Discutez avec un expert

Support technique

Mesure Electronique

Recherche par numéro de modèle du produit: Exemples : 34401A, E4440A

Affiner la liste

retirer tout le raffinement

Par industrie/technologie

Par type de contenu

Par catégorie de produit

201-225 sur 2830

Sort:
Generating Looped Test Patterns or PRBS Signals with a Preamble - Application Note
This paper explains how to setup a test pattern with a preamble, which is played once e. g. to bring the tested device into a test mode, and the test data, played several times to test for errors.

Notes d’application 2014-03-04

PDF PDF 1.10 MB
CAN Eye-Diagram Mask Testing - Application Note
InfiniiVision X-Series scopes can trigger, decode, and perform eye-diagram mask test measurements on differential CAN bus signals, as well as perform analysis on other serial bus standards.

Notes d’application 2014-03-03

PDF PDF 2.63 MB
Characterizing Hi-speed USB 2.0 Serial Buses in Embedded Designs - Application Note
Learn about probing the hi-speed USB 2.0 serial bus and see some unique debugging tools and capabilities that can help you get your embedded designs to market faster.

Notes d’application 2014-03-03

Simulating Signals with the Highest Integrity – Application Brief
Learn how Trueform waveform generators allow you to accurately represent your signals without the weaknesses of DDS with this 4-page application brief.

Notes d’application 2014-02-28

High Speed Lightwave Component Analysis - Application Note
The principles and methods are described for measuring the frequency dependence of fiberoptic transponders that convert electrical signals to optical signals and optical to electrical.

Notes d’application 2014-02-26

Noise Figure Measurement Accuracy - The Y-Factor Method - Application Note
Specific to instruments that use the Y-factor method for noise figure measurements, this app note discusses measurement basics, avoidable errors, loss and temperature corrections, and uncertainties.

Notes d’application 2014-02-26

PDF PDF 1.48 MB
Overcoming the Challenges of Simulating Phased-Array Radar Systems
This application note discusses a solution that reduces design cycles, significantly reduces cost and allows you to simulate a scenario before taking it to land, skies and seas.

Notes d’application 2014-02-26

Power Supply Connections for Your CET Signal Conditioner Card Application Note
The Cover-Extend Technology signal conditioner card can be powered from various sources. The recommended sources are discussed in this application note.

Notes d’application 2014-02-25

PDF PDF 435 KB
Spectrum Analysis Basics - Application Note
This application note (also known as AN 150) explains the fundamentals of swept-tuned, superheterodyne spectrum analyzers and discusses the latest advances in spectrum analyzer capabilities.

Notes d’application 2014-02-25

Rapid Mechanical Properties of Multi-layer Film Stacks - Application Note
In this note, we measure the mechanical properties of 50nm films with remarkable precision and accuracy. The precision is due to Express Test, which performs indentations at a rate of one per second, thereby allowing many indentations to be included in the final determination of modulus and hardness.

Notes d’application 2014-02-17

PDF PDF 2.29 MB
U2000 and U8480 Series USB sensor measurement uncertainty calculator
Measurement Uncertainty Calculator for the U2000 series USB sensors (U2000A, U2001A, U2002A, U2004A, U2000B, U2000H, U2001B, U2001H, U2002H) and U8480 series USB sensors (U8481A, U8485A, U8487A, U8488A)

Notes d’application 2014-02-14

XLS XLS 93 KB
Solutions for Millimeter Wave Wireless Backhaul - Application Note
This “Solutions for Millimeter Wave Wireless Backhaul” app note gives insight into designing and testing E-band backhaul using effective network analysis, and signal generation and analysis solutions.

Notes d’application 2014-02-14

U2020 X-Series USB Sensor Uncertainty Calculator - Application Note
Measurement Uncertainty Calculator for U2020 X-Series.

Notes d’application 2014-02-14

XLS XLS 22 KB
Using Fast-Sweep Techniques to Accelerate Spur Searches - Application Note
New advances in signal processing provide improvements in sweep speeds by implementing a new type of digital RBW filter in X-Series signal analyzers. This application note focuses on these new improvements.

Notes d’application 2014-02-11

Download the latest AWG Application Notes
Here you can download free application notes for new Arbitrary Waveform Generators (AWGs)

Notes d’application 2014-02-10

IV Characterizations of Solar Cells Using the Keysight B2900A Series of SMUs - Technical Overview
The Keysight B2900A Series Precision SMU allows you to accurately and quickly make characterization of photovoltaic cells with its intuitive GUI and free PC-based application software.

Notes d’application 2014-02-10

Mechanical Properties Measurement on Individual Composite Micro-fibers - Application Note
Study of characterization of mechanical properties of bicomponent micro-fibers, consisting of nylon 6 nano-islands in a PET sea, under tensile loading.

Notes d’application 2014-02-07

PDF PDF 188 KB
On-Wafer SOLT Calibration Using 4-port PNA-L Network Analyzers - Application Note
This documentation is intended for on-wafer applications using the 4-port, 20 GHz, PNA-L network analyzer with two dual probes to achieve full 4-port on-wafer calibrations manually. This application note provides the step-by-step instructions needed to set up a calibration kit in order to perform a 4-port SOLT (Short-Open-Load-Thru) calibration using only three thrus.

Notes d’application 2014-02-06

EMC Compliance Testing: Improve Throughput with Time Domain Scanning - Application Note
This application note provides an overview of time domain scan, the test scenarios in which it provides the greatest time savings, and trade-offs between speed and overload protection.

Notes d’application 2014-01-30

Generating radar pulses with maximum bandwidth – Application Brief
This app brief presents compression methods for the M8190A that provide suitably wide bandwidths applications: idle insertion, digital upconversion and DSP-based modification ensuring long playtime.

Notes d’application 2014-01-29

Performing a Precision ADC Evaluation Using a Low Noise DC Source - Application Note
This 6-page application note introduces the Keysight B2962A 6.5 Digit Low Noise Power Source which is suitable for the application requiring low noise power supply such as ADC Evaluation.

Notes d’application 2014-01-28

PDF PDF 733 KB
Ultra-Low Noise Filter Minimizes B2961A/62A Power Source Noise Density - Application Brief
This 2-page Application Brief introduces N1294A-021 Ultra Low Noise Filter which is suitable for the application requiring low noise power supply such as the evaluation of A/D Converter, Oscillator, Amplifiers.

Notes d’application 2014-01-27

PDF PDF 698 KB
Low Noise Filter Improves B2961A/62A Power Source Noise Performance - Application Brief
This 2-page application brief introduces N1294A-022 Low Noise Filter which enables the B2961A/62A to source clean voltage equivalent to that of much costlier precision linear voltage/current source instruments.

Notes d’application 2014-01-24

PDF PDF 543 KB
Why Migrate from HP/Keysight 432A/B to Keysight N432A Thermistor Power Meter? – Application Note
Seven Reasons to Migrate from 432A/B to N432A Thermistor Power Meter.

Notes d’application 2014-01-24

PDF PDF 3.52 MB
High Precision Time Domain Reflectometry - Application Note
Time domain reflectometry (TDR) is a well-established technique for verifying the impedance and quality of signal pats in components, interconnects, and transmission lines.

Notes d’application 2014-01-23

Précédente 1 2 3 4 5 6 7 8 9 10 ... Page suivante