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Drive Down the Cost of Test Using the ENA Series of Network Analyzers - Application Note
In this application note, we discuss the contributions of Keysight Technologies, Inc.’s ENA Series of Vector Network Analyzers (ENA, hereafter) to drive down the cost of test in production lines.

應用手冊 2014-10-11

PDF PDF 731 KB
Method of Implementation (MOI) for HEAC Cable Assembly Test
Method of Implementation (MOI) for HEAC Cable Assembly Test Using Keysight E5071C ENA Network Analyzer Option TDR.

應用手冊 2014-10-10

PDF PDF 1.93 MB
Precise Evaluation of Input,Output, and Reverse Transfer Capacitances of Power Devices - White Paper
Accurate characterization of power device capacitance parameter becomes important for power circuit design. This paper introduces a solution to characterize Ciss, Coss, Crss and Rg automatically.

應用手冊 2014-10-10

PDF PDF 2.49 MB
Overcome Your Test Challenges with the 33600A Series Trueform Waveform Generators - Application Note
Compendium of six 33600A Series Trueform waveform generator test challenge application briefs.

應用手冊 2014-10-02

PDF PDF 4.02 MB
Analysis of a transmission mode scanning microwave microscope for subsurface imaging at nanoscale
APPLIED PHYSICS LETTERS 105, 133112 (2014) - EMPro is used to characterize a SMM, a tool for calibrated capacitance measurements and dopant profiling in the semiconductor industry, as well as for many other diverse applications in biology, medicine and materials science.

應用手冊 2014-10-02

Be More Efficient Designing and Using your Arbitrary Waveforms – Application Brief
Learn how Trueform generators can help you reuse, re-sort or trigger your arb waveforms to build a whole new signal with this 4-page application brief.

應用手冊 2014-10-02

Creating a Differential Signal with a Waveform Generator – Application Brief
Learn how Trueform waveform generators can be used to help you create differential signals, while also reducing your development cost with this 4-page application brief.

應用手冊 2014-10-02

Measuring High Impedance Sources Using the U8903B Audio Analyzer - Application Note
Considerations for measuring high impedance sources. A method of using an impedance matching attenuator to overcome high impedance measurement problems is described. Methods for aligning matching attenuator and compensating for its loss are shown alongside the ease with which frequency response measurements can be made.

應用手冊 2014-09-30

PDF PDF 937 KB
Keysight Method of Implementation (MOI) for USB2.0 Cable-Connector Assembly Compliance Test
Keysight Method of Implementation (MOI) for USB2.0 Cable-Connector Assembly Compliance Test Using Keysight E5071C ENA Network Analyzer Option TDR

應用手冊 2014-09-24

PDF PDF 2.34 MB
Solutions for RF Power Amplifier Test - Application Note
This “Solutions for RF Power Amplifier Test” app note gives insight into making faster, repeatable RF power amplifier tests with envelope tracking and digital pre-distortion.

應用手冊 2014-09-23

PDF PDF 1.79 MB
Get app notes for digital multilevel signalizing techniques and high-speed coherent optical -AppNote
Get app notes for digital multilevel signalizing techniques and high-speed coherent optical

應用手冊 2014-09-22

Electronic Warfare Signal Generation: Technologies and Methods - Application Note
This application note summarizes the available technological approaches for EW signal and environment simulation, and the latest progress in flexible, high-fidelity solutions.

應用手冊 2014-09-16

PDF PDF 545 KB
Achieving Fast and Accurate Multi-Channel Power Measurements Over a Wide Dynamic Range for Wireless
This application note explains how to obtain a wide power measurement range on the lower power level. This is important for chipsets designed to handle a wider power range to support higher data throughput and wider coverage area

應用手冊 2014-09-09

PDF PDF 1.35 MB
Making Fast Pass/Fail Testing with Keysight N9320B Spectrum Analyzer - Application Note
This application note describes the advanced window limit feature in the N9320B spectrum analyzer and demonstrates how to use it to easily make the Pass/Fail determination on measurement results.

應用手冊 2014-09-08

PDF PDF 1.55 MB
Automatic Audio Test for Design Verification and Production using the Keysight U8903B Audio Analyzer
U8903B’s Test Sequence Application (TSA) function provides an easy way for automatic audio test. Users are not required to familiar with any PC language or programming tools.

應用手冊 2014-09-05

PDF PDF 830 KB
Keysight Tips to Prevent Unnecessary Repairs
Brief document to prevent instrument damage and avoid unnecessary repairs with techniques on proper grounding, cable and connector care, electro discharge precautions, transit instructions and more.

應用手冊 2014-09-04

PDF PDF 197 KB
Assurance of Calibration Results: Applying the Power of Visual Information to Improve Quality
Application note on how Keysight maintains the ongoing reliability and validity of our calibration processes to help you mitigate the risks inherent in your measurements by using control charts.

應用手冊 2014-09-04

PDF PDF 254 KB
Understanding the SystemVue To ADS Simulation Bridge - Application Note
This application note shows how RF designers using Advanced Design System (ADS), as well as system architects and DSP developers using SystemVue, can co-simulate for greater functionality and cross-platform debug and verification.

應用手冊 2014-08-31

PDF PDF 1.95 MB
SINAD measurements Using the Keysight U8903A Audio Analyzer - Application Note
This document covers the use of the Keysight U8903A audio analyzer in characterizing radio receiver sensitivity by means of measuring SINAD, an audio quality value that is usually used to specify the RF sensitivity.

應用手冊 2014-08-31

PDF PDF 1.95 MB
Connecting Data Acquisition Systems to a Wireless Network - Application Brief
Learn how you can configure and take advantage of the latest router technology with either the 34972A DAQ system or any LXI instrument.

應用手冊 2014-08-30

PDF PDF 659 KB
Keysight Technologies Method of Implementation (MOI) for BroadR-Reach Link Segment Test
Keysight Technologies Method of Implementation (MOI) for BroadR-Reach Link Segment Test Using ENA Option TDR

應用手冊 2014-08-28

PDF PDF 1.99 MB
Designing Automated Tests Using Powerful Digital Acquisition Systems - Application Brief
Learn how the 34970A/34972A DAQ system offers the versatility and powerful functionality you need to solve your most pressing test challenges.

應用手冊 2014-08-27

PDF PDF 351 KB
Materials Measurement: PCB Materials - Application Brief
This application brief provides the solutions for measuring PCB materials.

應用手冊 2014-08-27

Radar Measurements - Application Note
This application note focuses on the fundamentals of measuring basic pulsed radars and measurements for more complex or modulated pulsed radar systems.

應用手冊 2014-08-22

PDF PDF 7.81 MB
Quickly Identify Thermal Measurement Points For Data Acquisition - Application Brief
Temperature monitoring is a process that traditionally involves an amount of guess work. Learn how a thermal imaging camera can be used to quickly and easily identify temperature problem areas.

應用手冊 2014-08-22

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