - recorded

Small signal, low level, DC Parametric measurements: Back to Basics Part 1
The "Back to Basics Part 1" seminar provides practical tips and techniques on making low level DC Parametric measurements.

Webcast - recorded

Characterizing MIL-STD 1553 and ARINC 429 Serial Bus Networks
This webinar will discuss how modern Oscilloscopes are able to trigger and automatically decode MIL-STD 1553 and ARINC429 serial buses. In addition we will analyse physical layer characteristics and perform a pass/fail test using an eye-diagram.

Webcast - recorded

Eliminate the need for cumbersome multi-instruments setups for stress testing devices
EMEA web seminar - Eliminate the need for cumbersome multi-instruments setups for stress testing devices

Webcast - recorded

Digitizer fundamentals: Design considerations to achieve superior measurements
More than just understanding banner specs such as bandwidth and sampling rate, this webinar will arm you with knowledge of digitizer technology and underlying specifications to ensure you make accurate measurements that meet your application needs.

Webcast - recorded

Optimise UE design for greater battery run-time
This web seminar will discuss the challenges of verifying battery consumption during different UE operating modes and the tools available to measure the effects in power consumption.

Webcast - recorded

Debugging automotive serial buses using an Agilent InfiniiVision Series oscilloscope
This webinar will give an overview of the timing and protocol structure of the LIN, CAN and FlexRay buses. We will show Keysight’s Hardware based decoding to capture random errors and time-correlate data transfer information with the physical layer.

Webcast - recorded

What’s happening with IEEE std. 1149.1 Boundary Scan?
The IEEE is revamping it, in a big way. What does that mean to test engineers?

Webcast - recorded

Semiconductor Parametric Test: Back to Basics Part 2
The "Back to Basics Part 2" seminar provides practical tips and techniques on making fast pulse IV measurements and practical capacitance measurement considerations.

Webcast - recorded

Debug Digital Designs Faster with Advanced Parametric Triggering
Advanced parametric triggering can help synchronize oscilloscope acquisitions and display complex signal activity. Find signal parametric violation conditions such as setup & hold, edge speed, pulse amplitude (runts), pulse width violations, etc.

Webcast - recorded

Analyze, Validate and Debug High Speed Memory
This Webcast will demonstrate techniques and solutions for performing turn-on, interoperability, validation and compliance testing of high data rate DDR3 memory based products.

Webcast - recorded

Introduction to 802.11ac WLAN Technology and Testing
This web seminar provides an introduction to the new IEEE 802.11ac standard that is under development to address the need for “very high throughput.”

Webcast - recorded

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