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A Cost-effective Way to Test Sub 1-GHz Wireless Modules - Application Note
This app note describes a Keysight low cost RF test solution that addresses the sub 1-GHz wireless test needs.

Notes d’application 2015-10-22

PDF PDF 1.35 MB
Achieving Accurate RF and Microwave Power Measurements for Satellite Thermal Vacuum Test – App Note
This application note explains how the new TVAC power sensor offers a simplified test setup with more accurate and reliable microwave power measurements for TVAC test of satellite equipment.

Notes d’application 2015-10-21

PDF PDF 1.28 MB
Programming Keysight Technologies Continuous-Sweep Tunable Lasers - Application Note
This is a new Application Note for Programming Keysight Continuous-Sweep Tunable Lasers

Notes d’application 2015-10-19

Using BenchVue Software’s Test Flow Application to Characterize Transistors - Application Note
This application note shows how to make a simple transistor curve tracer using a Keysight B2962A power source along with a Test Flow sequence running in Keysight’s BenchVue software.

Notes d’application 2015-10-15

Explore Keysight Services: Trade In
Trade In. Trade up. Lower your costs.

Notes d’application 2015-10-14

Achieve High-Quality Compliance Test Results Using A Top-Quality Test Fixture - Application Note
To achieve the best test results for a high-speed serial bus, you need a top-quality test fixture such as the Keysight N7015A high-speed Type-C test fixture with high signal integrity.

Notes d’application 2015-10-14

Explore Keysight Services: Premium Used
Lower your costs and refresh your technology with Premium Used. Like New. For Less. 100% Keysight Quality.

Notes d’application 2015-10-14

Explore Keysight Services: Technology Refresh
Extend, migrate, or modernize test assets with Technology Refresh

Notes d’application 2015-10-14

Oscilloscope Waveform Update Rate Determines Ability to Capture Elusive Events - Application Note
See how you can increase your odds of finding infrequent glitches with a high oscilloscope update rate.

Notes d’application 2015-10-13

FFT and Pulsed RF Measurements with 3000T X-Series Oscilloscopes - Application Note
Explore how FFT math functions and spectral views on a 3000T X-Series oscilloscope help to bring digital and RF designs to market.

Notes d’application 2015-10-07

Switching Solutions for Multi-Lane BERT Testing - Application Note
This application note addresses the use of switching solutions, degradations that might be encountered, and the methods to overcome them.

Notes d’application 2015-10-07

Characterizing MEMS Magneto-Impedance Sensor using the Keysight Impedance Analyzer
This application note describes the benefits of using Agilent impedance analyzers for device characterization of MEMS Magneto-Impedance (MI) sensors and how they improve design and test efficiency while offering a wide variety of design-automation tools and functions.

Notes d’application 2015-10-05

Evaluating Oscilloscope Vertical Noise Characteristics - Application Note
Measurement system noise will degrade your actual signal measurement accuracy, especially when you are measuring low-level signals and noise. Since oscilloscopes are broadband measurement instruments, the higher the bandwidth of the scope, the higher the vertical noise will be – in most situations.

Notes d’application 2015-10-05

Defining a Channel-Sounding Measurement System for Characterization of 5G Air Interfaces
This application note provided insight into defining a channel-sounding measurement system for characterization of 5G air interfaces through a variety of measurement methods.

Notes d’application 2015-10-05

Solutions for RF Power Amplifier Test - Application Note
This “Solutions for RF Power Amplifier Test” app note gives insight into making faster, repeatable RF power amplifier tests with envelope tracking and digital pre-distortion.

Notes d’application 2015-09-30

A Cost-effective Way to Test Bluetooth® Modules on Smart Devices - Application Note
This application note introduces the cost-effective Bluetooth test solution based on N9320B/N9322C BSA which offers an alternative solution for small to device manufacturers

Notes d’application 2015-09-28

Triggering on Infrequent Anomalies and Complex Signals using Zone Trigger - Application Note
Learn how Keysight's exclusive Zone touch trigger helps you trigger on infrequent anomalies and complex signals with ease.

Notes d’application 2015-09-28

Increase Power Amplifier Test Throughput with the Keysight PXIe Vector Signal Analyzer and Generator
This application note overview provides an overview of the challenges and recommended solutions to increase the speed of power amplifier test.

Notes d’application 2015-09-27

Adding a Calibration Definition File to the 86100D DCA-X to Support TDR/TDT Calibration Using Probes
This application note contains background information on what a cal kit definition file is, as well as the steps needed to convert a .ckt cal kit file to a properly formatted .xkt cal kit file.

Notes d’application 2015-09-25

PDF PDF 1.41 MB
Compatibility of USB Power Sensors with Keysight Instruments – Application Note
Application note on "Compatibility of USB Power Sensors with Keysight Instruments".

Notes d’application 2015-09-25

An RF Power Measurement Solution for Multi-antenna MIMO Transmissions - Application Note
In this paper, new RF power measurement solution for EN 300 328 v1.8.1 & EN 301 893 v.1.7.1 requirements will be discussed using Agilent USB Peak Power Sensor & USB Modular Data Acquisition.

Notes d’application 2015-09-25

Evaluating Adaptive Fast USB Battery Charging of Mobile Devices - Application Note
To offset greater power consumption, today’s mobile devices are now incorporating larger batteries; and the consequences are it takes longer to recharge due to the marginal power delivery of USB.

Notes d’application 2015-09-16

Testing Voice Over LTE (VoLTE) Phones - Application Note
This application note explains a solution for testing voice over LTE (VoLTE) phones that is well-suited for LTE mobile phone developers, test engineers, and test lab personnel.

Notes d’application 2015-09-14

PDF PDF 4.46 MB
Calculating Measurement Uncertainty using Digital Multimeter Ratio Measurement Techniques
This paper compares three DMM ratio measurement techniques for determining the traceable value and measurement uncertainty of an unknown input.

Notes d’application 2015-09-04

PDF PDF 761 KB
Top Five Reasons Why U2040 X-Series Power Sensors Are Ideal For Wireless Chipset Manufacturing Tests
This application brief details the top five reasons why the U2040 X-Series wide dynamic range power sensors are the ideal solution for wireless chipset manufacturing tests

Notes d’application 2015-09-03

PDF PDF 372 KB

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