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Increasing Reliability and Efficiency in Power Converter Designs Part 4 - Application Note
This application note part 4 is the final in the series, and will provide insight into increasing reliability and efficiency in next-generation power converter designs.

Application Note 2017-09-14

PDF PDF 1.30 MB
Increasing Reliability and Efficiency in Power Converter Designs Part 3 - Application Note
This application note part 3 will provide insight into increasing reliability and efficiency in next-generation power converter designs.

Application Note 2017-09-14

PDF PDF 1.15 MB
Increasing Reliability and Efficiency in Power Converter Designs Part 1 - Application Note
This application note will provide insight into increasing reliability and efficiency in next-generation power converter designs.

Application Note 2017-09-14

PDF PDF 1.64 MB
Increasing Reliability and Efficiency in Power Converter Designs Part 2 - Application Note
This application note part 2 will provide insight into increasing reliability and efficiency in next-generation power converter designs.

Application Note 2017-09-14

PDF PDF 885 KB
Average Power Sensor Measurement Uncertainty Calculator - Application Note
Measurement Uncertainty Calculator for the Average Power Sensors (N8481A, N8482A, N8485A, N8481A-CFT, N8482A-CFT, N8485A-CFT, 8481D, 8485D, 8487D, R8486D, Q8486D, E4412A, E4413A, E9300A, E9301A, E9304A, E9300B, E9301B, E9300H, E9301H)

Application Note 2017-09-08

XLS XLS 78 KB
E-series Peak Power Sensor Measurement Uncertainty Calculator - Application Note
Measurement Uncertainty Calculator for the E-series Peak Power Sensors (E9321A, E9322A, E9323A, E9325A, E9326A, E9327A)

Application Note 2017-09-08

XLS XLS 96 KB
Network Analysis Basics - Applying Error Correction To Network Analyzer Measurements (AN 1287-3)
Only perfect test equipment would not need correction. Imperfections exist in even the finest test equipment and cause less than ideal measurement results.

Application Note 2017-09-07

U2020/40 X-Series USB Sensor Uncertainty Calculator - Application Note
Measurement Uncertainty Calculator for U2020 X-Series.

Application Note 2017-09-07

XLS XLS 31 KB
Understanding the Fundamental Principles of Vector Network Analysis - Application Note 1287-1
This application note explores the fundamental principles of vector network analysis. The discussion includes the common parameters (S-parameters). RF fundamentals such as transmission lines and the Smith chart will also be reviewed.

Application Note 2017-09-07

U2000 and U8480 Series USB sensor measurement uncertainty calculator
Measurement Uncertainty Calculator for the U2000 series USB sensors (U2000A, U2001A, U2002A, U2004A, U2000B, U2000H, U2001B, U2001H, U2002H) and U8480 series USB sensors (U8481A, U8485A, U8487A, U8488A)

Application Note 2017-09-07

XLS XLS 131 KB
Fundamentals of RF and Microwave Noise Figure Measurements - Application Note
This 32-page, black-and-white application note providesinformation on RF and Microwave noise figure measurementts. Topics include noise figure and temperature, noise characteristics of two-port networks, and the measurement of noise figure.

Application Note 2017-09-06

Getting Better Measurements on the Go with a FieldFox Handheld Analyzer - Application Note
This application note provides tips to help you make more accurate measurements in the field for cable, antenna, network analysis and spectrum analysis applications.

Application Note 2017-09-05

Power Conversion Efficiency Measurement Methods - Application Note
In today’s energy-conscious world, engineers must reduce product power consumption and improve overall product efficiency. Accurate measurement of power conversion efficiency is paramount for reducing energy consumption.

Application Note 2017-09-05

PDF PDF 2.16 MB
Coherent Optical Communications Test Challenges - Application Note
This Application Note focuses on the test and troubleshooting of next-generation fiber-based communication systems tasked with supporting 100 Gb/s, 400 Gb/s data rates and higher.

Application Note 2017-08-31

PDF PDF 1.70 MB
Signal Generator Spectral Purity - Application Note
This application note describes spectral purity and its components. The importance of high spectral purity is explained using industry applications.

Application Note 2017-08-30

PDF PDF 893 KB
How Auto-Parallel Capability Extends the Range of Your Bench Power Supply - Application Brief
This brief provides a step by step guide to using the built-in auto-parallel mode of the E36300 to provide a higher output current power supply.

Application Note 2017-08-29

PDF PDF 364 KB
End-to-End System-Level Simulations with Repeaters for PCIe® Gen4: A How-To Guide
DesignCon 2017 - The paper describes how to quickly and effectively evaluate the end-to-end link performance of a PCI-Express Gen-4 link involving a Root Complex, a Repeater, and an End Point.

Application Note 2017-08-28

PDF PDF 1.44 MB
Importing a MATLAB Waveform into Genesys
This application note shows you the quick and easy process of importing a MATLAB waveform into Genesys.

Application Note 2017-08-25

PDF PDF 1.04 MB
AC Voltage Measurement Errors in Digital Multimeters (AN 1389-3)
This application note is the third in a series of three, that will help you eliminate potential measurement errors and achieve the greatest accuracy with a DMM. This application note covers ac voltage measurement errors. For an overview of system cabling errors and dc voltage measurement errors, see Application Note 1389-1. For a discussion of resistance, dc current, ac current and frequency and period measurement errors, see Application Note 1389-2.

Application Note 2017-08-24

Wideband Electrostatic Force Microscopy (EFM): Broad Frequency Range with High Sensitivity -App Note
Wideband electrostatic force microscopy that extends the available EFM frequency range from the kHz to the GHz range as well as the measuring capabilities, which works in tapping or lift mode therefore reduces the tip wear and sample modifications.

Application Note 2017-08-21

PDF PDF 598 KB
Imaging with self-sensing cantilever on Keysight 5500/5600LS Atomic Force Microscopes - App Note
In this collaborative work, a brief technical background of self-sensing cantilevers and the developed Convert Unit for Keysight 5500/560LS AFM systems is introduced.

Application Note 2017-08-21

PDF PDF 5.16 MB
Brittle-to-Ductile Plasticity Transition Behavior Study of Si by High-Temperature Nanoindentation
Nanomechanical response of single crystal silicon at various temperatures were studied using elevated temperature nanoindentation with Keysight G200 laser heater system.

Application Note 2017-08-21

PDF PDF 657 KB
Adopting Fast Imaging in Atomic Force Microscopy - Application Note
Fast imaging with Keysight 9500 AFM Quick Scan on multiple samples to demonstrate its capabilities for routine sample measurements with extremely improved productivity, as well as to provide the examples of visualization of several dynamic processes in different vapor environments.

Application Note 2017-08-18

PDF PDF 4.22 MB
Battery Temperature Profiling While Charging and Discharging - Application Note
Temperature profiling is crucial as the charging and discharging rate of battery-powered devices inadvertently heats up the batteries. Here are ways to perform this task efficiently and effectively.

Application Note 2017-08-17

8 Hints for Making Bettter Measurements Using RF Signal Generators - Application Note
This application note provides 8 hints for improving the accuracy of your measurements using RF signal generators.

Application Note 2017-08-17

PDF PDF 8.64 MB

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