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Business Considerations of Equipment Refresh in a Calibration Laboratory by Richard Ogg
Calibration laboratories operate in a world of constant change, and this is never more evident than in the products that are requested to be calibrated.

Application Note 2014-08-01

Fundamentals of RF and Microwave Power Measurements (Part 3) (AN 1449-3)
Power Measurement Uncertainty per International Guides AN 1449-3, literature number 5988-9215EN

Application Note 2014-08-01

Oscilloscopes in Aerospace/Defense Debugging ARINC 429 Serial Buses - Flyer
Keysight’s InfiniiVision 3000 X-Series oscilloscopes provide ARINC 429 triggering and decoding, as well as eye-diagram mask test capability to help you debug your ARINC 429 buses faster.

Application Note 2014-08-01

Simulating High-Speed Serial Channels with IBIS-AMI Models
This paper reviews some of the benefits and limitations of using IBIS models and introduces the new AMI extensions to the latest IBIS version 5.0 specification.

Application Note 2014-08-01

Stressing 1 GbE Receivers on the Physcial Layer - Application Note
The optional 81150A and 81160A arbitrary bit-shape pattern generators allow designers to test in a minimum of time and at low cost the robustness of their devices with repeatable real-world signals.

Application Note 2014-08-01

Find the right switching solutions for your test and measurement needs
This application note will provide an overview of the types of microwave switches available and their performance capabilities to assist you in selecting the most appropriate switch.

Application Note 2014-08-01

PDF PDF 356 KB
Wideband Digital Pre-Distortion with Keysight SystemVue & PXI Modular Instrument - Application Note
Digital Pre-Distortion (DPD) is essential for wideband communications systems based on LTE-Advanced and 802.11ac. Overcome DPD challenges with trusted commercial measurement and modeling tools.

Application Note 2014-08-01

Troubleshooting VFDs with Low Pass Filter - Application Note
Technicians constantly face the challenge of obtaining accurate voltage and frequency measurement that tallies with the readings shown on the VFD control panel display. With Keysight’s handheld multimeter that is equipped with a switchable 1-kHz low pass filter, technicians do not need to guess the VFD output anymore

Application Note 2014-08-01

PDF PDF 1.74 MB
Time Sidelobe Measurements to see Performance of Compressed-Pulse Radars - Application Note
This application brief defines problems seen in measurements of compressed-pulse radars, describes the time sidelobe method, and outlines uses of this approach.

Application Note 2014-08-01

PDF PDF 445 KB
PWM Waveform Generation Using the U1252A Handheld Digital Multimeter - Application Note
This application note provides a brief overview of PWM and offers some ideas on how to use the U1252A handheld DMM to create the pulse width modulated signals.

Application Note 2014-08-01

PDF PDF 1.36 MB
Improving Radar Performance by Optimizing Overall Signal-to-Noise Ratio
Better noise-figure measurements enhance characterization of excess noise in receivers.

Application Note 2014-08-01

FlexRay Physical Layer Eye-diagram Mask Testing - Application Note
Keysight provides seven different FlexRay mask files based on FlexRay physical layer standards/specifications for use with InfiniiVision 5000, 6000, and 7000 Series oscilloscopes (DSO or MSO)from Agilent.

Application Note 2014-08-01

MIL-STD 1553 Eye-diagram Mask Testing – Application Note
Learn about how eye-diagram testing can be performed on differential MIL-STD 1553 signals using an oscilloscope.

Application Note 2014-08-01

PDF PDF 2.92 MB
Revisiting Mismatch Uncertainty with the Rayleigh Distribution - White Paper
This paper examines several important aspects of estimating mismatch uncertainty, which is often a major component of the total uncertainty for RF and microwave measurements.

Application Note 2014-08-01

PDF PDF 1.17 MB
Reducing Cost of Testing Prototypes with the Keysight Medalist i1000D In-Circuit
This case study challenges the conventional adoption of flying probers for board testing at the NPI stage, offering the Keysight Medalist i1000D as a viable option which can help save time and money.

Application Note 2014-08-01

FPGA Prototyping Using Keysight SystemVue
This application note describes a top-down FPGA design flow using SystemVue for rapid prototyping of physical layer communications signal processing.

Application Note 2014-08-01

State of the Art in EM Software for Microwave Engineers - White Paper
This article discusses the three most established EM simulation technologies: MoM, FEM, and FDTD, linking the simulation technology to solving specific applications.

Application Note 2014-07-31

Understanding and Using Offset in InfiniiMax Active Probes - Application Note
This application note explains how offset is applied in the Keysight InfiniiMax Active Probes and how to use offset for various applications

Application Note 2014-07-31

8 Hints for Making Better Measurements Using Analog RF Signal Generators - Application Note
This guide helps you improve the accuracy of your measurements that involve using RF analog signal sources.

Application Note 2014-07-31

Improving Test Throughput with ASRU Speedup feature on the Medalist i3070 Series 5
Keysight's Medalist i3070 Series 5 comes with a new Analog Stimulus Response Unit (ASRU N) Revision card along with software release 08.00p. The ASRU N card has enhanced ASRU speedup features to reduce unpowered analog test time.

Application Note 2014-07-31

PDF PDF 325 KB
Solving the Challenges of Solar Array Simulation - Application Note
Solving the Challenges of Solar Array Simulation defines the optimal power solution for satellite ground testing.

Application Note 2014-07-31

Properly Powering On and Off Multiple Power Inputs in Embedded Designs - Application Not
This is the first in a series of application notes that addresses power optimization, characterization and simulation challenges in embedded designs.

Application Note 2014-07-31

Characterizing the I-V Curve of Solar Cells and Modules
This measurement brief explores the various test and measurement tools you can use for I-V curve characterization and provides tips to help you choose the instrument or instruments that best fit your solar cell or module measurement needs.

Application Note 2014-07-31

Converting Tescon Point 70 Fixtures and Programs for use on the Medalist i1000D
This application describes how users can convert their hardware and software from the Tescon Point 70 platform to the Keysight Medalist i1000D platform to enjoy state-of-the-art in-circuit test technology .

Application Note 2014-07-31

PDF PDF 8.81 MB
3rd Order 1900MHz Low Noise Amplifier using Infineon SiGe BFP620 Transistor
This Application Note is based directly on a design documented in the Infineon’s AN 60. This detailed application information is provided in support of the “SiGe BFP620 Amp” e.g. shipped with the S/W.

Application Note 2014-07-31

PDF PDF 1.09 MB

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