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Ultra-wideband radar system design article in EE Times

Feature Story 2011-07-27

Accounting for Dynamic Behavior in FET Device Models
This application note shows that one of the easiest and most insightful ways of testing the large-signal high-frequency capabilities.

Article 2011-07-25

PDF PDF 593 KB
LTE-Advanced testing: What to expect
Even as the first deployments of LTE capture widespread public attention, the LTE standard is evolving. In December 2010, LTE-Advanced was introduced in Release 10 of the 3GPP specifications.

Article 2011-06-30

Integrated Solutions for Testing Wireless Communication Systems
IEEE Communications Magazine, Topics in Radio Communications article on SystemVue test solutions, June 2011.

Article 2011-06-02

PDF PDF 1.04 MB
Solutions for Nonlinear Characterization of High-Power Amplifiers - Article
The article was written by Keith Anderson and published in the Wireless Design magazine

Article 2011-05-02

The Coming of Age of the Software Communications Architecture
Microwave Jounral article reprint on Software Defined Radio (SDR) technology, development tools for complex waveforms and radio applications in aerospace/defense and commercial applications.

Article 2011-04-24

PDF PDF 1.61 MB
Multichannel scopes enable MIMO RF testing
This article discusses troubleshooting techniques with time-coherent multichannel scopes and 89600 VSA software to gain insight into error mechanisms affecting their hardware EVM performance and system-level RF transmitter performance budgets.

Article 2011-04-12

EE Times: Time-domain simulations of high-speed links with X parameters

Article 2011-03-29

The CTIA Wireless 2011 MIMO OTA Expert Forum
The ever increasing spectrum efficiency requirements of MIMO mobile devices in 4G networks challenge designers to implement multiple antennas into small form factor.

Article 2011-03-24

Tackling the Mixed-signal Testing Challenges of SDR
Software-defined radios (SDR) utilize a combination of FPGAs, DSPs and analog/RF designs to achieve the radio’s system performance.

Article 2011-03-09

Don't worry, be happy: Design, test, verification support for LTE-Advanced is here
Link to Agilent product review in the February 2011 EETimes.

Article 2011-02-14

In-Circuit Tester - N5747A High-Power Power Supply - Case Study
This paper discusses the first successful implementation of the Keysight N5747A high-power power supply on a customer product - a networking board project.

Case Study 2011-02-11

PDF PDF 1.12 MB
EE Times & Agilent Blog: Tradeoff: Dynamic range and bandwidth in signal analysis
Two different ways of looking at noise figure.

Article 2011-01-23

Education Program Newsletter - Vol 3. September 2008
Education Program Newsletter - Vol 3. September 2008

Newsletter 2011-01-12

Wideband Radar + SATCOM Measurements
Growing trends in SATCOM and radar systems in the A/D market.

Feature Story 2011-01-12

EE Times & Agilent Blog: The changing face of electronic test instrumentation
The changing face of electronic test instrumentation.

Article 2011-01-12

Partner article using ADS: Practical Fiber Weave Effect Modeling -- Lamsim Enterprises, Inc.
Partner article using ADS: Practical Fiber Weave Effect Modeling -- Lamsim Enterprises, Inc.

Article 2011-01-11

An Innovative and Integrated Approach to III-V Circuit Design
This article explains how to drive III-V circuit design improvement by unified modeling, Design of Experiments (DOE) simulation, and Pareto Analysis

Article 2011-01-10

PDF PDF 360 KB
GPETE Blog
Find hints and tips, industry trends, and new product announcements pertaining to the top five most commonly used test and measurement instruments.

Article 2010-12-16

Surviving State Disruptions Caused by Test: the "Lobotomy Problem"
This paper examines some issues and trends that justify adding features to IEEE 1149.1 that will facilitate safe, fast and effective initialization of a board or system, to get it ready for testing. Published with kind permission of the IEEE

Article 2010-12-10

PDF PDF 402 KB
Solutions for Undetected Shorts on IEEE 1149.1 Self-Monitoring Pins
This paper presents the problem of undetected shorts on IEEE 1149.1 compliant self-monitoring pins, and potential mitigating solutions.

Article 2010-12-10

PDF PDF 789 KB
Principal Component Analysis-Based Compensation for Measurement Errors
This paper examines some issues and trends that justify adding features to IEEE 1149.1 that will facilitate safe, fast and effective initialization of a board or system, to get it ready for testing. Published with kind permission of the IEEE

Article 2010-12-10

PDF PDF 1.10 MB
The Proposed IEEE Test Standards
There is a resurgence of interest in Boundary Scan and Built in Self Test (BIST) initiatives to be part of IEEE standards. This article explains the IEEE standard and their benefits to the industry. Agilent Boundary Scan, 1149.6, 1149.1, bead probes, cover-extend

Article 2010-10-20

PDF PDF 2.83 MB
AMI models: What, why and how?
EE Times Design Article written by Sanjeev Gupta, Jose Luis Pino and Amolak Badesha of Agilent EEsof EDA.

Article 2010-10-18

8PSK Modulation Accuracy Measurement Graphics

Feature Story 2010-10-12

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