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Programming with the N937xA PXIe Vector Network Analyzers - Application Note
This application note discusses the process of developing a C# application using an IVI driver as the programming remote driver for the M937xA PXIe vector network analyzer.

Notes d’application 2015-07-07

U2000 and U8480 Series USB sensor measurement uncertainty calculator
Measurement Uncertainty Calculator for the U2000 series USB sensors (U2000A, U2001A, U2002A, U2004A, U2000B, U2000H, U2001B, U2001H, U2002H) and U8480 series USB sensors (U8481A, U8485A, U8487A, U8488A)

Notes d’application 2015-06-30

Using Calibration to Optimize Performance in Crucial Measurements - Application Note
This application covers two goals: help you ensure that you get the calibration you expect (and deserve), and help you improve effective measurement performance through innovative use of calibration.

Notes d’application 2015-06-24

Measurement of Capacitance Characteristics of Liquid Crystal Cell - Application Note
This short application note describes how to take best advantage of the 4284A's powerful features when measuring capacitance while varying an AC signal voltage applied tothe liquid crystal material under test.

Notes d’application 2015-06-22

81150A and 81160A Pulse Function Arbitrary Noise Generators - Application Note
The Keysight 81150A and 81160A are pulse function arbitrary noise generators in different speed classes. They permit maximum test efficiency in a wide spectrum of applications.

Notes d’application 2015-06-18

Enhance EMC Testing with Digital IF - Application Note
This application note will discuss the differences between analog and digital IF architecture and explain how digital IF enhances both compliance and precompliance measurement processes.

Notes d’application 2015-06-18

Demystifying RCRC and RC probes - Application Note
An ideal probe would provide an exact replica of a signal being probed. However, the probe becomes a part of the circuit under test, because the probe introduces probe loading to the circuit.

Notes d’application 2015-06-17

PXI Interoperability-How to Achieve Multi-Vendor Interoperability in PXI Systems - Application Note
The purpose of this application note is to impart confidence through knowledge, discussions,and demonstrations of smooth implementations amd coexistence of PXI HW, SW and related tools

Notes d’application 2015-06-15

Bridging the Gap from Benchtop to PXI - Application Note
This application note describes how a common software platform can facilitate efficient transfer of test methodologies used in design to their manufacturing colleagues.

Notes d’application 2015-06-15

Extending the Life of Test Systems that Support Long-term Programs - Application Note
As an original equipment manager (OEM), we offers efficient and effective alternatives that can extend the life of systems and ensure that the individual instruments are meeting their warranted spec.

Notes d’application 2015-06-12

Calibration of a Ratio Transformer - White Paper
Describes a calibration technique for decade ratio transformers which is performed by comparison measurement at 1kHz.

Notes d’application 2015-06-09

One Size Does NOT Fit All - Application Note
This application note discusses the topic of “One Size Does NOT Fit All” and how test system configurations benefit from a choice of hardware form factors and software products.

Notes d’application 2015-06-08

Keysight Method of Implementation (MOI) for PCIe 3.0 Tx/Rx Impedance and Return Loss Test
Keysight Method of Implementation (MOI) for PCIe 3.0 Tx/Rx Impedance and Return Loss Test Using Keysight E5071C ENA Network Analyzer Option TDR

Notes d’application 2015-06-05

The Six Axes Of Calibration - Application Note
To help demonstrate the variances in the deliverables and value of calibration due to lack of regulation. They have been split into 6 axes. This document discusses each of these axes.

Notes d’application 2015-06-04

Noise Figure Uncertainty Calculator
The noise figure uncertainty calculator has been created to aid your design work, from components through to systems, helping you meet the continued demand for higher system performance.

Outil d'analyse 2015-05-29

Simplify Complex High-speed Multichannel Acquisition Systems in Big Physics Experiments-Application
This application note overview describes the use of Keysight modular products for high-speed multichannel acquisition systems in big physics experiments.

Notes d’application 2015-05-28

Implementing Cover-Extend Test on Keysight x1149 Boundary Scan Analyzer - Application Note
This application note discusses the process of test generation on the x1149 boundary scan analyzer with Cover-Extend Technology, and suggestions on fixturing in order to successfully implement CET.

Notes d’application 2015-05-26

Techniques for Precise Measurement Calibrations in the Field - Application Note
This application note discusses recent advances in VNA calibration and compares measurements made on a FieldFox analyzer using different calibration types for a variety of RF and microwave devices.

Notes d’application 2015-05-22

Techniques for Precise Power Measurements in the Field - Application Note
This application note will discuss techniques for measuring average and peak power and the associated equipment options available for field testing.

Notes d’application 2015-05-22

Connector Pin Recession and its Effect on Network Analyzer Accuracy - White Paper
Outlines an experiment undertaken to assess the impact on the measurement of reflection coefficient when using 3.5 mm connectors.

Notes d’application 2015-05-20

Attenuation Measurement of Step Attenuators - Application Note
Describes the T-matrix measurement method for achieving high accuracy in calibrating step attenuators.

Notes d’application 2015-05-20

Soft Touch Connectorless Logic Analyzer Probes - Application Notes

Notes d’application 2015-05-20

Revisiting Mismatch Uncertainty with the Rayleigh Distribution - White Paper
This paper examines several important aspects of estimating mismatch uncertainty, which is often a major component of the total uncertainty for RF and microwave measurements.

Notes d’application 2015-05-19

Uncertainty Analysis for Uncorrelated Input Quantities - White Paper
The Guide to the Expression of Uncertainty in Measurement (GUM) has been widely adopted in the different fields of the industry and science. Learn how to use for uncorrelated input quantities.

Notes d’application 2015-05-19

Techniques for Time Domain Measurements - Application Note
This application note will introduce time domain and DTF measurement techniques for identifying the location and relative amplitudes of discontinuities while operating in the field.

Notes d’application 2015-05-19

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