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Electronic Measurement

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How to Make Accurate, Automated RF Wafer-level Measurements
The video introduces automation as a way to increase productivity and efficiency. Keysight WaferPro Express measurement software is used to illustrate the various steps in combination with Cascade Microtech Velox software for prober control and Cascade WinCalXE software for automated calibration.

How-To Video 2015-01-27

How to Design an RF Power Amplifier: Class F
This short video will provide an introduction to Class F Power Amplifier Design by first building a nonlinear device model and then using this model in a circuit simulation environment to generate the idealized “square” Class F waveforms.

How-To Video 2015-01-27

Physical Layer Test System (PLTS) with PXI-VNA Multiport Measurements - Demo
This demonstration shows you how to measure 32 interconnect devices using a PXI VNA with PLTS software for multi-port multi-domain device characterization. This is a cost effective solution that provides insight into channel performance.

Demo 2015-01-27

89601B/BN-BHL Channel Quality Measurements, 89600 VSA Software - Technical Overview
The 89600 VSA software Option BHL for channel quality measurements accelerates satellite payload testing with a wideband test approach for group delay.

Technical Overview 2015-01-24

PDF PDF 1.97 MB
Switch Mode Power Supply Measurements - Application Note
Oscilloscope power measurement options provide a quick and easy way to analyze the reliability and efficiency of switching power supplies.

Application Note 2015-01-23

HDMI and DisplayPort Design and Test – A Better Way - Brochure
Brochure covering Keysight’s HDMI and Displayport test solutions portfolio and applications, discussing measurement challenges and showing how the test solutions and services address these.

Brochure 2015-01-23

PDF PDF 11.70 MB
Physical Layer Test System (PLTS) 2015 - Technical Overview
The PLTS software, with rapid crosstalk analysis and customizable device configuration mapping, makes multiple board turns a thing of the past. This technical overview covers basic information such as why physical layer testing is important, advanced signal integrity topics, and how the software guides the user through hardware setup and calibration, and controls the data acquisition.

Technical Overview 2015-01-22

89601B/BN-SSA Spectrum Analysis, 89600 VSA Software - Technical Overview
This data sheet provides a brief description, features and benefits of the 89600 VSA software option for Spectrum Analysis

Technical Overview 2015-01-22

PDF PDF 839 KB
Keysight Extends UXM Wireless Test Set LTE-A Carrier Aggregation Support with 3CC, TDD, Uplink
The E7515A UXM wireless test set adds features to address the rapidly evolving 3GPP LTE-Advanced carrier aggregation advancements.

Press Materials 2015-01-21

High Speed Digital Products: Comparison Chart
High Speed Digital Products: Comparison Chart

Selection Guide 2015-01-21

SMM EMPro - Application Note
In this application note, we describe electromagnetic (EM) simulations using Keysight Technologies’ EMPro software to support the interpretation of scanning microwave microscope (SMM) experiments.

Application Note 2015-01-20

PDF PDF 2.43 MB
N1012A OIF CEI 3.1 Compliance and Debug Application for 86100D DCA-X Oscilloscopes – Data Sheet
The N1012A OIF CEI 3.1 Compliance and Debug Application helps you to simplify measurement of these transmitter parameters and obtain full results to test limits in minutes.

Data Sheet 2015-01-20

PDF PDF 1.79 MB
E7515A UXM Wireless Test Set - Flyer
The E7515A UXM is a highly integrated signaling test set created for functional & RF design validation in the 4G era & beyond. It delivers LTE-A cat 6 now & will handle increasingly complex cases later.

Promotional Materials 2015-01-20

PDF PDF 856 KB
LTE Reference Vector
A fresh approach to Comms PHY system design challenges.

Application Note 2015-01-20

PDF PDF 270 KB
89601B/BN-BHP FMCW Radar Analysis, 89600 VSA Software - Technical Overview
89600 VSA software Option BHP for FMCW radar analysis enables quick and easy automated modulation quality measurements on multi-chirp linear FM signals.

Technical Overview 2015-01-18

PDF PDF 3.50 MB
Keysight EEsof EDA "How to" Videos
A collection of "How to" videos from Keysight EEsof EDA.

How-To Video 2015-01-15

How to Apply EM Port Calibration to Improve Simulation Accuracy (MoM)
This video covers 5 different Momentum calibration methods and shows how the different types of calibration methods impact simulation results along with where and how to use them properly.

How-To Video 2015-01-15

How to Characterize and Optimize Connector to Board Transition Designs
This video demonstrates how to accurately model an SMA to PCB transition to obtain agreement between simulated and measured results and how to improve the transition performance.

How-To Video 2015-01-15

How to Design an RF Power Amplifier: The Basics
This video provides a foundation for understanding how power amplifier circuits work. If you are new to High Frequency Power Amplifier Circuit Design, this is the place to start.

How-To Video 2015-01-15

ARINC 429 Eye-diagram and Pulse-shape Mask Testing – Application Note
Eye-diagram and pulse-shape pass/fail mask testing can be performed on differential ARINC 429 signals using an Agilent 3000 X-Series oscilloscope licensed with the DSOX3AERO and DSOX3MASK options.

Application Note 2015-01-15

PDF PDF 3.03 MB
How to Design an RF Power Amplifier: Class A, AB and B
This video provides an introduction to the most basic modes of power amplifier operation by first building a nonlinear device model from scratch and then using this model in a circuit simulation environment to demonstrate various modes of power amplifier operation.

How-To Video 2015-01-15

How to Design RF and Microwave Impedance Matching Networks
This video describes how to design RF and Microwave impedance matching networks.

How-To Video 2015-01-14

Simplify Signal Creation with Signal Studio Software - Brochure
Signal Studio is a flexible suite of signal-creation tools that reduce the time spent on signal simulation. Its performance-optimized reference signals are validated by Keysight.

Brochure 2015-01-14

PDF PDF 4.19 MB
How to Extract SRAM Models
This video shows how to extract SRAM device models efficiently on Keysight's device modeling platform.

How-To Video 2015-01-14

How to Use “Design of Experiments” to Create Robust Designs With High Yield
This video explains how to use the DOE methodology to help you create and produce robust designs with first pass success and high yield.

How-To Video 2015-01-14

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