Discutez avec un expert

Support technique

Mesure Electronique

Recherche par numéro de modèle du produit: Exemples : 34401A, E4440A

Affiner la liste

retirer tout le raffinement

Par industrie/technologie

Par type de contenu

Par catégorie de produit

Par autre catégorie

226-250 sur 860

Press Releases for N4917A
Press Releases for N4917A

Dossier de presse 2013-05-06

Press Releases for N2101B
Press Releases for N2101B

Dossier de presse 2013-05-06

Press Releases for N4916A
Press Releases for N4916A

Dossier de presse 2013-05-06

Industry-first solution for testing SD UHS-II receivers
Automated Solution Based on J-BERT Accelerates Testing of SD Memory Card Host and Device Receivers

Dossier de presse 2013-04-24

Agilent Technologies to Showcase Bit Error Ratio Tester at OFC/NFOEC
New Options Enable 32-Gb/s ASIC Component and Optical Transceiver Designs

Dossier de presse 2013-04-24

Introduces High-Sensitivity Multiport Optical Power Meters
Meters Combine Highest Optical Performance and Large Data Storage in Compact Platform

Dossier de presse 2013-04-24

Agilent Technologies Updates Reference-Class Multiwavelength Meter
Extended Recalibration Intervals Reduce Downtime and Cost of Ownership

Dossier de presse 2013-04-24

Agilent Technologies Announces 802.11ac WLAN One-Box Test Solution and Multiport Adapter
The new E6630A wireless connectivity test set and E6618A multiport adapter can help wireless device manufacturers quickly and accurately test 802.11a/b/g/n/ac WLAN, Bluetooth® 1.0 to 4.0, and Global Navigation Satellite Systems (GNSS) technologies.

Dossier de presse 2013-04-16

Agilent Technologies Unveils Beidou GNSS Signal Simulation at International Wireless Symposium
Agilent Technologies announced that it has enhanced the capabilities of its Signal Studio for Global Navigation Satellite Systems (GNSS) software and added real-time multi-satellite simulation of China's Beidou system.

Dossier de presse 2013-04-15

Agilent 3-D EM Simulation Software Selected by STMicroelectronics for Integrated Passive Devices
Agilent announces that STMicroelectronics, a global semiconductor leader serving customers across the spectrum of electronics applications, has selected EMPro software for use in development of integrated passive devices (IPDs).

Dossier de presse 2013-04-09

Agilent PXT Wireless Communications Test Set Selected by Tri-L Solutions for LTE Over-the-Air Test
Agilent Technologies Inc. (NYSE: A) today announced that Tri-L Solutions Inc. has selected Agilent's PXT wireless communications test set and integrated it with Tri-L Solutions SmarTest measurement software for testing LTE over the air.

Dossier de presse 2013-04-08

Agilent to Demonstrate Latest RF Circuit, System and 3-D EM Design & Simulation Solutions at WAMICON
Agilent announces it will demonstrate its latest RF circuit, system and 3-D electromagnetic design and simulation solutions at the 14th annual IEEE Wireless and Microwave Technology Conference. WAMICON 2013 will be held April 7-9 at the Caribe Royale Hotel and Convention Center in Orlando, Fla.

Dossier de presse 2013-04-04

Agilent Technologies Simulation Software Selected by Plextek RF Integration
Agilent announces that Plextek RF Integration, a UK-based company that designs and develops RFICs, MMICs and microwave/millimeter-wave modules, has selected Agilent software to simulate its new high-frequency circuit and MMIC designs.

Dossier de presse 2013-03-27

Agilent Technologies' EEsof YouTube Channel Passes Half-Million View Mark
Agilent announces that its Agilent EEsof EDA channel on YouTube has surpassed half a million views and 1,300 subscribers.

Dossier de presse 2013-03-20

Agilent Technologies to Showcase Bit Error Ratio Tester at OFC/NFOEC
A new era of data-center infrastructure enabling cloud computing, big data and analysis is driving the development of new high-speed data transfer standards such as 100-Gb Ethernet and 32-Gb Fibre Channel.

Dossier de presse 2013-03-14

Press Releases for N4960A
Press Releases for N4960A

Dossier de presse 2013-03-14

Agilent Technologies Updates Reference-Class Multiwavelength Meter
Agilent Technologies Inc. (NYSE: A) today introduced the Agilent 86122C multiwavelength meter, the newest member of its line of wavelength meters.

Dossier de presse 2013-03-13

Agilent Technologies Introduces High-Sensitivity Multiport Optical Power Meters
The two- channel N7747A and four-channel N7748A bring the industry-leading sensitivity of the 81634B sensor module to the compact multichannel N77 platform, with updated memory size and data-transfer speed.

Dossier de presse 2013-03-13

Agilent Ships Newest SPICE Model Extraction and Qualification Software
Agilent announces shipment of the latest release of its industry-leading SPICE model extraction tool, Model Builder Program, and SPICE qualification tool, Model Quality Assurance.

Dossier de presse 2013-03-13

Agilent Technologies Launches Recognition Program for EDA Experts
Agilent launches its Agilent Certified Expert recognition program for EDA experts. Eligible participants include individuals demonstrating a high level of expertise-both theoretical and practical-in applying Agilent EEsof EDA tools for product design and modeling.

Dossier de presse 2013-03-12

Agilent Technologies Helps Students Acquire Real-World EDA Skills with New Licensing Program
Agilent launches the Agilent EEsof EDA Student License Program, designed to provide access to Agilent EEsof EDA software on students’ personal computers.

Dossier de presse 2013-02-25

Agilent Technologies Announces Host Adapter for MIPI Alliance DigRF v4 RFICs
Agilent Technologies Announces Host Adapter for MIPI Alliance DigRF v4 RFICs

Dossier de presse 2013-02-21

Agilent's Newest SystemVue Software Release Accelerates MIMO Radar and Wireless/4G Design
Agilent announces the newest release of SystemVue, its premier platform for designing communications and defense systems.

Dossier de presse 2013-02-14

Agilent Technologies Commits $90 Million Gift of Software to Georgia Institute of Technology
Agilent announces the largest in-kind software donation ever in its longstanding relationship with the Georgia Institute of Technology.

Dossier de presse 2013-02-04

Agilent Technologies and SiSoft Introduce Pre-Standard IBIS-AMI Modeling Guide
Agilent and Signal Integrity Software, Inc. (SiSoft) announce guidelines that enable system designers to use advanced jitter and broadband analog capabilities when modeling high-speed serial devices.

Dossier de presse 2013-01-29

Précédente 1 2 3 4 5 6 7 8 9 10 ... Page suivante