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Static Random Access Memory (SRAM) Cell Modeling in MBP 2017
The latest release Model Builder Program (MBP) 2017 now features a SRAM cell model generation package that’s designed to address the challenges of modern complex SRAM cell modeling, by enabling engineers to extract transistor-level and memory-cell models in one MBP session.

Présentation de séminaire 2017-08-10

PDF PDF 1.44 MB
Automatable RTN Measurement Using the B1500A Semiconductor Parameter Analyzer
As device lithographies have continued to shrink, understanding the impact of random telegraph noise (RTN) on integrated circuits has become increasingly important. Due to its innate random nature and dependence on applied voltage, characterizing RTN on a process requires many measurements to be made across a wafer at multiple gate-to-source biases. This section will cover the basics of RTN measurement and outline a cost-effective Keysight solution using WaferPro Express and the B1500A Semiconductor Device Analyzer.

Présentation de séminaire 2017-08-10

PDF PDF 2.41 MB
Keysight EEsof EDA Customer Education and Services
Brief overview of Keysight EDA Customer Education and Services.

Matériel de formation 2017-08-08

Design and Simulation of 5G 28-GHz Phased Array Transceiver Webcast
August 3, 2017

Webcast - enregistré

Design and Simulation of 5G 28-GHz Phased Array Transceiver Slides
Slides from the August 3, 2017 webcast

Présentation de séminaire 2017-08-03

PDF PDF 8.17 MB
Einblicke in Leistungsumwandler-Messungen
Leis­tungselek­tro­nik-Messungen

Séminaire

Troubleshooting Coherent Optical Communication Systems Webcast
Original broadcast April 22, 2015

Webcast - enregistré

Modernizing Threat Simulation in Electronic Warfare Webcast
Original broadcast July 26, 2017

Webcast - enregistré

Mesures électroniques appliquées à la conversion de puissance
Mesures électroniques appliquées à la conversion de puissance

Séminaire

Misure Elettroniche nella Conversione di Potenza
Conoscenza delle Misure Elettroniche di Potenza

Séminaire

Power Conversion Measurement Insights
Keysight HOTSPOTS facilitates this learning process by offering the in-depth and up-to-date information relevant to your industry, your current job role and to the role you aspire to.

Séminaire

Test with Data Analytics to Enable Faster Time to Market Webcast
Original broadcast March 8, 2017

Webcast - enregistré

Video: 10-Tip Series to help you get more out of the 34980A Switch/Measure unit
View video clips to improve your productivity and get to results quickly with a switch/measure unit.

Matériel de formation 2017-07-30

Automated Test / Board Test User Groups (ATUG)
These User Group meetings (ATUG) are held at various cities across the US.

Séminaire

DSEI 2017
DSEI 2017

Salon professionnel

Thermal Effects, Power Integrity, and Your PCB
Original broadcast July 27, 2017

Webcast - enregistré

HSD Learning Week
HSD Learning Week Münich 2017

Formation en classe

Verifying RF Short Range Communication in IoT Webcast
Original broadcast June 27, 2017

Webcast - enregistré

Addressing Crosstalk Challenges from Simulation to Board Debug Webcast
Original broadcast June 28, 2017

Webcast - enregistré

Addressing New SAS-4 Transmitter and Receiver Test Challenges Webcast
Live broadcast July 20, 2017; 10am PT / 1pm ET

Webcast

EMPro Fundamentals
The EMPro course teaches users how to efficiently create three-dimensional models using an advanced mechanical CAD front end and set these up for either FEM or FDTD electromagnetic analysis.

Formation en classe

Genesys Fundamentals
3-day, hands-on course based on the Keysight EEsof Genesys software

Formation en classe

SystemVue Fundamentals
This course teaches the basics of using SystemVue for digital signal processing and system architecture design. The focus is on the Data Flow simulator for DSP design.

Formation en classe

Refresh Your Teaching Lab With Modern Instruments and Software Webcast
Original broadcast June 13, 2017

Webcast - enregistré

Keysight Test-Drive 2017
Various dates and locations in 2017

Séminaire

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