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Electronic Measurement

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Oscilloscope Measurement Tools to Help Debug Automotive Serial Buses Faster - Application Note
Keysight's InfiniiVision Series oscilloscopes offer some unique measurement capabilities for debugging and characterizing the physical layer of automotive serial buses.

Application Note 2015-08-01

Keysight One Source Solutions
Consolidate your laboratory calibration services with a single trusted partner for all your electrical, physical, dimensional and optical instruments, regardless of manufacturer.

Application Note 2015-04-16

Shopfloor Operation of the Keysight i1000 In-Circuit Test Software - Application Note
This application note helps developers of the shopfloor client to fully understand the format and behavior of the i1000 software files to enable communication between the i1000 and the client.

Application Note 2015-04-16

PDF PDF 1.24 MB
A Flexible Test Solution for 2.4 GHz ZigBee Transmitter and Receiver - Application Note
This application note explains a low cost measurement solution for 2.4 GHz ZigBee O-QPSK signal generation for receiver test and signal analysis for transmitter test

Application Note 2015-04-14

PDF PDF 2.72 MB
Why Magnification is Irrelevant in Modern Scanning Electron Microscopes - Application Note
A detailed explanation on the relative importance of magnification in Field Emission Scanning Electron Microscopy

Application Note 2015-04-10

PDF PDF 2.90 MB
Using a Compact Low Voltage FE-SEM in Evaluating Materials Nano-Porosity - Application Note

Application Note 2015-04-10

PDF PDF 2.99 MB
A Flexible Test Solution for Internet of things (IoT) devices with ASK/FSK Modulation - App Note
Use Keysight’s basic RF instruments to measure and analyze ASK/FSK modulated signals commonly used in a variety of products and systems, ranging from personal consumer electronics and automatic meter reading, to giant industrial devices.

Application Note 2015-04-09

Measure Cable and Antenna Using the N9322C Basic Spectrum Analyzer (BSA) - Application Note
The N9322C supports to measure characteristics of antenna, RFID tags, or RF Tx modules, such as their return loss, insertion loss, and VSWR with a tracking generator and reflection measurement.

Application Note 2015-04-09

De-Emphasis Application Note
The N4916A de-emphasis signal converter, an industry-first, enables engineers to accurately characterize multi-gigabit serial receivers and channels that operate with de-emphasized signals.

Application Note 2015-04-08

PDF PDF 4.41 MB
Potential of Low Voltage Scanning Electron Microscopy Use in Archaeology/History of Art - App Note

Application Note 2015-04-08

PDF PDF 6.94 MB
Keysight Method of Implementation (MOI) for 100BASE-TX Ethernet Cable Tests
Keysight Method of Implementation (MOI) for 100BASE-TX Cable Tests Using Keysight E5071C ENA Option TDR

Application Note 2015-04-07

PDF PDF 2.12 MB
100 Gb/s Ethernet 100GBASE-CR4 Test Points and Test Fixtures - Application Note
This application note provides a detailed technical overview of 100GBASE-CR4 test point specifications and test fixtures to implement testing of physical media signals at the MDI and cable assemblies.

Application Note 2015-04-01

PDF PDF 1.71 MB
Testing New-Generation WLAN 802.11ac - Application Note
This application note introduces the new WLAN new-generation testing technology of 802.11ac and the many different Keysight solutions for testing WLAN 802.11ac.

Application Note 2015-04-01

PDF PDF 3.37 MB
Techniques for Precise Interference Measurements in the Field - Application Note
This app note discusses the different types of interference in current and new systems and methods to measure a variety of interference types using spectrum analyzers such the FieldFox Series.

Application Note 2015-03-30

Using Microprobing, Modeling and Error Correction to Optimize Channel Design - Application Note
This application note will discuss step-by-step channel analysis methodologies using microprobing measurements with simulation and modeling tools to show accurate results to 20 GHz.

Application Note 2015-03-27

PDF PDF 1.08 MB
Power Supply Control Loop Response (Bode Plot) Measurements - Application Note
Unique to Keysight’s portfolio of measurements are frequency response measurements including Control Loop Response (Bode) and can be performed using InfiniiVision X-Series oscilloscopes.

Application Note 2015-03-26

PDF PDF 1.87 MB
Characterization of PCB Insertion Loss with a New Calibration Method - Application Note
In this application note a new method for characterizing PCB loss by using AFR with 1X Open fixtures is proposed.

Application Note 2015-03-26

PDF PDF 700 KB
Power Supply Rejection Ratio (PSRR) Measurements - Application Note
Power Supply Rejection Ratio (PSRR) measurements for power supply characterization, unique to Keysight’s portfolio of measurements, can be performed using InfiniiVision X-Series oscilloscopes.

Application Note 2015-03-24

PDF PDF 1.52 MB
Automated X-Ray Inspection System Keysight Technologies - Technical Overview
This is a technical datasheet. Keysight has developed a sealed ultra-high vacumn X-ray tube that provides stable output throughout a significantly long life.

Application Note 2015-03-24

PDF PDF 644 KB
Performing LTE & LTE-Advanced RF Measurements with E7515A UXM Wireless Test Set - Application Note
This application note provides insights into example test procedures for RF testing of LTE and LTE-A UEs based on 3GPP TS 36.521-1 V12.2.0 (2014-06).

Application Note 2015-03-24

PDF PDF 9.75 MB
Achieving Higher Measurement Accuracy & Better Correlation for PCB Impedance Test - Application Note
Traditional method for PCB impedance measurements is difficult to meet accuracy required today. Measurement with full calibration is introduced to meet accuracy for the latest PCB impedance test.

Application Note 2015-03-24

PDF PDF 1.49 MB
Oscilloscopes in Aerospace/Defense Debugging MIL-STD 1553 serial buses - Brochure
Keysight's InfiniiVision 3000 X-Series oscilloscopes provide MIL-STD 1553 triggering and decoding, as well as eye-diagram mask test capability to help you debug your MIL-STD 1553 buses faster.

Application Note 2015-03-23

Atomic Force Microscopy Studies in Various Environments - Application Note
Overview of using the environmental chamber with water, humidity and gaseous vapors in Polymer research

Application Note 2015-03-23

PDF PDF 5.80 MB
Combining Atomic Force Microscopy with Scanning Electrochemical Microscopy - Application Note
Application note discussing the combined AFM-SECM approach with bifunctional probe provides topographical and correlated electrochemical information with high spatial and temporal resolution, thereby enabling the transformation of scanning probe microscopic techniques into multifunctional devices.

Application Note 2015-03-22

PDF PDF 1.02 MB
Solid State Switches - Application Note
This application note describes basic switch technology and the different types of Keysight switches. It summarizes the typical performance data of solid-state versus electro-mechanical switches – the two mainstream switch technologies in use today. A basic solid state switch overview which illustrates the theory of operation will give you the in-depth information you need to select the right switch technology for your application.

Application Note 2015-03-17

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