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Electronic Measurement

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101-125 of 2802

Solutions for Millimeter Wave Wireless Backhaul - Application Note
This “Solutions for Millimeter Wave Wireless Backhaul” app note gives insight into designing and testing E-band backhaul using effective network analysis, and signal generation and analysis solutions.

Application Note 2014-02-14

U2020 X-Series USB Sensor Uncertainty Calculator - Application Note
Measurement Uncertainty Calculator for U2020 X-Series.

Application Note 2014-02-14

U2000 and U8480 Series USB sensor measurement uncertainty calculator
Measurement Uncertainty Calculator for the U2000 series USB sensors (U2000A, U2001A, U2002A, U2004A, U2000B, U2000H, U2001B, U2001H, U2002H) and U8480 series USB sensors (U8481A, U8485A, U8487A, U8488A)

Application Note 2014-02-14

Using Fast-Sweep Techniques to Accelerate Spur Searches - Application Note
New advances in signal processing provide improvements in sweep speeds by implementing a new type of digital RBW filter in X-Series signal analyzers. This application note focuses on these new improvements.

Application Note 2014-02-11

Using a Waveform Generator to Generate a Pseudo Random Binary Sequence (PRBS) Signal – App Brief
PRBS signals are commonly used to test networks. Trueform waveform generators can easily generate CCITT standard PRBS signals. With less than 1 ps of jitter, see why Trueform is the ideal answer for your test needs with this 4-page application brief.

Application Note 2014-02-11

IV Characterizations of Solar Cells Using the Keysight B2900A Series of SMUs - Technical Overview
The Keysight B2900A Series Precision SMU allows you to accurately and quickly make characterization of photovoltaic cells with its intuitive GUI and free PC-based application software.

Application Note 2014-02-10

Download the latest AWG Application Notes
Here you can download free application notes for new Arbitrary Waveform Generators (AWGs)

Application Note 2014-02-10

Mechanical Properties Measurement on Individual Composite Micro-fibers - Application Note
Study of characterization of mechanical properties of bicomponent micro-fibers, consisting of nylon 6 nano-islands in a PET sea, under tensile loading.

Application Note 2014-02-07

On-Wafer SOLT Calibration Using 4-port PNA-L Network Analyzers - Application Note
This documentation is intended for on-wafer applications using the 4-port, 20 GHz, PNA-L network analyzer with two dual probes to achieve full 4-port on-wafer calibrations manually. This application note provides the step-by-step instructions needed to set up a calibration kit in order to perform a 4-port SOLT (Short-Open-Load-Thru) calibration using only three thrus.

Application Note 2014-02-06

EMC Compliance Testing: Improve Throughput with Time Domain Scanning - Application Note
This application note provides an overview of time domain scan, the test scenarios in which it provides the greatest time savings, and trade-offs between speed and overload protection.

Application Note 2014-01-30

Generating radar pulses with maximum bandwidth – Application Brief
This app brief presents compression methods for the M8190A that provide suitably wide bandwidths applications: idle insertion, digital upconversion and DSP-based modification ensuring long playtime.

Application Note 2014-01-29

Performing a Precision ADC Evaluation Using a Low Noise DC Source - Application Note
This 6-page application note introduces the Keysight B2962A 6.5 Digit Low Noise Power Source which is suitable for the application requiring low noise power supply such as ADC Evaluation.

Application Note 2014-01-28

Ultra-Low Noise Filter Minimizes B2961A/62A Power Source Noise Density - Application Brief
This 2-page Application Brief introduces N1294A-021 Ultra Low Noise Filter which is suitable for the application requiring low noise power supply such as the evaluation of A/D Converter, Oscillator, Amplifiers.

Application Note 2014-01-27

Why Migrate from HP/Keysight 432A/B to Keysight N432A Thermistor Power Meter? – Application Note
Seven Reasons to Migrate from 432A/B to N432A Thermistor Power Meter.

Application Note 2014-01-24

Low Noise Filter Improves B2961A/62A Power Source Noise Performance - Application Brief
This 2-page application brief introduces N1294A-022 Low Noise Filter which enables the B2961A/62A to source clean voltage equivalent to that of much costlier precision linear voltage/current source instruments.

Application Note 2014-01-24

High Precision Time Domain Reflectometry - Application Note
Time domain reflectometry (TDR) is a well-established technique for verifying the impedance and quality of signal pats in components, interconnects, and transmission lines.

Application Note 2014-01-23

Techniques for Precise Cable and Antenna Measurements in the Field - Application Note
This app note introduces measurement and calibration techniques for cable and antenna testing using FieldFox handheld analyzers.

Application Note 2014-01-22

PCI Express® 1.0 Protocol Test - Application Note
Protocol Analyzer and Exerciser for PCI Express

Application Note 2014-01-20

Compatibility of USB Power Sensors with Keysight Instruments - Application Note
Applciation note on "Compatibility of USB Power Sensors with Keysight Instruments".

Application Note 2014-01-16

Techniques for Precise Power Measurements in the Field - Application Note
This application note will discuss techniques for measuring average and peak power and the associated equipment options available for field testing.

Application Note 2014-01-06

Network Analyzer Application Note List and Application Matrix
This provides the list of application notes related with solution and application.

Application Note 2013-12-31

Solutions for LTE-Advanced Manufacturing Test - Application Note
This “Solutions for LTE-Advanced Manufacturing Test” application note gives insight into how to better understand the requirements for LTE-Advanced Carrier Aggregation manufacturing test.

Application Note 2013-12-18

Mapping the Mechanical Properties of SAC 305 Solder with Express Test - Application Note
The note discusses the use of nano-indentation to map the mechanical properties of a SAC 305 solder joint, because electronic reliability depends on mechanical integrity. Traditional nano-indentation testing time for such mapping, would have been prohibitively long but with the Express Test we were able to generate quantitative and highly resolved hardness maps in about an hour.

Application Note 2013-12-18

Addressing Your Power Test Challenges with VersaPower Architecture - Application Note
This paper discusses the structure of VersaPower power architecture and explores how it can help overcome the toughest power test challenges.

Application Note 2013-12-12

The Handling and Bonding of Beam Lead Devices Made Easy - Application Note
Beam Lead Device handling and protection (from electrostatic discharge) is presented in this publication from 1981.

Application Note 2013-12-09


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