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Electronic Measurement

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The 87512A and 87512B have neither calibration service nor serial number. Why?
Because these products have no electrical specification to be guaranteed.

FAQ 2008-06-27

Our 4395A displays "Caution: CONT switching may damage Mech switch.". How should I repair?
The 4395A does not need repair.

FAQ 2008-06-27

The PORT 1 connector terminal is movable. Is this defective?
No. The PORT 1 connector terminal is designed to be that way.

FAQ 2008-06-27

Why is the sweeptime so long on my EMC analyzer when I select the Quasi-Peak Detector?
Because of the CISPR 16-1 specified time constants for one.......

FAQ 2008-06-27

How does the Measurement Sequence Mode of the 4339B operate?
This measurement mode automates the measurement sequence of Trigger -> Test Voltage ON -> Wait (Charge Time) -> Measure -> Test Voltage OFF.

FAQ 2008-06-12

Does the 4338B have 4-terminal pair measurement circuit configuration?
No. The 4338B has a shielded 4-terminal measurement circuit configuration.

FAQ 2008-06-12

Why does the 4339B have Measurement Sequence Mode and how should it be used for measurements?
DUT current initially includes a transient charging current and a dielectric absorption current in addition to a leakage current flow through DUT.

FAQ 2008-06-12

Why are both absolute accuracy and relative accuracy specified for the E4980A?
Since the measurement accuracy (relative accuracy) of the E4980A is as high as it is comparable with the uncertainty of calibration standards, the absolute accuracy of the E4980A depends on the calibration standards used.

FAQ 2008-06-11

What is the primary application of the DC resistance measurement function of the 4287A?
The DC resistance measurement function is used primarily for Contact Check.

FAQ 2008-06-11

Can the 4263B with Option 4263B-001 measure transformer parameters without using the 16060A?
Yes, but you need to change DUT connections when measuring parameters for the secondary of transformer after measuring for the primary.

FAQ 2008-06-11

Can I integrate the 4287A into a semiconductor probe station?
The 4287A can be integrated in a semiconductor probe station, but is not suitable for C-V and high impedance measurement applications for the following reasons:

FAQ 2008-06-11

Can the 4287A perform calibration for all the "measurement point setup tables" at once?
In manual operation using the front panel keys (or menus) of the 4287A, the calibration for all measurement point setup tables can be performed when "Calibrate all tables" is selected in the Calibration Dialog/Calibration Wizard Setting.

FAQ 2008-06-11

Why doesn't the 4287A necessarily display Rdc values over 100 kilo-ohms in Calibration Wizard/Dialog window when open termination is connected?
The measurement range for the DC resistance function of the 4287A is 0.1 ohms to 100 ohms.

FAQ 2008-06-11

Why can the 4263B accurately measure high capacitance up to mF region?
Since the 4263B has low impedance measurement ranges down to 100 mΩ range, high-value capacitors, which have low impedance, can be accurately measured.

FAQ 2008-06-10

Why does the insulation resistance of a capacitor measured by the 4339B vary depending on the lapse of measurement time?
It is because the charge current and dielectric absorption current which flow into the capacitance of the DUT vary depending on the lapse of time.

FAQ 2008-06-10

Can I use the 16048A/D/E with the 4294A?
No, the 4294A adapter setup function only supports 16048G/H cables to extend calibration plane. The 16048A/D/E are not available for the adapter setup and cannot provide accurate and specified measurements.

FAQ 2008-05-26

What are the criteria to be applied when choosing the instrument for C-V measurements from the 4294A and E4980A?
It depends on the size and the thickness of the gate oxide film of the device.

FAQ 2008-05-26

Why are you offering 3 instruments in 1? What if my customer needs only one of these instruments?
In addition to precise pulses and trigger customers need to stress the device to its limits. In the past they used either a second channel or an additional instrument to distort the signal. With the new build-in capabilities real-world signals can...

FAQ 2008-01-29

How many ground connections do I need to make when using flying lead probes with a logic analyzer?
Generally speaking, the higher your data rate, the more ground connections you will need. We recommend that you use a minimum of one ground connection for every two signals

FAQ 2008-01-07

What is the difference between video and power averaging types on the ESA Series Spectrum Analyzers?
Video should be used when in a LINEAR scale, Power should be used when in a LOG scale.

FAQ 2007-12-20

While measuring capacitors with my Keysight impedance analyzer, I am realizing negative values for Q and D. Can you advise?
For low loss devices (high Q, low D) it is not uncommon to realize negative readings on an LCR meter / Impedance analyzer. Note that the negative reading is physically impossible (for passive components) and the following explanation is provided.

FAQ 2007-11-18

On my Keysight Impedance Analyzer, I am realizing measurement results which appear questionable. Can you explain?
The measurement results can often be improved with a simple modification in the type of correction applied by the instrument.

FAQ 2007-11-18

When loading LDF, LIN Tester reports Error message (826,30): More than 64 Entries in Schedule Table:Config. Why?
Due to the limited memory in the LIN Spector the number of allowed entries in a schedule table is limited to 64.

FAQ 2007-10-05

When loading an LDF, LIN Tester reports Error ( 773,20 ): More than 16 Schedule Tables. Why?
Due to memory resources in the LIN Spector, the allowed number of schedule tables is limited to 16.

FAQ 2007-10-05

What is DigRF, and what are Keysight's DigRF test solutions?
See the linked document.

FAQ 2007-10-03

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