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CX3300 Series Device Current Waveform Analyzer - Application Note
This application describes CX3300 enabling you to easily and accurately visualize never before seen true transient current waveform of NVM materials and devices.

Application Note 2016-08-23

Educational Overview of RF Power Measurement and Applications - Application Note
RF power measurement is the basic for the study of RF & microwave theories. Understand how RF power meter and sensor works and its applications from the educational perspectives.

Application Note 2016-08-22

PDF PDF 4.39 MB
Overcoming RF & MW Interference Challenges in the Field - Application Note
This application note discusses practical strategies to overcome RF and microwave interference challenges in the field using real-time spectrum analysis (RTSA).

Application Note 2016-08-19

PDF PDF 3.14 MB
NB-IoT System Modeling: Simple Doesn’t Mean Easy
This paper presents a method for modeling and evaluating a new Narrowband Internet of Things (NB-IoT) system in a combined multi-domain simulation environment.

Application Note 2016-08-12

PDF PDF 1023 KB
Using BenchVue Test Flow to Create Test Sequences without Programming - Application Note
This document explains some of the many things you can do with the BenchVue Test Flow app, such as create sequences of setups and measurements --all without having to write a computer program.

Application Note 2016-08-11

PDF PDF 3.77 MB
Overcoming Test Challenges of USB Type-C - Application Note
This application note provides an introduction to the USB Type-C connector, the interface functions it provides, and test implications engineers face when integrating the connector into their designs.

Application Note 2016-08-10

PDF PDF 3.19 MB
IoT’s insights - poster
IoT’s insights poster. If you want to order a hardcopy: Order a hardcopy

Application Note 2016-08-03

PDF PDF 5.75 MB
Latest wireless standards - poster
Latest wireless standards poster. If you want to order a hardcopy: Order a hardcopy

Application Note 2016-08-03

PDF PDF 5.86 MB
Understanding LTE-Advanced Base Station Transmitter RF Conformance Testing - Application Note
This application note focuses on LTE-A basestation transmitter testing using the 3GPP RF conformance tests. Examples provided with MXA Signal Analyzer, multi-touch and the LTE-A measurement app.

Application Note 2016-07-19

PDF PDF 4.51 MB
Power Supply Control Loop Response (Bode Plot) Measurements - Application Note
Unique to Keysight’s portfolio of measurements are frequency response measurements including Control Loop Response (Bode) and can be performed using InfiniiVision X-Series oscilloscopes.

Application Note 2016-07-15

Scanning Microwave Microscopy Solutions for Quantitative Semiconductor Device Characterization
Discussion of Scanning Microwave combined with Atomic Force Microscopy for calibrated measurements for Semiconductor devices

Application Note 2016-07-15

PDF PDF 3.31 MB
Power Supply Rejection Ratio (PSRR) Measurements - Application Note
Power Supply Rejection Ratio (PSRR) measurements for power supply characterization, unique to Keysight’s portfolio of measurements, can be performed using InfiniiVision X-Series oscilloscopes.

Application Note 2016-07-15

Maximizing Battery Life of IoT Smart Devices with Keysight Solutions - Application Brief
This application brief details the design and test challenges involved with maximizing the battery life of Internet of Things (IoT) smart devices, and recommends Keysight solutions to address them.

Application Note 2016-07-14

PDF PDF 732 KB
A Simple Software Solution for Porosity Analysis of Shale Specimens - Application Note
High throughput shale analysis procedure including high resolution imaging of ion milled shale samples using a compact field emission SEM and a quick software analysis for 2D porosity measurement.

Application Note 2016-07-13

PDF PDF 1.64 MB
Solving Test Challenges for Internet of Things-Enabled Consumer Electronics Devices
The Internet of Things is a key enabler of the smart home, and brings with it unique challenges for designers and manufacturers. Keysight has a complete portfolio to address the test challenges.

Application Note 2016-06-30

Tips for Preventing Damage to Communication Test Set - Application Brief
Popular Keysight models: E5515A/B/C/T

Application Note 2016-06-29

Simulating FPGA Power Integrity Using S-Parameter Models
This application note describes how self-impedance (frequency) can easily be determined by simulating the frequency domain self-impedance profile of a Power Distribution Network (PDN).

Application Note 2016-06-28

Jitter: Measurements and Instrument Solutions - Application Note
This application note discusses jitter measurements at high data rates, issues impacting measurement accuracy, and looks at the instrument choices available for observing and analyzing jitter.

Application Note 2016-06-27

PDF PDF 1.17 MB
Separating and Time-Correlating Deterministic Jitter Components - Application Note
Contains “tips and tricks” on how to employ real-time oscilloscopes with jitter analysis and high-speed pulse/pattern generators to separate and time-correlate specific deterministic jitter components

Application Note 2016-06-23

PDF PDF 582 KB
Jitter Fundamentals: Sources, Types, and Characteristics - Application Note
Effectively diminish its effects jitter by understanding the types, causes, component characteristics, and measurement vantage points.

Application Note 2016-06-22

PDF PDF 784 KB
Implementing a Flexible Testbed for 5G Waveform Generation and Analysis - Application Note
This application describes a flexible 5G testbed that includes proven, off-the-shelf software and hardware; and also examines the challenges in design and test of 5G technology.

Application Note 2016-06-14

Making Your Best Switch Mode Power Supply Measurements - Application Note
Oscilloscope power measurement options provide a quick and easy way to analyze the reliability and efficiency of switching power supplies.

Application Note 2016-06-14

Solutions for Measuring Permittivity and Permeability w/LCR Meters & Impedance Analyzers
This application note presents the technologies and methods for measuring permittivity and permeability. The document focuses on impedance measurement technology with the following advantages: Wide frequency range from 20Hz to 1GHz High measurement accuracy Simple preparations (fabrication of material, measurement setup) for measurement.

Application Note 2016-06-12

Discover How the Intuitive Multi-touch UI Streamlines Complex Measurements
Six application briefs demonstrate the latest techniques using X-Series signal analyzers with multi-touch

Application Note 2016-06-08

Kelvin Force Microscopy Using the 9500 AFM - Application Brief
Discussion on KFM mode using the 9500AFM and QuickScan

Application Note 2016-06-07

PDF PDF 1.75 MB

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