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Properly Powering On and Off Multiple Power Inputs in Embedded Designs - Application Not
This is the first in a series of application notes that addresses power optimization, characterization and simulation challenges in embedded designs.

Notes d’application 2014-07-31

Materials Measurement: Phantoms - Application Brief
This application brief provides the solutions for measuring Phantom materials that are used in wireless and medical industries.

Notes d’application 2014-07-17

PDF PDF 824 KB
Materials Measurement: Magnetic Materials - Application Brief
This application brief provides the solutions for measuring magnetic materials.

Notes d’application 2014-07-17

PDF PDF 1.08 MB
Materials Measurement: Dielectric Materials - Application Brief
This application brief provides the solutions for measuring dielectric materials.

Notes d’application 2014-07-17

PDF PDF 935 KB
Selecting Best Device for Power Circuit Design Through Gate Charge Characterization - White Paper
The gate charge (Qg) parameter becomes more important for reducing power loss of devices working under high frequency switching. This article proposes a new and innovative Qg measurement technique.

Notes d’application 2014-07-03

PDF PDF 343 KB
M9018A PXIe Chassis Power Calculator
Allows you to enter ambient air temperature, AC supply voltage, etc. and calculates the total power available to the chassis modules.

Outil d'analyse 2014-07-01

Quickly Validate Designs for DOCSIS 3.1 Compliance - Application Brief
This “DOCSIS 3.1 Test Solution" app brief gives insight into Keysight solutions that can be used for testing DOCSIS 3.1 transmitters, receivers and components.

Notes d’application 2014-06-24

Evaluation of Bearing Materials Using Nano-Scale Wear Testing - Application Note
This is a study of miniature ball bearings made of steel, polytetrafluoroethylene (PTFE) reinforced with graphite, and polyether ether ketone (PEEK) are evaluated by means of nano-indentation and nano- wear testing

Notes d’application 2014-06-20

PDF PDF 1.08 MB
E4990A Impedance Analyzer Migration Guide from 4294A
This migration guide describes the difference between the E4990A and 4294A impedance analyzers.

Notes d’application 2014-06-15

PDF PDF 40 KB
Introduction to the FieldFox RF Analyzer - Application Note
Introduction to the FieldFox RF Analyzer University Engineering Lab Series - Lab 1

Notes d’application 2014-06-13

PDF PDF 205 KB
Internal Gate Resistance Measurement Using the Agilent B1505A - Application Note
This application note explains how to measure power device internal gate resistance using the B1505A and also shows an actual example measurement.

Notes d’application 2014-05-27

PDF PDF 246 KB
IGBT Sense Emitter Current Measurement Using the Agilent B1505A - Application Note
This application note introduces how the sense emitter current, emitter current and built-in temperature sensor current/voltage of IGBT can be measured simultaneously by using the B1505A.

Notes d’application 2014-05-27

PDF PDF 201 KB
Thyristor Characterization Using the Agilent B1505A - Application Note
This application note provides an overview of thyristor electrical characterization using the B1505A.

Notes d’application 2014-05-19

PDF PDF 347 KB
Noise Figure Uncertainty Calculator
The noise figure uncertainty calculator has been created to aid your design work, from components through to systems, helping you meet the continued demand for higher system performance.

Outil d'analyse 2014-05-19

OFDMA Introduction and Overview for Aerospace and Defense Applications - Application Note
Provides a brief introduction to the concepts of OFDM and OFDMA, with an eye toward the special considerations and environments for A/D applications.

Notes d’application 2014-05-15

PDF PDF 1.56 MB
Offline vs Inline: Shifting to automated inline ICT - White Paper
This paper discusses the benefits of adopting an inline in-circuit test strategy for electronics manufacturers looking to increase product quality and reliability while ensuring optimal ROIC.

Notes d’application 2014-05-14

Increase Power Amplifier Test Throughput with the Keysight PXIe Vector Signal Analyzer and Generator
This application note overview provides an overview of the challenges and recommended solutions to increase the speed of power amplifier test.

Notes d’application 2014-04-30

MIL-STD-1553 Mask Files and Application Note
MIL-STD-1553 mask files and an application note that describes how to use them with Keysight InfiniiVision oscilloscopes.

Outil d'analyse 2014-04-30

ZIP ZIP 1.58 MB
ARINC 429 Mask Files and Application Note
ARINC 429 mask files and an application note that describes how to use them with Keysight InfiniiVision oscilloscopes.

Outil d'analyse 2014-04-30

ZIP ZIP 2.05 MB
Finding the Cause of an Infrequent Glitch Using the InfiniiVision 6000 X-Series - Application Note
This application note is a supplement to “Finding the coupling signal that causes the glitch”a built-in and automatic demonstration on the Keysight InfiniiVision 6000 X-series.

Notes d’application 2014-04-29

PDF PDF 1.92 MB
Characterizing CAN Bus Arbitration - Application note
This app note will explain the CAN non-destructive bit-wise arbitration process. The InfiniiVision 4000 and 6000 X-Series oscilloscopes show examples of triggering and decoding those messages.

Notes d’application 2014-04-28

PDF PDF 1.23 MB
New Investigations into Energy: Keysight Nanomeasurement Systems - Application Note
The data presented demonstrates just a few of the ways in which the latest atomic force microscopy (AFM), nanoindentation, and field-emission scanning electron microscope can be utilized to enhance energy-related materials research.

Notes d’application 2014-04-24

PDF PDF 2.58 MB
High-Speed Broadband Spectroscopy Measurements Advance Molecular Research - Application Note
This application note describes how Keysight’s data conversion technology enables highly accurate rotational spectroscopy for the generation of a precise library of reference spectra.

Notes d’application 2014-04-23

PDF PDF 1.71 MB
Keysight Method of Implementation (MOI) for 10GBASE-KR/40GBASE-KR4 Ethernet Tx/Rx Return Loss Tests
Keysight Method of Implementation (MOI) for 10GBASE-KR/40GBASE-KR4 Ethernet Tx/Rx Return Loss Tests Using Keysight E5071C ENA Option TDR

Notes d’application 2014-04-21

PDF PDF 1.03 MB
Keysight Method of Implementation (MOI) for 10GBASE-KR/40GBASE-KR4 Ethernet Interconnect Tests
Keysight Method of Implementation (MOI) for 10GBASE-KR/40GBASE-KR4 Ethernet Interconnect Tests Using Keysight E5071C ENA Option TDR

Notes d’application 2014-04-21

PDF PDF 1.71 MB

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