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Electronic Measurement

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Component Testing Using an Oscilloscope with Integrated Waveform Generator – Application Note
This application note illustrates methods for testing components using an oscilloscope and waveform generator.

Application Note 2015-08-01

PDF PDF 3.21 MB
Oscilloscope Measurement Tools to Help Debug Automotive Serial Buses Faster - Application Note
Keysight's InfiniiVision Series oscilloscopes offer some unique measurement capabilities for debugging and characterizing the physical layer of automotive serial buses.

Application Note 2015-08-01

PDF PDF 3.86 MB
Creep Activation Energy of SAC305 Using NanoIndentation - Application Note

Application Note 2015-01-27

PDF PDF 292 KB
Solutions for RF Power Amplifier Test Application Note
Download Your Free Copies of the Latest Power of Wireless Application Notes

Application Note 2015-01-27

Solutions for Implementing Envelope Tracking in Power Amplifiers Application Note
Download Your Free Copies of the Latest Power of Wireless Application Notes

Application Note 2015-01-27

Switch Mode Power Supply Measurements - Application Note
Oscilloscope power measurement options provide a quick and easy way to analyze the reliability and efficiency of switching power supplies.

Application Note 2015-01-23

Creep Activation Energy of SAC305 Using Nano-Indentation - Application Note
The note discusses the use of nano-indentation to map the mechanical properties of a SAC 305 solder joint, because electronic reliability depends on mechanical integrity. Traditional nano-indentation testing time for such mapping, would have been prohibitively long but with the Express Test we were able to generate quantitative and highly resolved hardness maps in about an hour.

Application Note 2015-01-22

PDF PDF 292 KB
Addressing the Challenges of High-Speed Digital I/O for Aerospace Defense – Application Note
This application note will also discuss test challenges and commercial test solutions for fiber digital I/O technologies to help mitigate risk in upgrading to fiber-based technologies.

Application Note 2015-01-21

SMM EMPro - Application Note
In this application note, we describe electromagnetic (EM) simulations using Keysight Technologies’ EMPro software to support the interpretation of scanning microwave microscope (SMM) experiments.

Application Note 2015-01-20

PDF PDF 2.43 MB
Measuring Stress-Strain Curves for Shale Rock by Dynamic Instrumented Indentation - Application Note
Study of Dynamic instrumented indentation as an ideal way to measure the mechanical properties of shale rock. Note includes samples that can be just a few millimeters in extent, and shows that ion-milling is an adequate method of surface preparation. The note proves that test forces greater than 300mN, the primary results (reduced modulus and hardness) are accurate, repeatable, and relevant.

Application Note 2015-01-19

PDF PDF 1.17 MB
A Comparative Microscopy Imaging Study on Tissue Specimens - Application Note

Application Note 2015-01-17

PDF PDF 1.92 MB
Getting the Calibration You Need - Application Note
Calibration is the process of measuring the actual performance of an IUT using lab instruments that have significantly better performance than the IUT. Selecting the right calibration provider is key.

Application Note 2015-01-17

ARINC 429 Eye-diagram and Pulse-shape Mask Testing – Application Note
Eye-diagram and pulse-shape pass/fail mask testing can be performed on differential ARINC 429 signals using an Agilent 3000 X-Series oscilloscope licensed with the DSOX3AERO and DSOX3MASK options.

Application Note 2015-01-15

PDF PDF 3.03 MB
Automated Receiver Sensitivity Measurements Using U8903B - Application Note
This note shows how the test sequencer together with the GPIB master functionality in the U8903B can be used to easily make automated Receiver Sensitivity measurements that are reliable and repeatable.

Application Note 2015-01-14

PDF PDF 1 KB
6000 X-Series Oscilloscope Application Bundle - Application Brief
Take advantage of a new oscilloscope application bundle that will enable ALL software applications (including DVM and Wavegen) on your InfiniiVision 6000 X-Series oscilloscope for one low price.

Application Note 2015-01-12

PDF PDF 399 KB
Introduction to SECM and Combined AFM-SECM - Application Note
Introduction to Scanning electrochemical microscopy (SECM) is a powerful scanning probe technique, which is suitable for investigating surface reactivity, and processes at the solid/liquid as well as liquid/liquid interface.

Application Note 2015-01-11

PDF PDF 607 KB
Combining Atomic Force Microscopy with Scanning Electrochemical Microscopy - Application Note
Application note discussing the combined AFM-SECM approach with bifunctional probe provides topographical and correlated electrochemical information with high spatial and temporal resolution, thereby enabling the transformation of scanning probe microscopic techniques into multifunctional devices.

Application Note 2015-01-11

PDF PDF 1.02 MB
HV Cable Insulation Resistance Testing for Hybrid Vehicles - Application Note
Hybrid vehicle technology has grown rapidly over the last decade because of its fuel efficiency and low emissions. Today’s hybrid systems are more sophisticated than conventional engines and leverage the best operating characteristics of the combustion engine and electric motor based on driving conditions. This helps to achieve superior fuel efficiency and reduce CO2 emissions.

Application Note 2015-01-09

PDF PDF 279 KB
Tips for Preventing Damage to DCA, OSA TDR Analyzer - Application Brief
Popular Keysight models: 54754A, 86100C

Application Note 2015-01-08

Tips for Preventing Damage to Network Analyzer - Application Brief
Popular Keysight models: 8753A/B/C/D/E/ES/ET, 8754A, E5070B, E5071B, E5071C, E5061A and E5061B

Application Note 2015-01-08

Tips for Preventing Damage to Digital Multimeter - Application Brief
Popular Keysight models: 3458A, 34401A

Application Note 2015-01-08

Tips for Preventing Damage to Signal Generator - Application Brief
Popular Keysight models: E443xB, E4438C, E82x7D

Application Note 2015-01-08

Tips for Preventing Instrument Damage - Application Brief

Application Note 2015-01-08

PDF PDF 462 KB
Tips for Preventing Damage to Communication Test Set - Application Brief
Popular Keysight models: E5515A/B/C/T

Application Note 2015-01-08

Tips for Preventing Spectrum Analyzer Damage - Application Brief
Committed to your success throughout your equipment's lifetime

Application Note 2015-01-08

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