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Electronic Measurement

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Agilent Announces United Microelectronics Corporation Certification of GoldenGate Software

Press Materials 2010-06-04

Agilent Technologies’ Latest 3D EM Simulation Software Accelerates High-Frequency, High-Speed Design

Press Materials 2010-05-20

Agilent's Latest RF/Microwave Design Genesys Software Features Breakthrough X-Parameters Technology

Press Materials 2010-05-17

Media Contacts

Press Materials 2010-05-12

Agilent Technologies to Showcase Latest RF/Microwave Design and Test Products at IMS 2010

Press Materials 2010-05-11

Agilent Technologies Partners with Innowireless on LTE Test Solutions
Agilent Technologies Inc. (NYSE: A) today announced it has formed a strategic partnership with Innowireless Co., Ltd. to enhance the rapid development of LTE wireless test platforms.

Press Materials 2010-05-05

Agilent Technologies to Showcase LTE Test Solutions at LTE World Summit 2010
Agilent Technologies to Showcase LTE Test Solutions at LTE World Summit 2010

Press Materials 2010-05-04

Agilent Technologies Extends LTE Leadership with New Signal Studio for 3GPP LTE and VSA Software
Agilent Technologies Extends LTE Leadership with New Signal Studio for 3GPP LTE and VSA Software Capabilities

Press Materials 2010-05-03

Press Releases for 81150A

Press Materials 2010-04-29

Press Releases for 81180A

Press Materials 2010-04-29

Press Releases for N5998A

Press Materials 2010-04-29

Press Releases for 81250A

Press Materials 2010-04-29

Press Releases for 81134A

Press Materials 2010-04-29

N4391A Press Releases

Press Materials 2010-04-27

Agilent Introduces Industry-First 4.2 GSa/s High-Resolution Arbitrary Waveform Generator
The 81180A arbitrary waveform generator, a new generation of instrument that bridges the trade-off between bandwidth and bits.

Press Materials 2010-04-13

Agilent Technologies’ GoldenGate Software Selected by RF Integration for Advanced RFIC Development

Press Materials 2010-04-05

Backgrounders

Press Materials 2010-03-30

Agilent Technologies Launches 2010 Agilent Measurement Forum Asia Tour

Press Materials 2010-03-29

Agilent Adds Compact Tunable Lasers, Multimode Attenuators to 77-Series Optical Test Instruments

Press Materials 2010-03-22

LXI Press Releases

Press Materials 2010-03-16

Agilent Technologies’ SystemVue Now Offers Modeling, Scripting Capability Using MATLAB
SystemVue 2012.07 now provides the ability to perform complete mathematical modeling and scripting in SystemVue using MATLAB software.

Press Materials 2010-03-15

Optical Modulation Analyzer Enables Greater than 200G Transmission at 28G Symbol Rate

Press Materials 2010-03-15

Agilent Technologies' SystemVue Now Links C++ Code Generation, X-parameters for RF-DSP Co-Design

Press Materials 2010-03-15

Advanced Design System Software Selected by Paratek Microwave for Antenna Tuning Module Development

Press Materials 2010-03-03

B1505A Press Releases

Press Materials 2010-02-28

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