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Genesys Overview
Genesys continues to offer the industry’s most powerful RF circuit and system synthesis capabilities in an affordable, accurate and easy-to-use simulation software that you’ve come to love. Keysight Sys-Parameters provide breakthrough convenience in using component datasheet parameters such as amplifier P1dB, IP3, gain and noise figure over frequency, temperature and bias for simulation without the need to create custom files and equations.

Demo 2016-01-26

E5260A IV Analyzer/8 Slot High Speed Measurement Mainframe - Data Sheet
This data sheet provides key features and specifications for the E5260A IV Analyzer/8 Slot High speed Measurement Mainframe for current-voltage characterization.

Technical Overview 2016-01-25

E5080A ENA Series Network Analyzer - Brochure
This brochure introduces the Keysight E5080A ENA series network analyzer that is our next-generation ENA, providing best-in-class performance, flexible functionality and advanced usability.

Brochure 2016-01-25

PDF PDF 6.31 MB
E5270B Precision IV Analyzer/8 Slot Precision Measurement Mainframe - Data Sheet
This literature provides key features and specifications for the E5270B Precision IV Analyzer / 8 Slot Precision Measurement Mainframe for current-voltage characterization.

Data Sheet 2016-01-25

USB 3.1 10G Type-C Receiver Testing - video
How do you test a USB 3.1 gen2 10G Type-C receiver? It can be very complex. This video provides an overview of intrinsic jitter requirements, automated calibration options, getting your device into loopback mode, and more!

Demo 2016-01-25

N8834A MultiScope Application - Data Sheet
N8834A MultiScope application enables Infiniium real-time oscilloscope users to bring multiple scopes together for measurement on a single timebase.

Data Sheet 2016-01-25

Model Quality Assurance (MQA)
MQA provides the complete solution and framework to fabless design companies, IDMs, and foundries for SPICE model library validation, comparison, and documentation.

Brochure 2016-01-25

PDF PDF 3.13 MB
Low-Frequency Noise Measurement System Adopted by China CEPREI Laboratory for Reliability Studies
Keysight announces that CEPREI Laboratory has successfully adopted the Keysight EEsof EDA E4727A Advanced Low-Frequency Noise Analyzer (A-LFNA) for measurement and analysis of flicker noise (1/f noise) and random telegraph noise (RTN) during its reliability studies of semiconductor devices including MOSFETs, HEMTs and TFTs.

Press Materials 2016-01-25

Demo: How to test PCIe 4.0 YouTube Video
The spec for PCIe 4.0 (gen4) is not finalized, but testing is still required. See a demonstration of a test solution on an Analog Bits half power SERDES running at 16 Gb/s to help get your PCIe gen4 device running. Calibrated stressed output, ISI, and jitter tolerance tests ready for PCIe 4.0.

Demo 2016-01-25

New BenchVue Test Flow App Eliminates Programming for Custom Automated Tests Content
Automate test device characterization with BenchVue Test Flow. Using Keysight's B2962A Source Measure instrument, this video illustrates how you can characterize a transistor's V/I curve trace and understand the results all within BenchVue.

Demo 2016-01-25

Model Builder Program (MBP)
MBP is a one-stop solution that provides both automation and flexibility for silicon device modeling.

Brochure 2016-01-25

PDF PDF 930 KB
N9069C Noise Figure X-Series Measurement Application - Technical Overview
The N9069C noise figure measurement application together with a Keysight UXA signal analyzer offers engineers a simple tool to make accurate and repeatable noise figure measurements.

Technical Overview 2016-01-22

PDF PDF 2.18 MB
Ecal Module Calibration - Flyer
For the most accurate vector network analyzer (VNA) measurements, calibrate your Electronic Calibration Module (Ecal) every 12 months

Solution Brief 2016-01-22

PDF PDF 638 KB
U4164A Logic Analyzer Service Guide
This service guide contains information on how to prepare a U4164A module for use, how to troubleshoot or test U4164A performance, and how to replace or return this module.

Service Manual 2016-01-22

PDF PDF 3.21 MB
B1500A Semiconductor Device Analyzer - Data Sheet
The Keysight B1500A Semiconductor Device Analyzer is a modular instrument with a ten-slot configuration that supports both IV and CV measurements. Its familiar MS Windows user interface supports Keysight’s new EasyEXPERT software, which provides a new, more intuitive task-oriented approach to device characterization. Because of its extremely low-current, low-voltage, and integrated capacitance measurement capabilities, the Keysight B1500A can be used for a wide range of semiconductor device characterization needs.

Data Sheet 2016-01-22

E5262A/E5263A Channel IV Analyzer/Source Monitor Unit - Data Sheet
This Data Sheet provides key features and specifications for the E5262A/E5263A 2 Channel IV Analyzer/ Source Monitor Unit for current-voltage characterization.

Data Sheet 2016-01-22

Engineering Lab Dedication Celebrates Largest In-kind Gift in University of South Florida History
A lab inside the University South Florida College of Engineering was renamed to recognize a historic partnership with Keysight Technologies, Inc., which has resulted in 20 years of software donations to the university valued at more than $203 million. Keysight’s in-kind gift represents the largest in USF history.

Press Materials 2016-01-22

Method of Implementation (MOI) for USB Type-C to Legacy Cable-Connector Assembly Compliance Test
Keysight Method of Implementation (MOI) for USB Type-C to Legacy Cable-Connector Assembly Compliance Test Using Keysight E5071C ENA Network Analyzer Option TDR

Application Note 2016-01-21

PDF PDF 2.97 MB
N9010B EXA X-Series Signal Analyzer, Multi-touch - Data Sheet
This data sheet provides technical specifications and characteristics for the N9010B EXA signal analyzer

Data Sheet 2016-01-21

PDF PDF 1.79 MB
Method of Implementation (MOI) for USB Type-C to Legacy Adapter Assembly Compliance Test
Keysight Method of Implementation (MOI) for USB Type-C to Legacy Adapter Assembly Compliance Test Using Keysight E5071C ENA Network Analyzer Option TDR

Application Note 2016-01-21

PDF PDF 2.77 MB
Boundary Scan DFT Guidelines for Good Chain Integrity and Test Coverage - Application Note
This application note provides some key guidelines to enable good design for testability using boundary scan.

Application Note 2016-01-21

PDF PDF 1.99 MB
Precision Current-Voltage Analyzer Series - Selection Guide
The Precision Current-Voltage Analyzer Series ensures accurate and efficient current-voltage measurements that give a clear insight into IV characteristics across a wide range of applications.

Selection Guide 2016-01-21

E5260A/E5262A/E5263A/E5270B Precision IV Analyzer - Technical Overview
This technical overview introduces how to evaluate precision current-voltage characteristics using E5260A/E5262A/E5263A/E5270B Precision IV Analyzer series.

Technical Overview 2016-01-21

909C Precision Coaxial Termination Data Sheet

Data Sheet 2016-01-21

N9080/82C LTE/LTE-A Technical Overview

Technical Overview 2016-01-21

PDF PDF 4.88 MB

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