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Morgan State Strives to Make Engineering Education More Accessible

Article 2013-05-27

This Lab Makes My Job Easy

Article 2013-05-27

Education Program Newsletter - Vol 2. June 2008
Education Program Newsletter - Vol 2. June 2008

Newsletter 2013-05-07

Electronic Manufacturing Test Support eNews - April 2013
Latest information to help you with ICT, 5DX and Automotive Electronics Functional Test Systems Support

Newsletter 2013-04-25

What is the difference between IEEE 802.11ac and 802.11ad?
Microwave & RF article, April 2013. The goal is for all IEEE 802.11 standards to be backward compatible and for 802.11ac and 802.11ad to be compatible at the medium-access-control (MAC) or data-link layer. They should differ only in physical-layer (PHY) characteristics. Read about how that goal is being attained.

Article 2013-04-23

Ensuring The Highest Quality Microwave Measurements - Article
High frequencies and stringent application specifications drives a number of critical challenges to be addressed in this article.

Article 2013-04-22

ESL Design Notebook Blog
The blog home of Electronic System-Level Design at Agilent highlighting applications, news, and opinions from a cross-discipline, system-level approach to design and verification in communications and defense.

Journal 2013-04-02

Incremental Redundancy in EGPRS
Incremental redundancy is implemented in EGPRS systems to achieve maximum efficiency in over-the-air interface... WirelessDesignMagazine.com article by Paul Mercy. Feb 2005. Acrobat PDF.

Article 2013-04-02

Enabling Simulation and Test of Custom OFDM Signals
Orthogonal frequency division multiplexing (OFDM) has become attractive for many current and emerging commercial applications because it provides a combination of data throughput, scalability, and robustness.

Article 2013-04-01

A Packaged 60 GHz Low-Power Transceiver with Integrated Antennas for Short-Range Communications
This paper describes a 60-GHz transceiver with integrated antennas for short range and low power wireless communications fabricated in a CMOS 65nm SOI technology.

Article 2013-03-25

PDF PDF 429 KB
Optimize Time Gating in Spectrum Analysis
Although various types of time gating exist, some applications are more appropriate for certain time-gating methods. Beyond making this determination, designers should know the latest techniques for gate triggering and measuring wide-bandwidth signals.

Article 2013-03-20

Turn Your Keysight Handheld Meter into a Data Logger - Case Study
Case study on how to turn Keysight Handheld Meter with U1177A IR-to-Bluetooth® adapter with an Android Phone or tablet PC into a Data Logger keywords: U1177A Bluetooth Adapter, Keysight Wireless Remote Connectivity Solution, bluetooth adapter, Handheld DMM, data logger

Case Study 2013-03-11

PDF PDF 898 KB
FEM Modeling of Gigahertz TEM Cells for Susceptibility Analysis of RFID Products
This paper presents a novel simulation methodology to model the coupling between a GTEM cell and an RF-ID antenna.

Article 2013-02-08

PDF PDF 796 KB
Automating Communications Measurement - Article
This article demonstrates how you can automate measurements, control instruments, develop GUI-based applications, and generate reports for the Agilent 33220A waveform generator using MATLAB software.

Article 2013-02-07

An Improved SDR FPGA Verification Methodology for Emerging OFDMA Waveforms - TechBriefs Article
An article on Improved SDR FPGA Verification Methodology for Emerging OFDMA Waveforms.

Article 2013-02-01

Designing Multiple-Throw Switches in a MMIC Configuration
A Chip Design article by P. Sreenivasa Rao, design flow verification expert at Agilent Technologies.

Article 2013-01-31

Electronic Manufacturing Test Support eNews - February 2013
Latest information to help you with ICT, 5DX and Automotive Electronics Functional Test Systems Support

Newsletter 2013-01-31

Agilent embraces GaN modeling in IC-CAP upgrade
EETimes Design Article highlights new capabilities in IC-CAP 2013.01.

Article 2013-01-09

Asahi Kaesei Microdevices Corporation Develops High-End, Low-Noise Process
AKM to develop the highest low-noise process by using Keysight's state of the art 1/f noise measurement system.

Case Study 2013-01-09

Ball Grid Array Joint Inspection Using X-ray as it relates to voids and the IPC-7095A specification
With the introduction of Lead-free solder, voiding within Ball Grid Array (BGA) joints is potentially a major issue. This article discusses the relationship to voiding, the IPC standard and Automated X-ray Inspection.

Feature Story 2012-12-06

PDF PDF 105 KB
Spectrum Analyzer CW Power Measurements and the Effects of Noise - Article
This paper examines how to configure a spectrum analyzer to measure a low-power continuous wave (CW) signal so that the trade-off between measurement time and accuracy is optimized.

Article 2012-12-01

PDF PDF 386 KB
EDN's 19th Annual Innovation Awards Finalists: Agilent's PNA-X NVNA

Article 2012-11-30

Future Device Modeling Trends
Modeling the nonlinear device (basic nonlinear component) for circuit and system simulation downstream.

Article 2012-11-28

PDF PDF 6.08 MB
Defining Your Calibration Requirement - White Paper
These are the steps that can be taken when actually placing an order to ensure you get a "proper" calibration.

Article 2012-11-08

PDF PDF 1.57 MB
The New Techniques Simplify Military Frequency-Converter Characterization - Article Reprint
This article is about a new technique that simplifies and reduces the cost of the measurement test set up.

Article 2012-11-01

PDF PDF 2.44 MB

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