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3D FEM simulations of a scanning microwave microscope cantilever for imaging at the nanoscale
APPLIED PHYSICS LETTERS 103, 213106 (2013) - A theoretical analysis and numerical validation of a calibration algorithm for scanning microwave microscopy (SMM) imaging at the nanoscale.

Application Note 2013-11-19

Increase Power Amplifier Test Throughput with the Keysight M9381A PXIe Vector Signal Generator
An application note with programming instructions on how to accelerate power amplifier test throughput with the fast Keysight M9381A PXIe Vector Signal Generator and achieve cost reductions in test while maintaining high test quality.

Application Note 2013-11-19

What is the difference between an equivalent time and a real-time oscilloscope? - Application Note
This document will discuss how each type of oscilloscope samples the incoming waveform and explain the trigger requirements.

Application Note 2013-11-18

Correlating Microwave Measurements between Handheld and Benchtop Analyzers - Application Note
This application note discusses the powerful capabilities of modern-day handheld analyzers and includes measurement comparisons between FieldFox handheld analyzers and several benchtop instruments.

Application Note 2013-11-17

Correlating Microwave Measurements between Handheld and Benchtop Analyzers - Application Note
This application note discusses the powerful capabilities of modern-day handheld analyzers and includes measurement comparisons between FieldFox handheld analyzers and several benchtop instruments.

Application Note 2013-11-17

Increase Multi-Antenna Array Test Throughput with the Keysight M9703A AXIe Digitizer - Application Br
Accelerate test throughput for phased array antennas while providing increased bandwidth for advanced future test requirements beyond single-tone measurements.

Application Note 2013-11-15

Creating Multi-Emitter Signal Scenarios with COTS Software and Instrumentation – Solution Brief
Describes a key problem, describes a commercial, off-the-shelf (COTS) solution for signal generation and analysis, and presents two example scenarios.

Application Note 2013-11-12

PDF PDF 1017 KB
Millimeter Wave Technology and Test Instrumentation for V-E Band Applications - Application Brief
This paper illustrates the challenges when testing RF and micro-Wave devices and offers test and measurements solution proposals to do this effectively.

Application Note 2013-11-07

PDF PDF 1.92 MB
AXIe and PXI Modular Test Solution for Multiband SATCOM Monitoring - Application Note
This application overview will show how to simplify multiple satellite band monitoring and analysis using the Keysight AXIe M9703A high-speed digitizer, N5183A LO, and 89601B VSA software.

Application Note 2013-11-07

PDF PDF 1.16 MB
Modifying DDR Libraries for Silicon Nail Test Generation on the Keysight x1149 Boundary Scan Analyzer
This application note describes how to modify DDR libraries to generate silicon nails tests on the Keysight x1149 Boundary Scan Analyzer.

Application Note 2013-11-07

PDF PDF 382 KB
Simplifying Complex Benchtop Measurements with USB Switches - Application Note
This application note provides a brief overview of switching topologies before outlining three measurement scenarios that include the U1810B USB switch.

Application Note 2013-11-06

PDF PDF 953 KB
PXI Interoperability-How to Achieve Multi-Vendor Interoperability in PXI Systems - Application Note
The purpose of this application note is to impart confidence through knowledge, discussions,and demonstrations of smooth implementations amd coexistence of PXI HW, SW and related tools

Application Note 2013-11-05

PDF PDF 3.47 MB
CSM and DCM-Express Nanoindentation Mapping on Lithium.Polymer Battery Composites
investigattion of the the mechanical properties of a lithium rechargeable battery cathode by using both the classic XP CSM and the new DCM Express Test method.

Application Note 2013-11-05

PDF PDF 427 KB
Contact Deformation of LiNbO3 Single Crystal:Dislocations, Twins and Ferroelectric Domains
A Study of a combined nanoindentation and AFM investigation showing that twinning and dislocation motion are two major deformation mechanisms under contact loading in periodically poled (0001) LiNbO3.

Application Note 2013-11-01

PDF PDF 752 KB
Calibration and Specification Considerations When Using Modular Instrumentation - Application Note
Modular instruments such as PXI and AXIe offer significant configuration flexibility, interchangeability, speed, and size advantages but also present unique calibration challenges. This paper examines these issues in detail and considers both in situ calibration and calibration performed outside the use environment.

Application Note 2013-11-01

PDF PDF 312 KB
Determining Critical Stresses in Semiconductors: Using ZnO Crystal & GaN Freestanding Film
A study of the nanoindenter G200 used to perform spherical nanoindentation experiments on ZnO single crystal and GaN freestanding film.

Application Note 2013-10-30

PDF PDF 363 KB
TC611 GaAs Detector Diode Sensitivity Measurements - Application Note
This publication presents detector voltage measurements, compared to the deviation from linearity (referenced to -40 dBm).

Application Note 2013-10-29

PDF PDF 380 KB
Problem with Subtype Learning When Used with the Connector Algorithm in R7.0
5DX Technical Paper - Problem with Subtype Learning When Used with the Connector Algorithm in R7.0

Application Note 2013-10-29

PDF PDF 16 KB
Considerations in Making Small Signal Measurements - Application Brief
The increasing demand for battery-powered mobile devices and energy-efficient green products has triggered a rising demand for a scope measurement solution that can measure the small signals.

Application Note 2013-10-29

PDF PDF 841 KB
Accelerate Development of Next Generation 802.11ac Wireless LAN Transmitters-Overview – App Brief
This application note overview describes how to accelerate the development of next generation 802.11ac wireless LAN transmitters.

Application Note 2013-10-29

FET Switch Speed and Settling Time - Application Note
This publication describes the occurrence and some of the possible solutions for “slowtails” FET switch behavior.

Application Note 2013-10-29

PDF PDF 141 KB
Eight Hints for Better Scope Probing - Application Note
In this application note, you will find eight useful hints for selecting the right probe for your application and for making your oscilloscope probing better.

Application Note 2013-10-28

Differentiating Surface Mechanical Properties with Dynamic Lateral Force Microscopy-Application Note

Application Note 2013-10-26

PDF PDF 331 KB
Multi-Channel Audio Test using the Keysight U8903A Audio Analyzer - Application Note
Learn to use the U8903A audio analyzer, together with a 34970A/34972A data acquisition (DAQ) switch unit and a 34904A 4x8 switch matrix plug in module to increase your overall production needs.

Application Note 2013-10-25

Beam Lead Attachment Methods - Application Note
This application note gives the first time user a general description of various attachment methods for beam lead devices.

Application Note 2013-10-25

PDF PDF 437 KB

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