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Five Hints for Successful Measurements in Noise - Application Brief
This note discusses the top hints to improve measurement sensitivity and accuracy for small signals, especially those near the noise.

Application Note 2016-03-29

Overcoming the Challenges in Satellite Testing and Interference Detection - Application Brief
With a streamlined multi-touch UI, wider bandwidth and application software, the Keysight PXA offers the tools you need to design, test and deliver your next breakthrough in satellite communications.

Application Note 2016-03-26

PDF PDF 1.56 MB
Enabling Noise Measurements on Magnetic Sensors
This document describes how to use the Keysight E4727A Advanced Low-Frequency Noise Analyzer to simplify noise measurements on magnetic sensors.

Application Note 2016-03-24

PDF PDF 931 KB
FieldFox Handheld RF and Microwave Analyzers Technology Refresh Services
Keysight’s technology has now surpassed the market-leading 8565E and 8565EC with the introduction of the 50 GHz FieldFox handheld analyzers in 2015.

Application Note 2016-03-24

V-Series, Z-Series Oscilloscope Technology Refresh Services
Save money by upgrading your current assets or get a 50-percent credit when you trade-in your current analyzer to an X-Series signal analyzer with multi-touch.

Application Note 2016-03-23

Real-time Noise Monitor - Application Brief
Keysight B2980A Series supports the Real-time Noise Monitor function that improves your current measurement environment.

Application Note 2016-03-18

PDF PDF 331 KB
BenchVue Software as an Educational Tool - Application Note
Discover how BenchVue software is a powerful tool for instructional laboratories, as well as for instructors.

Application Note 2016-03-18

PDF PDF 903 KB
How to Address USB Type-C™ Transmitter and Receiver Test Challenges - Application Note
Understanding the USB Type-C and USB 3.1 transmitter and receiver test challenges can help to ensure successful USB Type-C integration and test for devices.

Application Note 2016-03-16

How to Correlate USB Type-C Simulation and Measurement - Application Note
Upgrading or integrating USB Type-C into a device is complex. To avoid costly hardware prototyping cycles and identify problems early, perform simulation of the design for compliance testing.

Application Note 2016-03-16

IoT – With Great Power Comes Great Challenges - Application Note
This app note addresses the rising challenges for IoT device designers and developers at component, circuit and system levels. What are the tools and solutions available, and test considerations.

Application Note 2016-03-16

Using Nanomeasurement Systems for Nanoscale Investigations of Graphene - Application Note

Application Note 2016-03-11

PDF PDF 7.96 MB
Ultra-Low Noise Filter Minimizes B2961A/62A Power Source Noise Density - Application Brief
This 2-page Application Brief introduces N1294A-021 Ultra Low Noise Filter which is suitable for the application requiring low noise power supply such as the evaluation of A/D Converter, Oscillator, Amplifiers.

Application Note 2016-03-09

PDF PDF 619 KB
Improve the Accuracy and Efficiency for Organic-Thin Film Transistor (Organic-TFT) Characterization
This application note provides the technical information for the organic thin film transistor (OTFT) measurement using the B1500A Semiconductor Device Analyzer.

Application Note 2016-03-08

PDF PDF 2.96 MB
High-Current Ultra-Low Noise Filter Minimize B2961A/62A Power Source Noise Density
This 2-page Application Brief introduces N1294A-020 High Current Ultra Low Noise Filter suitable for the application requiring low noise power supply such as the evaluation of A/D Converter, Oscillator, Amplifiers.

Application Note 2016-03-06

PDF PDF 1.11 MB
Low Noise Filter Improves B2961A/62A Power Source Noise Performance - Application Brief
This 2-page application brief introduces N1294A-022 Low Noise Filter which enables the B2961A/62A to source clean voltage equivalent to that of much costlier precision linear voltage/current source instruments.

Application Note 2016-03-04

PDF PDF 841 KB
Four Hints for Making Successful Noise Figure Measurements - Application Brief
This brief provides 4 hints for improving measurement uncertainty, increasing yield, and lowering cost when measuring noise figure performance of low-noise amplifiers, mixers & frequency converters.

Application Note 2016-03-03

A Framework for Understanding: Deriving the Radar Range Equation - Application Note
Radar scans three-dimensional space to gather information about detected objects such as location, shape and speed. This entire process is described in this app note by the radar range equation.

Application Note 2016-03-03

PDF PDF 1.19 MB
Mini In-Circuit Tester - Application Note
This application note discusses the SCPI commands and the potential use models with the modular Keysight Mini In-Circuit Tester.

Application Note 2016-03-02

How to Ensure Interoperability and Compliance of USB Type-C™ Cables and Connectors- Application Note
Integrating USB Type-C into products, while ensuring interoperability and compliance, is challenging. This measurement brief covers USB Type-C cable and connector design and test solutions.

Application Note 2016-02-29

Need a Lower Noise Power Supply? - Application Brief
This 2-page application brief introduces the benefits of using the Keysight B2961A/B2962A Power Source which allows ultra-clean voltage for noise sensitive oscillator characterization.

Application Note 2016-02-28

Preserve Measurement Integrity of Your Test Equipment
Your peace of mind with maximum return on your investment

Application Note 2016-02-25

Overcoming LTE/LTE-A RF Test Challenges - Application Note
This application note covers test implications for recent LTE-A updates. Proposes solutions using the multi-touch MXA X-Series Signal Analyzer and LTE/LTE-A X-Series measurement applications.

Application Note 2016-02-22

PDF PDF 2.01 MB
Right Load Switching and Simulation Design Choices for High Current and Mechatronic Functional Tests
Key considerations for designing a cost-effective high-power switching and load management automotive functional test solution.

Application Note 2016-02-22

PDF PDF 967 KB
Understanding the Programming Interfaces of PXI Instruments - Application Note
This application note explains the differences between benchtop and PXI system architectures and programming interfaces to help you understand how to integrate PXI into benchtop systems.

Application Note 2016-02-17

Virtual Flight Testing of Radar System Performance Using SystemVue and STK - White Paper
Keysight SystemVue and AGI STK can be integrated to provide virtual flight testing of radar and electronic warfare algorithms, saving both time and money.

Application Note 2016-02-05

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