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Physical Layer Testing of the USB 2.0 Serial Bus - Application Note
This application note discussed measurement requirements for the USB 2.0 serial bus and how both Keysight’s 6000 X-Series and Infiniium Series oscilloscopes address those challenges.

Application Note 2014-04-11

Oscilloscope Measurement Tools to Help Debug Automotive Serial Buses Faster - Application Note
Keysight's InfiniiVision Series oscilloscopes offer some unique measurement capabilities for debugging and characterizing the physical layer of automotive serial buses.

Application Note 2014-04-09

PDF PDF 3.49 MB
Download latest J-BERT M8020A application notes to master your designs
Submit the form to begin downloading the application briefs

Application Note 2014-04-09

Signal generation enables cost-effective testing

Application Note 2014-04-07

Oscilloscope Mask Testing for Six Sigma Quality Standards - Application Note
Learn about the QA process and Six Sigma efficiency, and explore the benefits mask testing brings to the QA process for electronic signals and achieving Six Sigma quality in as little as 1.1 seconds.

Application Note 2014-04-03

Essentials of Coherent Optical Data Transmission - Application Note
The Application Note explains how complex modulated optical signals can maximize bit transfer efficiency in fiber optical data transmission.

Application Note 2014-04-02

PDF PDF 3.03 MB
Solutions for WLAN 802.11ac Manufacturing Test - Application Note
This “Solutions for WLAN 802.11ac Manufacturing Test” app note gives insight into testing 802.11ac client and infrastructure devices using fast, flexible, cost-effective calibration and non-signaling.

Application Note 2014-04-02

Techniques for Time Domain Measurements - Application Note
This application note will introduce time domain and DTF measurement techniques for identifying the location and relative amplitudes of discontinuities while operating in the field.

Application Note 2014-03-26

Testing Automotive Fuse Boxes with i1000D SFP In-Circuit Test System - Application Note
The i1000D small footprint in-circuit tester provides excellent test coverage for automotive fuse boxes, which contain vital connections to a vehicle's various electrical systems.

Application Note 2014-03-26

Average Power Sensor Measurement Uncertainty Calculator - Application Note
Measurement Uncertainty Calculator for the Average Power Sensors (N8481A, N8482A, N8485A, N8481A-CFT, N8482A-CFT, N8485A-CFT, 8481D, 8485D, 8487D, R8486D, Q8486D, E4412A, E4413A, E9300A, E9301A, E9304A, E9300B, E9301B, E9300H, E9301H)

Application Note 2014-03-25

XLS XLS 82 KB
Testplan Development on CVI Labwindows with TS-5400 PXI Series - Application Note
This application note provides set-up guidelines to start developing your testplan on CVI Labwindows using the Keysight U8972A TS-5400 PXI Series functional test system.

Application Note 2014-03-25

PDF PDF 5.09 MB
Preventive Maintenance Test with Insulation Resistance Test - Application Note
This application note describes factors that affect insulation resistance, various insulation resistance test methods, and provides guidelines for selecting the appropriate test for the application.

Application Note 2014-03-20

Method of Implementation(MOI) for MIPI M-PHY Interface S-Parameter and Impedance Conformance Tests
Keysight Method of Implementation (MOI) for MIPI M-PHY Interface S-Parameter and Impedance Conformance Tests Using Keysight E5071C ENA Network Analyzer Option TDR

Application Note 2014-03-20

PDF PDF 978 KB
Layout of Calibration Certificates And Measurement Reports - Application Note
Keysight has recently instituted some minor changes on calibration certificates. This lit piece explains the rationale for these changes.

Application Note 2014-03-20

PDF PDF 473 KB
Techniques for Precision Validation of Radar System Performance in the Field - Application Note
This application note provides an overview of field testing radar systems and Line Replaceable Units (LRU) using high-performance FieldFox combination analyzers.

Application Note 2014-03-18

Techniques for Precise Power Measurements in the Field - Application Note
This application note will discuss techniques for measuring average and peak power and the associated equipment options available for field testing.

Application Note 2014-03-18

Using ADS to Investigate Optimal Performance of a Cree FET
This application note documents a workspace that shows how to apply ADS load pull simulations to attain optimal performance of a Cree FET.

Application Note 2014-03-17

Automotive Serial Bus Testing - Application Note
This application note will show examples of characterizing the performance of various automotive serial buses using Keysight oscilloscopes and provide a summary of recommended probing solutions.

Application Note 2014-03-17

Pulsed Carrier Phase Noise Measurements - Application Note
This application note discusses basic fundamentals for making pulsed carrier phase noise measurements.

Application Note 2014-03-13

PDF PDF 1.97 MB
Jitter Analysis Using Keysight's InfiniiVision 6000 X-Series and Infiniium Series - Application Note
A discussion of various display formats used to view jitter including horizontal waveform histograms, TIE histograms, TIE trend waveforms, and jitter spectrum waveforms.

Application Note 2014-03-12

Envelope Tracking and Digital Pre-Distortion PA Testing for LTE User Terminal Components - App Note
This application note discusses measurement solutions for power amplifier testing using Envelope Tracking (ET) and lookup table (LUT)-based DPD.

Application Note 2014-03-07

PDF PDF 3.73 MB
Generating Looped Test Patterns or PRBS Signals with a Preamble - Application Note
This paper explains how to setup a test pattern with a preamble, which is played once e. g. to bring the tested device into a test mode, and the test data, played several times to test for errors.

Application Note 2014-03-04

PDF PDF 1.10 MB
Characterizing Hi-speed USB 2.0 Serial Buses in Embedded Designs - Application Note
Learn about probing the hi-speed USB 2.0 serial bus and see some unique debugging tools and capabilities that can help you get your embedded designs to market faster.

Application Note 2014-03-03

CAN Eye-Diagram Mask Testing - Application Note
InfiniiVision X-Series scopes can trigger, decode, and perform eye-diagram mask test measurements on differential CAN bus signals, as well as perform analysis on other serial bus standards.

Application Note 2014-03-03

PDF PDF 2.63 MB
Simulating Signals with the Highest Integrity – Application Brief
Learn how Trueform waveform generators allow you to accurately represent your signals without the weaknesses of DDS with this 4-page application brief.

Application Note 2014-02-28

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