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Testing New Grounds in Automotive Electronics - Article Reprint
Manufacturers are increasingly designing products for ease of test.

文章 2016-02-02

PDF PDF 279 KB
Reference Solutions - A New Approach to Test and Measurement Provisioning - Article Reprint
This article describes the Keysight Reference Solution approach to providing application specific HW and SW test configurations.

文章 2016-01-18

PDF PDF 565 KB
Using a Wide-Band Tunable Laser for Optical Filter Measurements – Article
This article was published in NASA Tech Briefs hard copy and online, highlighting how to use a wide-band tunable laser for optical filter measurements.

文章 2016-01-18

PDF PDF 1.82 MB
2015 Global Digital Oscilloscopes Growth Award
Understand how Frost & Sullivan evaluates and decides on the winner for this award

文章 2016-01-05

PDF PDF 1.06 MB
Keysight Vectorless Test EP (VTEP) 与 Keysight TestJet 相比
Keysight Vectorless Test EP (VTEP) 与 Keysight TestJet 相比

案例分析 2015-12-22

PDF PDF 1 MB
边界扫描测试的缺陷范围:通过边界扫描测试意味着什么 ?
边界扫描测试的缺陷范围:通过边界扫描测试意味着什么 ?

文章 2015-12-22

PDF PDF 1 MB
测试范围:通过电路板测试时意味着什么?
测试范围:通过电路板测试时意味着什么?

文章 2015-12-22

PDF PDF 649 KB
Minimizing Design Risk, Shortening Development Time of a Digital Transmission System
Powerful design and simulation software provides valuable insights to help uncover and solve difficult design challenges at every stage of the design process.

案例分析 2015-12-15

PDF PDF 1.17 MB
IoT wireless sensors and the problem of short battery life
Electronic Product Design and Test, Dec 1, 2015 article

文章 2015-12-01

灵活的 5G 波形生成和分析测试台
在 LTE 和 LTE-Advanced 的部署仍然方兴未艾之时,对下一代无线网络的研究已经快速发展起来。

文章 2015-11-13

Effective Maintenance + Troubleshooting of Earth Stations, SatMagazine - Article Reprint
This SatMagazine article describes how Keysight's handheld combination analyzers (FieldFox) can replace the full set of instruments previously used by satellite maintainers in the field.

文章 2015-11-12

PDF PDF 829 KB
PXIe Measurement Accelerator Speeds RF Power Amplifier Test - Article Reprint
This article, reprinted with permission from Microwave Journal, describes the speed improvement provided by Keysight's M9451A PXIe Measurement Accelerator.

文章 2015-11-11

PDF PDF 1.63 MB
5G 空中接口需要信道测量
2015 年 10 月 31 日,在《EDN》上刊登了一篇由 Sheri DeTomasi 撰写的文章,其中讨论了如何表征无线信道,以此来了解新 5G 信号的传播方式,同时讲述了能够提供所需洞察力的系统。

文章 2015-10-31

Using Automatic Synthesis of RF, Microwave & Analog Circuits to Increase Design Productivity by 10x
Microwave Product Digest's October 2015 Featured Article written by How-Siang Yap of Keysight Technologies.

专访 2015-10-28

极大影响测试和测量的 5G 设置
2015 年 10 月 19 日《Canadian electronics》刊登了由 Roger Nichols 撰写的文章,其中讨论了在研究各种 5G 技术时遇到的测试挑战。

文章 2015-10-19

是德科技借助校准优化关键测量性能 - 再版文章
是德科技借助校准优化关键测量性能 - 再版文章

文章 2015-10-10

PDF PDF 2 MB
使用 ENA 系列网络分析仪执行无线功率传输效率测试
ENA 系列网络分析仪中的选件 006 无线功率传输分析软件能够实时进行无线功率传输效率测量。先进的 2D/3D 仿真特性可以显示负载阻抗的关系。

文章 2015-09-25

Keysight EEsof EDA makes it easy to get back to school—at least virtually
Rick Nelson, executive editor of Evaluation Engineering, visited Keysight Technologies and had this to say about Keysight EEsof EDA.

文章 2015-09-11

First 50 GHz Handheld Analyzer Speeds Field Work - Article Reprint
This MW Journal article reprint describes the new family of FieldFox analyzers - the industry's first 50 GHz handheld models, including how they can be effectively used in radar and satellite apps.

文章 2015-09-01

PDF PDF 1.24 MB
The Universal Flash Storage Association (UFSA)
UFSA

内部通讯 2015-08-18

IEEE 802.11ah: Wi-Fi below 1 GHz
EDN, August 17, 2015 article by Kevin Qian & Mingyan Wang explains the new IEEE 802.11ah technology for IoT and the test challenges.

文章 2015-08-17

模块化测试仪执行 5G 信道探测
5G 信道探测参考解决方案测试系统采用紧凑的仪器模块和多种软件包,能够生成和分析复杂的波形,用于表征 5G 无线通信信道。

文章 2015-08-04

Challenges extend from simulation to compliance
Tami Pippert, Keysight Technologies’ high-speed digital marketing program manager, elaborates on how Keysight is enhancing its model generation, simulation, and data analysis technologies.

文章 2015-07-08

Phase Noise, Amplitude and TOI Measurement Errors - Article Reprint
This article uses three key measurements to illustrate the need to periodically compare the performance of your instrument with the equipment's original data sheet specifications.

文章 2015-06-11

PDF PDF 675 KB
Phase Noise, Amplitude and TOI Measurement Errors - Article Reprint
This article uses three key measurements to illustrate the need to periodically compare the performance of your instrument with the equipment's original data sheet specifications.

文章 2015-06-11

PDF PDF 675 KB

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