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Average Power Sensor Uncertainty Calculator Rev9
Average Power Sensor Uncertainty Calculator Rev9

Notes d’application 2014-08-19

XLS XLS 82 KB
Using RF Recording Techniques to Resolve Interference Problems - Application Note
This application note looks at functionality that is crucial to today’s commercial wireless and EW applications where interference-related issues are highly problematic.

Notes d’application 2014-08-03

PDF PDF 1.96 MB
Streaming, Analysis and Playback of RF Interference Signals in AD Applications - Application Note
Streaming, Analysis and Playback of RF Interference Signals in Aerospace and Defense Applications –looks at countering undesirable signals using a system based on COTS hardware and software when intentional interference is created to disrupt the operation of a victim receiver.

Notes d’application 2014-08-03

Using Gamma, S-Parameter Correction, and Real Time Measurement Uncertainty (RTMU) - Application Note
This application note explain how gamma/s-parameter correction used to correct for the mismatch error between the sensor and DUT, and how real time MU new calculation implementation.

Notes d’application 2014-08-01

PDF PDF 2.65 MB
Using Fine Resolution to Improve Thermal Images - Application Note
Fine Resolution effectively quadruples the resolution of the 160 x 120 pixels to 320 x 240 pixels. Fine Resolution is created through - multi-frame acquisition, super-position and reconstruction.

Notes d’application 2014-06-30

PDF PDF 530 KB
Materials Measurement: PCB Materials - Application Brief
This application brief provides the solutions for measuring PCB materials.

Notes d’application 2014-06-24

PDF PDF 290 KB
Quickly Validate Designs for DOCSIS 3.1 Compliance - Application Brief
This “DOCSIS 3.1 Test Solution" app brief gives insight into Keysight solutions that can be used for testing DOCSIS 3.1 transmitters, receivers and components.

Notes d’application 2014-06-24

E4990A Impedance Analyzer Migration Guide from 4294A
This migration guide describes the difference between the E4990A and 4294A impedance analyzers.

Notes d’application 2014-06-15

PDF PDF 40 KB
Introduction to the FieldFox RF Analyzer - Application Note
Introduction to the FieldFox RF Analyzer University Engineering Lab Series - Lab 1

Notes d’application 2014-06-13

PDF PDF 205 KB
Spectrum Analysis and the Frequency Domain - Application Note
Spectrum Analysis and the Frequency Domain University Engineering Lab Series - Lab 2

Notes d’application 2014-06-13

PDF PDF 252 KB
Power-Consumption Measurements for LTE User Equipment - Application Note
This application note focuses on determining how certain parameters affect a specific smartphone's power consumption and figure out how to adjust the parameters to improve battery life.

Notes d’application 2014-06-06

PDF PDF 353 KB
Measuring Stress-Strain Curves for Shale Rock by Dynamic Instrumented Indentation - Application Note
Study of Dynamic instrumented indentation as an ideal way to measure the mechanical properties of shale rock. Note includes samples that can be just a few millimeters in extent, and shows that ion-milling is an adequate method of surface preparation. The note proves that test forces greater than 300mN, the primary results (reduced modulus and hardness) are accurate, repeatable, and relevant.

Notes d’application 2014-06-02

PDF PDF 1.59 MB
Solutions for Measuring Permittivity and Permeability w/LCR Meters & Impedance Analyzers
This application note presents the technologies and methods for measuring permittivity and permeability. The document focuses on impedance measurement technology with the following advantages: Wide frequency range from 20Hz to 1GHz High measurement accuracy Simple preparations (fabrication of material, measurement setup) for measurement.

Notes d’application 2014-05-28

IGBT Sense Emitter Current Measurement Using the Agilent B1505A - Application Note
This application note introduces how the sense emitter current, emitter current and built-in temperature sensor current/voltage of IGBT can be measured simultaneously by using the B1505A.

Notes d’application 2014-05-27

PDF PDF 201 KB
Internal Gate Resistance Measurement Using the Agilent B1505A - Application Note
This application note explains how to measure power device internal gate resistance using the B1505A and also shows an actual example measurement.

Notes d’application 2014-05-27

PDF PDF 246 KB
Thyristor Characterization Using the Agilent B1505A - Application Note
This application note provides an overview of thyristor electrical characterization using the B1505A.

Notes d’application 2014-05-19

PDF PDF 347 KB
Noise Figure Uncertainty Calculator
The noise figure uncertainty calculator has been created to aid your design work, from components through to systems, helping you meet the continued demand for higher system performance.

Outil d'analyse 2014-05-19

Basics of Measuring the Dielectric Properties of Materials - Application Note
The dielectric properties that will be discussed here are permittivity and permeability. Resistivity is another material property which will not be discussed here.

Notes d’application 2014-05-16

Offline vs Inline: Shifting to automated inline ICT - White Paper
This paper discusses the benefits of adopting an inline in-circuit test strategy for electronics manufacturers looking to increase product quality and reliability while ensuring optimal ROIC.

Notes d’application 2014-05-14

Combining Atomic Force Microscopy with Scanning Electrochemical Microscopy - Application Note

Notes d’application 2014-05-07

PDF PDF 1.44 MB
Introduction to SECM and Combined AFM-SECM - Application Note

Notes d’application 2014-05-07

PDF PDF 962 KB
Low-Cost DDR3 Decode and Analysis with the 16850 Series Portable Logic Analyzers - Application Note
See how to make low-cost measurements on DDR3 interfaces and conduct performance analysis/compliance tests to evaluate the memory systems during debug and validation of a digital prototype.

Notes d’application 2014-05-05

PDF PDF 1.48 MB
MIL-STD-1553 Mask Files and Application Note
MIL-STD-1553 mask files and an application note that describes how to use them with Keysight InfiniiVision oscilloscopes.

Outil d'analyse 2014-04-30

ZIP ZIP 1.58 MB
ARINC 429 Mask Files and Application Note
ARINC 429 mask files and an application note that describes how to use them with Keysight InfiniiVision oscilloscopes.

Outil d'analyse 2014-04-30

ZIP ZIP 2.05 MB
Increase Power Amplifier Test Throughput with the Keysight PXIe Vector Signal Analyzer and Generator
This application note overview provides an overview of the challenges and recommended solutions to increase the speed of power amplifier test.

Notes d’application 2014-04-30

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