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Electronic Measurement

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Concepts of Orthogonal Frequency Domain Modulation (OFDM)

Article 2009-01-07

Eye-Diagram Analysis Speeds DDR SDRAM Validation

Article 2009-01-06

Validating the Physical and Protocol Layers in DDR Memory Interfaces

Article 2009-01-06

Electronic Products - 2008 Product of the Year Award
Analyzer changes fundamental way communications networks are designed

Article 2009-01-01

Is the 5th Harmonic Still Useful for Predicting Data Signal Bandwidth?
This article, published in High Frequency Electronics, compares using the 5th harmonic to using the system rise/fall times to determine the required bandwidth for your system. The article begins on page 18.

Article 2009-01-01

An Overview of WiMAX™ Radiated Performance Test Requirements
Published with kind permission of Communications Today

Article 2008-12-01

PDF PDF 292 KB
The Value Of Traceable S-Parameter Characterization Of Electro-Optical Components'

Article 2008-12-01

Article - The Evolution of Optical Transceiver Test

Article 2008-12-01

Boundary-Scan Testing of Power/Ground Pins
This paper describes how traditional Boundary Scan usage can be expanded to include testing of open defects on power and ground pins. Reprinted with kind permission from IEEE.

Article 2008-11-26

PDF PDF 238 KB
Creating High-Performance SDR Architectures
How to co-design RF architectures together with baseband signal processing to create high performance and flexible SDR architectures that can achieve the critical performance specifications necessary in the operational environment.

Article 2008-11-25

PDF PDF 806 KB
Expert Advice: The Importance of Average vs. Peak Performance in Cellular Wireless
The average efficiency of the cell remains much lower than the peaks. November 2008 article by Moray Rumney linked with permission by Microwave Journal.

Article 2008-11-17

Combine techniques to reduce ICT cost complexity
THis article describes how Cover-Extend Technology combines boundary scan and VTEP vectorless test techniques to help manufacturers reduce costs and complexity in their In-Circuit Test strategy

Article 2008-09-25

IMT-Advanced: 4G Wireless Takes Shape in an Olympic Year
An article, published in Issue 6 of the Agilent Measurement Journal, authored by our lead technologist.

Article 2008-09-01

PDF PDF 372 KB
Achieving Amplitude Accuracy in Modern Spectrum Analyzers
This article was published in Microwaves & RF in the September, 2008 issue.

Article 2008-09-01

PDF PDF 202 KB
Analyze Antenna Approaches for LTE Wireless Systems
Multiple-antenna techniques are a large part of improved performance in LTE wireless systems, but they must be properly understood in order to be properly tested.

Article 2008-08-13

LTE ARQ and Re-segmentation
Link to August 2008 Microwave Journal Article

Article 2008-08-08

Signal Generation & Analysis for W-i-d-e-b-a-n-d Aerospace/Defense Systems
This article discusses how to choose the right broadband measurement solution for signal generation and analysis of your wideband aerospace and defense system.

Article 2008-07-01

PDF PDF 175 KB
Acqiris Digitizers Become an Integral Part, in the Quest for Nuclear Waste
Researchers at CERN have been investigating transmutation processes involving neutron capture for the safe disposal of nuclear waste.

Article 2008-06-13

PDF PDF 249 KB
A Constant Mismatch Analysis of Power RF Transistors using EDA tools
This Article wirtten by John Pritiskutch and Craig Rotay (STMicroelectronics) describes a Constant Mismatch Analysis of Power RF Transistors using EDA tools.

Article 2008-06-01

PDF PDF 5.90 MB
Next Generation ICT Solutions for Limited Access Boards
Newer, more complex printed circuit boards are creating new challenges in test accessibility. Published with kind permission of Electronic Manufacturing

Article 2008-05-29

PDF PDF 816 KB
Acoustic Tomographs Powered by Agilent Acqiris High-Speed PCI Digitizers ...
Japan’s number one designer and manufacturer of ultrasonic inspection systems has incorporated Agilent Acqiris technology in its powerful series of scanning acoustic tomographs.

Article 2008-05-29

PDF PDF 188 KB
Results from 2007 Industry Defect Level and Test Effectiveness Studies
To select an optimal test strategy, good knowledge of defect levels and test effectiveness are two very important factors to include. This paper presents data from a 2007 study of 3.7 billion solder joints. Reprinted with permission from IPC.

Article 2008-05-21

PDF PDF 118 KB
A New Measurement of the Half-Life of the Superallowed -decay of 26mAl
This short article reprint was prepared by Rebecca Scott from the University of Melbourne. It discusses the use of Agilent Acqiris digitizers for digital signal processing in nuclear physics.

Article 2008-05-20

PDF PDF 143 KB
Positron Emission Tomography Imaging Using Agilent Acqiris U1067A High-Speed PCI

Article 2008-05-15

PDF PDF 73 KB
MMIC Design: Speed to Market with the Lowest Cost and Highest Yield
This Article by Jack Sifri (Agilent Tech.) brings out the five important steps that are key elements of a successful MMIC Design process, in order to satisfy the speed to market at the lowest cost.

Article 2008-05-15

PDF PDF 1.58 MB

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