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Accelerate Program Development with Command Expert with Microsoft(R) Visual Studio(R)
This application note describes how Command Expert with Microsoft Visual Studio can accelerate program development

Application Note 2014-08-02

PDF PDF 1.88 MB
Specifications Guidelines - White Paper
Keysight Technologies has definitions for its Test & Measurement product specifications and how they are presented. The following material is extracted from these manufacturing recommendations.

Application Note 2014-08-02

PDF PDF 366 KB
Using Command Expert with Microsoft Excel - Application Note
Keysight Command Expert is a FREE software tool that provides fast and easy instrument control in many PC application environments. This application note details the integration with Microsoft Excel.

Application Note 2014-08-02

PDF PDF 4.30 MB
Practical Application of the InfiniiSim Waveform Transformation Toolset - Application Note
This final paper puts together the concepts and theory already presented in the preceding papers. It presents and addresses five common problems that confront engineers.

Application Note 2014-08-02

Compatibility of USB Power Sensors with Keysight Instruments – Application Note
Application note on "Compatibility of USB Power Sensors with Keysight Instruments".

Application Note 2014-08-02

Simulating Envelope Tracking with Advanced Design System Software - Application Note
This example applies envelope tracking to an example amplifier to show techniques of using Advanced Design System (ADS) for this type of design.

Application Note 2014-08-02

PDF PDF 2.38 MB
Waveform Update Rate Determines Probability of Capturing Elusive Events - Application Note
See how you can increase your odds of finding infrequent glitches with a high oscilloscope update rate.

Application Note 2014-08-02

Virtual Flight Testing of Radar System Performance Using SystemVue and STK - White Paper
Keysight SystemVue and AGI STK can be integrated to provide virtual flight testing of radar and electronic warfare algorithms, saving both time and money.

Application Note 2014-08-02

Imaging Graphene via Low Voltage Field Emission Scanning Electron Microscopy - Application Note
Review of the excellent imagaing capabilities of low-voltage SEM for morphology invertigation of graphene

Application Note 2014-08-02

PDF PDF 692 KB
S-parameter Series: Transforming Oscilloscope Acquisitions for De-Embedding, Embedding & Simulating
This application note is the first in a series of s-parameter application notes and introduces us to signal acquisition and theory.

Application Note 2014-08-02

GS-8800 Conformance System Measurement Uncertainty - Application Note
This application note explains how measurement uncertainty (MU) affects GS-8800 system measurements and demonstrates how MU is derived for the conformance test system.

Application Note 2014-08-02

PDF PDF 209 KB
Using Oscilloscope Segmented Memory for Serial Bus Applications - Application Note
Learn how to use an oscilloscope's segmented memory to capture a longer time span and more serial packets while still digitizing at a high sample rate.

Application Note 2014-08-02

PDF PDF 4.04 MB
Achieve Accurate Resistance Measurements with the Keysight 34980A Multifunction Switch Measure Unit
This application note provides an overview of how to make an accurate 2-wire, 3-wire and 4-wire resistance measurements with the Keysight 34980A

Application Note 2014-08-02

Accelerate Program Development using Command Expert with MATLAB - Application Note
Command Expert is a free software tool that enables fast and easy instrument control from PC applications. This application note focuses on the integration with MATLAB.

Application Note 2014-08-02

PDF PDF 5.98 MB
SINAD measurements Using the Keysight U8903A Audio Analyzer - Application Note
This document covers the use of the Keysight U8903A audio analyzer in characterizing radio receiver sensitivity by means of measuring SINAD, an audio quality value that is usually used to specify the RF sensitivity.

Application Note 2014-08-02

PDF PDF 1.95 MB
Oscilloscopes in Education Training students how to effectively use scopes
The InfiniiVision 2000 & 3000 X-Series oscilloscopes can be configured with a built-in function generator and education training kit to help EE students learn how to use an oscilloscope effectively

Application Note 2014-08-02

Reducing Cost of Testing Prototypes with the Keysight Medalist i1000D In-Circuit
This case study challenges the conventional adoption of flying probers for board testing at the NPI stage, offering the Keysight Medalist i1000D as a viable option which can help save time and money.

Application Note 2014-08-01

Using Gamma, S-Parameter Correction, and Real Time Measurement Uncertainty (RTMU) - Application Note
This application note explain how gamma/s-parameter correction used to correct for the mismatch error between the sensor and DUT, and how real time MU new calculation implementation.

Application Note 2014-08-01

PDF PDF 2.65 MB
Oscilloscopes in Aerospace/Defense Debugging ARINC 429 Serial Buses - Flyer
Keysight’s InfiniiVision 3000 X-Series oscilloscopes provide ARINC 429 triggering and decoding, as well as eye-diagram mask test capability to help you debug your ARINC 429 buses faster.

Application Note 2014-08-01

Simulating High-Speed Serial Channels with IBIS-AMI Models
This paper reviews some of the benefits and limitations of using IBIS models and introduces the new AMI extensions to the latest IBIS version 5.0 specification.

Application Note 2014-08-01

Wideband Digital Pre-Distortion with Keysight SystemVue & PXI Modular Instrument - Application Note
Digital Pre-Distortion (DPD) is essential for wideband communications systems based on LTE-Advanced and 802.11ac. Overcome DPD challenges with trusted commercial measurement and modeling tools.

Application Note 2014-08-01

Uncertainty Analysis for Uncorrelated Input Quantities - White Paper
The Guide to the Expression of Uncertainty in Measurement (GUM) has been widely adopted in the different fields of the industry and science. Learn how to use for uncorrelated input quantities.

Application Note 2014-08-01

PDF PDF 1.64 MB
FlexRay Physical Layer Eye-diagram Mask Testing - Application Note
Keysight provides seven different FlexRay mask files based on FlexRay physical layer standards/specifications for use with InfiniiVision 5000, 6000, and 7000 Series oscilloscopes (DSO or MSO)from Agilent.

Application Note 2014-08-01

Fundamentals of RF and Microwave Power Measurements (Part 3) (AN 1449-3)
Power Measurement Uncertainty per International Guides AN 1449-3, literature number 5988-9215EN

Application Note 2014-08-01

Revisiting Mismatch Uncertainty with the Rayleigh Distribution - White Paper
This paper examines several important aspects of estimating mismatch uncertainty, which is often a major component of the total uncertainty for RF and microwave measurements.

Application Note 2014-08-01

PDF PDF 1.17 MB

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