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Finding Fault - Article Reprint
testing mission-critical functions in automotive electronics.

文章 2016-02-05

PDF PDF 452 KB
Making Boundary Scan Easy - Article Reprint
Testing boundary scan devices no longer need be a laborious task.

文章 2016-02-03

PDF PDF 217 KB
Testing of Small Form-Factor Products - Article Reprint
Boundary scan and embedded test will need to make up for ICT gaps.

文章 2016-02-03

PDF PDF 546 KB
Testing New Grounds in Automotive Electronics - Article Reprint
Manufacturers are increasingly designing products for ease of test.

文章 2016-02-02

PDF PDF 279 KB
Automating In-Circuit Test - Article Reprint
Inline ICT is not as cumbersome as it used to be, and in the longer run, will help manufacturers save costs.

文章 2016-02-02

PDF PDF 87 KB
Using a Wide-Band Tunable Laser for Optical Filter Measurements – Article
This article was published in NASA Tech Briefs hard copy and online, highlighting how to use a wide-band tunable laser for optical filter measurements.

文章 2016-01-18

PDF PDF 1.82 MB
Reference Solutions - A New Approach to Test and Measurement Provisioning - Article Reprint
This article describes the Keysight Reference Solution approach to providing application specific HW and SW test configurations.

文章 2016-01-18

PDF PDF 565 KB
2015 Global Digital Oscilloscopes Growth Award
Understand how Frost & Sullivan evaluates and decides on the winner for this award

文章 2016-01-05

PDF PDF 1.06 MB
边界扫描测试的缺陷范围:通过边界扫描测试意味着什么 ?
边界扫描测试的缺陷范围:通过边界扫描测试意味着什么 ?

文章 2015-12-22

PDF PDF 1 MB
测试范围:通过电路板测试时意味着什么?
测试范围:通过电路板测试时意味着什么?

文章 2015-12-22

PDF PDF 649 KB
Keysight Vectorless Test EP (VTEP) 与 Keysight TestJet 相比
Keysight Vectorless Test EP (VTEP) 与 Keysight TestJet 相比

案例分析 2015-12-22

PDF PDF 1 MB
Minimizing Design Risk, Shortening Development Time of a Digital Transmission System
Powerful design and simulation software provides valuable insights to help uncover and solve difficult design challenges at every stage of the design process.

案例分析 2015-12-15

PDF PDF 1.17 MB
IoT wireless sensors and the problem of short battery life
Electronic Product Design and Test, Dec 1, 2015 article

文章 2015-12-01

灵活的 5G 波形生成和分析测试台
在 LTE 和 LTE-Advanced 的部署仍然方兴未艾之时,对下一代无线网络的研究已经快速发展起来。

文章 2015-11-13

Effective Maintenance + Troubleshooting of Earth Stations, SatMagazine - Article Reprint
This SatMagazine article describes how Keysight's handheld combination analyzers (FieldFox) can replace the full set of instruments previously used by satellite maintainers in the field.

文章 2015-11-12

PDF PDF 829 KB
PXIe Measurement Accelerator Speeds RF Power Amplifier Test - Article Reprint
This article, reprinted with permission from Microwave Journal, describes the speed improvement provided by Keysight's M9451A PXIe Measurement Accelerator.

文章 2015-11-11

PDF PDF 1.63 MB
5G 空中接口需要信道测量
2015 年 10 月 31 日,在《EDN》上刊登了一篇由 Sheri DeTomasi 撰写的文章,其中讨论了如何表征无线信道,以此来了解新 5G 信号的传播方式,同时讲述了能够提供所需洞察力的系统。

文章 2015-10-31

Using Automatic Synthesis of RF, Microwave & Analog Circuits to Increase Design Productivity by 10x
Microwave Product Digest's October 2015 Featured Article written by How-Siang Yap of Keysight Technologies.

专访 2015-10-28

极大影响测试和测量的 5G 设置
2015 年 10 月 19 日《Canadian electronics》刊登了由 Roger Nichols 撰写的文章,其中讨论了在研究各种 5G 技术时遇到的测试挑战。

文章 2015-10-19

是德科技借助校准优化关键测量性能 - 再版文章
是德科技借助校准优化关键测量性能 - 再版文章

文章 2015-10-10

PDF PDF 2 MB
使用 ENA 系列网络分析仪执行无线功率传输效率测试
ENA 系列网络分析仪中的选件 006 无线功率传输分析软件能够实时进行无线功率传输效率测量。先进的 2D/3D 仿真特性可以显示负载阻抗的关系。

文章 2015-09-25

Keysight EEsof EDA makes it easy to get back to school—at least virtually
Rick Nelson, executive editor of Evaluation Engineering, visited Keysight Technologies and had this to say about Keysight EEsof EDA.

文章 2015-09-11

First 50 GHz Handheld Analyzer Speeds Field Work - Article Reprint
This MW Journal article reprint describes the new family of FieldFox analyzers - the industry's first 50 GHz handheld models, including how they can be effectively used in radar and satellite apps.

文章 2015-09-01

PDF PDF 1.24 MB
The Universal Flash Storage Association (UFSA)
UFSA

内部通讯 2015-08-18

IEEE 802.11ah: Wi-Fi below 1 GHz
EDN, August 17, 2015 article by Kevin Qian & Mingyan Wang explains the new IEEE 802.11ah technology for IoT and the test challenges.

文章 2015-08-17

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