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Materials Measurement: PCB Materials - Application Brief
This application brief provides the solutions for measuring PCB materials.

Application Note 2014-08-27

Radar Measurements - Application Note
This application note focuses on the fundamentals of measuring basic pulsed radars and measurements for more complex or modulated pulsed radar systems.

Application Note 2014-08-22

PDF PDF 7.81 MB
Solutions for Implementing Envelope Tracking in Power Amplifiers - Application Note
This “Solutions for Implementing Envelope Tracking in PAs” app note gives insight into fast and efficient configuration and test of ET systems from R&D to design verification and into production.

Application Note 2014-08-22

PDF PDF 2.80 MB
Quickly Identify Thermal Measurement Points For Data Acquisition - Application Brief
Temperature monitoring is a process that traditionally involves an amount of guess work. Learn how a thermal imaging camera can be used to quickly and easily identify temperature problem areas.

Application Note 2014-08-22

Uncertainty Propagation for Measurements with Multiple Output Quantities
Measurements with multiple output quantities exist in many disciplines. This paper discusses using matrix notation, which can be applied to a practical measurement uncertainty example involving complex quantities.

Analysis Tool 2014-08-20

PDF PDF 591 KB
Average Power Sensor Uncertainty Calculator Rev9
Average Power Sensor Uncertainty Calculator Rev9

Application Note 2014-08-19

XLS XLS 82 KB
Understanding Measurement Risk - White Paper
An intuitive explanation of probability density functions drawing on Monte Carlo simulation to demonstrate the relationship between a device's true values and corresponding measured value.

Application Note 2014-08-12

PDF PDF 735 KB
Solutions for LTE-Advanced Manufacturing Test - Application Note
This “Solutions for LTE-Advanced Manufacturing Test” application note gives insight into how to better understand the requirements for LTE-Advanced Carrier Aggregation manufacturing test.

Application Note 2014-08-04

Low-Cost DDR3 Decode and Analysis with the 16850 Series Portable Logic Analyzers - Application Note
See how to make low-cost measurements on DDR3 interfaces and conduct performance analysis/compliance tests to evaluate the memory systems during debug and validation of a digital prototype.

Application Note 2014-08-04

PDF PDF 2.52 MB
Materials Measurement: Liquid Materials - Application Brief
This application brief provides the solutions for measuring dielectric properties of liquid materials.

Application Note 2014-08-04

PDF PDF 1.24 MB
GaAs MMIC TWA Users Guide - Application Note
GaAs MMIC TWA Users Guide. This application note gives a technical overview of the TC700, TC702 and TC900 GaAs MMIC Traveling Wave Amplifiers (TWA).

Application Note 2014-08-04

PDF PDF 1.59 MB
Techniques for Precision Validation of Radar System Performance in the Field - Application Note
This application note provides an overview of field testing radar systems and Line Replaceable Units (LRU) using high-performance FieldFox combination analyzers.

Application Note 2014-08-04

Materials Measurement: Soil Materials - Application Brief
Soil materials such as rocks or clay also have electrical properties in addition to the mechanical properties as with other substances.

Application Note 2014-08-04

PDF PDF 925 KB
Evaluating Oscilloscope Sample Rates vs. Sampling Fidelity - Application Note
Make the most accurate digital measurements by learning how to evaluate oscilloscope sample rates vs. signal fidelity.

Application Note 2014-08-04

Spectrum Analysis and the Frequency Domain - Application Note
Spectrum Analysis and the Frequency Domain University Engineering Lab Series - Lab 2

Application Note 2014-08-04

PDF PDF 280 KB
Understanding and Applying Probability of Intercept In Real-Time Spectrum Analysis- Application Note
This document describes six major factors that determine the POI value and relative amplitude: sampling rate, time-record length, windowing function, window size, overlap processing, and noise floor.

Application Note 2014-08-04

PDF PDF 2.53 MB
Power-Consumption Measurements for LTE User Equipment - Application Note
This application note focuses on determining how certain parameters affect a specific smartphone's power consumption and figure out how to adjust the parameters to improve battery life.

Application Note 2014-08-04

PDF PDF 360 KB
Using Fine Resolution to Improve Thermal Images - Application Note
Fine Resolution effectively quadruples the resolution of the 160 x 120 pixels to 320 x 240 pixels. Fine Resolution is created through - multi-frame acquisition, super-position and reconstruction.

Application Note 2014-08-04

PDF PDF 645 KB
Using Microwave Switches When Testing High Speed Serial Digital Interfaces
Many high speed digital interfaces use multiple lanes to achieve their system's throughput requirements. Most issues associated with this can be resolved with a switching network.

Application Note 2014-08-03

Modifying DDR Libraries for Silicon Nail Test Generation on the Keysight x1149 Boundary Scan Analyzer
This application note describes how to modify DDR libraries to generate silicon nails tests on the Keysight x1149 Boundary Scan Analyzer.

Application Note 2014-08-03

PDF PDF 1.57 MB
Releasing the “Test Sequence” and “Test” to Production on the Keysight x1149 Boundary Scan Analyzer
This application note describes how to release test sequences and tests to production when using the Keysight x1149 Boundary Scan Analyzer.

Application Note 2014-08-03

PDF PDF 5.52 MB
Conquering the Multi Kilowatt Source/Sink Test Challenge - Application Note
This application note discusses how the Keysight APS N6900/N7900 DC power supplies feature integrated sourcing and sinking capability tailored for the test needs of today’s bidirectional and regenerative energy systems and devices.

Application Note 2014-08-03

External Triggering 2-Way Communication Frequency & Power Sweep Measurement - Application Brief
This demonstrates the capability of an N1911A/12A P-Series power meter to perform external triggering 1-way and 2-way communication frequency and power sweep measurements.

Application Note 2014-08-03

PDF PDF 272 KB
An Innovative Simulation Workflow for Debugging High-Speed Digital Designs Using Jitter Separation
This paper presents a new simulation workflow for jitter separation analysis.

Application Note 2014-08-03

Time-Saving Features in Economy Oscilloscopes Streamline Test - Application Note
Features like integrated function generators, large displays, fast update rates and mixed signal capabilities are now available in oscilloscopes to save valuable time in the design and debug process.

Application Note 2014-08-03

PDF PDF 3.13 MB

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