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Materials Measurement: Phantoms - Application Brief
This application brief provides the solutions for measuring Phantom materials that are used in wireless and medical industries.

Application Note 2014-07-17

PDF PDF 824 KB
Selecting Best Device for Power Circuit Design Through Gate Charge Characterization - White Paper
The gate charge (Qg) parameter becomes more important for reducing power loss of devices working under high frequency switching. This article proposes a new and innovative Qg measurement technique.

Application Note 2014-07-03

PDF PDF 343 KB
Quickly Validate Designs for DOCSIS 3.1 Compliance - Application Brief
This “DOCSIS 3.1 Test Solution" app brief gives insight into Keysight solutions that can be used for testing DOCSIS 3.1 transmitters, receivers and components.

Application Note 2014-06-24

E4990A Impedance Analyzer Migration Guide from 4294A
This migration guide describes the difference between the E4990A and 4294A impedance analyzers.

Application Note 2014-06-15

PDF PDF 40 KB
Introduction to the FieldFox RF Analyzer - Application Note
Introduction to the FieldFox RF Analyzer University Engineering Lab Series - Lab 1

Application Note 2014-06-13

PDF PDF 205 KB
Measuring Stress-Strain Curves for Shale Rock by Dynamic Instrumented Indentation - Application Note
Study of Dynamic instrumented indentation as an ideal way to measure the mechanical properties of shale rock. Note includes samples that can be just a few millimeters in extent, and shows that ion-milling is an adequate method of surface preparation. The note proves that test forces greater than 300mN, the primary results (reduced modulus and hardness) are accurate, repeatable, and relevant.

Application Note 2014-06-02

PDF PDF 1.59 MB
Solutions for Measuring Permittivity and Permeability w/LCR Meters & Impedance Analyzers
This application note presents the technologies and methods for measuring permittivity and permeability. The document focuses on impedance measurement technology with the following advantages: Wide frequency range from 20Hz to 1GHz High measurement accuracy Simple preparations (fabrication of material, measurement setup) for measurement.

Application Note 2014-05-28

Internal Gate Resistance Measurement Using the Agilent B1505A - Application Note
This application note explains how to measure power device internal gate resistance using the B1505A and also shows an actual example measurement.

Application Note 2014-05-27

PDF PDF 246 KB
IGBT Sense Emitter Current Measurement Using the Agilent B1505A - Application Note
This application note introduces how the sense emitter current, emitter current and built-in temperature sensor current/voltage of IGBT can be measured simultaneously by using the B1505A.

Application Note 2014-05-27

PDF PDF 201 KB
Thyristor Characterization Using the Agilent B1505A - Application Note
This application note provides an overview of thyristor electrical characterization using the B1505A.

Application Note 2014-05-19

PDF PDF 347 KB
Noise Figure Uncertainty Calculator
The noise figure uncertainty calculator has been created to aid your design work, from components through to systems, helping you meet the continued demand for higher system performance.

Analysis Tool 2014-05-19

Basics of Measuring the Dielectric Properties of Materials - Application Note
The dielectric properties that will be discussed here are permittivity and permeability. Resistivity is another material property which will not be discussed here.

Application Note 2014-05-16

OFDMA Introduction and Overview for Aerospace and Defense Applications - Application Note
Provides a brief introduction to the concepts of OFDM and OFDMA, with an eye toward the special considerations and environments for A/D applications.

Application Note 2014-05-15

PDF PDF 1.56 MB
Offline vs Inline: Shifting to automated inline ICT - White Paper
This paper discusses the benefits of adopting an inline in-circuit test strategy for electronics manufacturers looking to increase product quality and reliability while ensuring optimal ROIC.

Application Note 2014-05-14

Combining Atomic Force Microscopy with Scanning Electrochemical Microscopy - Application Note

Application Note 2014-05-07

PDF PDF 1.44 MB
Introduction to SECM and Combined AFM-SECM - Application Note

Application Note 2014-05-07

PDF PDF 962 KB
ARINC 429 Mask Files and Application Note
ARINC 429 mask files and an application note that describes how to use them with Keysight InfiniiVision oscilloscopes.

Analysis Tool 2014-04-30

ZIP ZIP 2.05 MB
MIL-STD-1553 Mask Files and Application Note
MIL-STD-1553 mask files and an application note that describes how to use them with Keysight InfiniiVision oscilloscopes.

Analysis Tool 2014-04-30

ZIP ZIP 1.58 MB
Increase Power Amplifier Test Throughput with the Keysight PXIe Vector Signal Analyzer and Generator
This application note overview provides an overview of the challenges and recommended solutions to increase the speed of power amplifier test.

Application Note 2014-04-30

FieldFox Applications
Every piece of gear in your kit had to prove its worth. Measuring up and earning a spot is the driving idea behind FieldFox. It’s equipped to handle routine maintenance, in-depth analysis and anything in between.

Application Note 2014-04-29

Finding the Cause of an Infrequent Glitch Using the InfiniiVision 6000 X-Series - Application Note
This application note is a supplement to “Finding the coupling signal that causes the glitch”a built-in and automatic demonstration on the Keysight InfiniiVision 6000 X-series.

Application Note 2014-04-29

PDF PDF 1.92 MB
Characterizing CAN Bus Arbitration - Application note
This app note will explain the CAN non-destructive bit-wise arbitration process. The InfiniiVision 4000 and 6000 X-Series oscilloscopes show examples of triggering and decoding those messages.

Application Note 2014-04-28

PDF PDF 1.23 MB
New Investigations into Energy: Keysight Nanomeasurement Systems - Application Note
The data presented demonstrates just a few of the ways in which the latest atomic force microscopy (AFM), nanoindentation, and field-emission scanning electron microscope can be utilized to enhance energy-related materials research.

Application Note 2014-04-24

PDF PDF 3.67 MB
Evaluating Oscilloscope Bandwidths for Your Application - Application Note
How much bandwidth does your oscilloscope really need? Learn how to choose the correct bandwidth oscilloscope for your application.

Application Note 2014-04-23

High-Speed Broadband Spectroscopy Measurements Advance Molecular Research - Application Note
This application note describes how Keysight’s data conversion technology enables highly accurate rotational spectroscopy for the generation of a precise library of reference spectra.

Application Note 2014-04-23

PDF PDF 1.71 MB

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