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Surviving State Disruptions Caused by Test: the "Lobotomy Problem"
This paper examines some issues and trends that justify adding features to IEEE 1149.1 that will facilitate safe, fast and effective initialization of a board or system, to get it ready for testing. Published with kind permission of the IEEE

Article 2010-12-10

PDF PDF 402 KB
Solutions for Undetected Shorts on IEEE 1149.1 Self-Monitoring Pins
This paper presents the problem of undetected shorts on IEEE 1149.1 compliant self-monitoring pins, and potential mitigating solutions.

Article 2010-12-10

PDF PDF 789 KB
The Proposed IEEE Test Standards - Article Reprint
There is a resurgence of interest in Boundary Scan and Built in Self Test (BIST) initiatives to be part of IEEE standards. This article explains the IEEE standard and their benefits to the industry. Agilent Boundary Scan, 1149.6, 1149.1, bead probes, cover-extend

Article 2010-10-20

PDF PDF 2.83 MB
A New Equilibrium - Article Reprint
The EMS and ODM markets are moving to a new equilibrium as they continue to balance cost pressures and technology evolution. This article looks at the trends shaping this new balance.

Article 2010-10-20

PDF PDF 192 KB
Limited Access Tools Improve Test Coverage - Article Reprint
Smaller test pads and shrinking board sizes are posing new challenges, and driving innovations to overcome limited access with new test solutions. Agilent Boundary Scan, 1149.6, 1149.1, bead probes, cover-extend

Article 2010-10-20

PDF PDF 275 KB
AMI models: What, why and how?
EE Times Design Article written by Sanjeev Gupta, Jose Luis Pino and Amolak Badesha of Agilent EEsof EDA.

Article 2010-10-18

Caution: MIMO Test Challenges Ahead
Article published by Wireless Design & Development on MIMO testing challenges and methods to achieve higher data rates such as two0 and four-channel MIMO.

Article 2010-09-20

PDF PDF 70 KB
What every engineer needs to know about MIMO operation and measurement
Utilizing MIMO to its fullest potential requires the engineer to have basic knowledge of its operation and measurement. This EP&T article by Agilent boils this knowledge down into 9 fundamental facts.

Article 2010-09-15

Network System DesignLine
Network System DesignLine has published an article in 2 parts in their How-to section of Enterprise Networking: Extend SAN over WDM, SONET/SDH, or IP

Article 2010-09-08

Article in Wireless Design & Development talks about how SIGINT systems adapt to changing threats
Basic performance characteristics needed to detect and collect the most difficult RF signals in the environment.

Article 2010-08-31

The MIMO Antenna: Unseen, Unloved, Untested!
Microwave Journal (August 2010) article (.pdf) written by Agilent’s Moray Rumney. With the shift of MIMO from theory to real world this article focuses on performance testing in real world conditions.

Article 2010-08-20

PDF PDF 693 KB
Measuring MIMO In LTE Tx And Rx Tests
Find the right combination of LTE test instruments and techniques to evaluate the performance of Long Term Evolution (LTE) components and systems under real-world conditions. A link to the MWJ article by Agilent.

Article 2010-08-18

Education News
Learn how Agilent works with Universities and Academia around the world.

Article 2010-07-08

Microwave Engineering Europe X-parameters Article

Article 2010-06-02

Capture More with Less using Oscilloscope Segmented Memory Acquisition
Article: Capture More with Less using Oscilloscope Segmented Memory Acquisition by Johnnie Hancock

Article 2010-05-20

Accuracy Improvements of PDN Impedance Measurements in the Low to Middle Frequency Range

Article 2010-04-21

PDF PDF 834 KB
Evaluation of Relative Humidity and Temperature Effects on Scattering Parameters in Transmission

Article 2010-04-21

PDF PDF 572 KB
Microwave Journal Cover Article: X-parameters Fundamentally Changing Nonlinear Microwave Design
Provides an overview of the invention and need for x-parameters to model the behavior of non-linear devices. This is an article reprint from Microwave Journal, Issue March 2010, Vol.53. No.3

Article 2010-03-25

PDF PDF 771 KB
Swimming in the channel
Signal-integrity problems can come back to bite you if you're not careful. Specialized software keeps the sharks away. Link to EDN magazine 3/18/2010 to read an article by their Technical Editor.

Article 2010-03-18

MPD Article: Instantaneous Phase Measurements of Wideband Active Electronically Scanned Arrays

Article 2010-03-03

Segmented memory
Segmented memory article

Article 2010-02-23

PDF PDF 317 KB
A primer on MIMO in LTE
An article in Electronic Products, written by Agilent’s Jan Whitacre, exploring the special employment of multiple-input, multiple-output radios to utilize spectrum in Long Term Evolution (LTE) systems.

Article 2010-02-01

Tester overcomes RF problems with wireless network deployment and maintenance
Article reprinted with permission from AGL.

Article 2009-12-24

PDF PDF 2.33 MB
Characterizing Satellite Subsystems and Signals with a Versatile Wideband Measuring Receiver
Article discusses an approach that provides greater insight into how internal signal quality can affect transmitted signals.

Article 2009-12-22

Measuring Propagation Delay with a Universal Counter
Make a signal path delay measurement, understand precision available with counters and more. (Email address required)

Article 2009-12-18

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