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MEMS On-wafer Evaluation in Mass Production - Application Note
This application note describes how to evaluate MEMS elements in the on-wafer stage in order to lower the total production cost in mass production.

Application Note 2015-08-27

Understanding the Right Metrics to use when Evaluating Oscilloscope Quality - Application Note
For scopes with bandwidth in the GHz range, a quality metric involves characterizing the analog-to-digital converter (ADC) using effective number of bits (ENOB). How important is ENOB?

Application Note 2015-08-26

Accurate Evaluation of MEMS Piezoelectric Sensor and Actuator using the 4294A - Application Note
This application brief describes the benefits of using the Keysight 4294A for device characterization of MEMS piezoelectric sensors and actuators, along with its wide variety of analysis functions and features and how it improves design efficiency.

Application Note 2015-08-26

Analyzing and Trending Battery Charging Temperature Rise Using an IR Thermal Imager and Handheld DMM
This application note show how the U5850 series TrueIR thermal imagers and contact type temperature measurement solutions can work hand in hand to effectively analyze charging temperature rise.

Application Note 2015-08-24

PDF PDF 2.19 MB
Download the latest 81160A Application Notes
Reduce your test time with a new 4-in-1 pulse generator - download free application notes

Application Note 2015-08-23

Implementing a Flexible Testbed for 5G Waveform Generation and Analysis
Keysight wireless design and test tools enable the exploration of new technologies needed for next-generation 5G communications.

Application Note 2015-08-18

Installation and Maintenance of Solar Photovoltaic Systems - Application Note
This application note introduces the test solutions comprising Keysight ruggedized handheld and benchtop measuring instrument for the installation and maintenance of solar photovoltaic (PV) systems.

Application Note 2015-08-15

PDF PDF 7.77 MB
Quickly Validate Designs for DOCSIS 3.1 Compliance - Application Brief
This “DOCSIS 3.1 Test Solution" app brief gives insight into Keysight solutions that can be used for testing DOCSIS 3.1 transmitters, receivers and components.

Application Note 2015-08-14

Calculating Measurement Uncertainty using DMM Ratio Measure Techniques
Ratio measurements are used to compute the value and accuracy of an unknown input voltage relative to a known reference voltage. Ratio measurements can be easily performed using a modern DMM by measuring the unknown input and reference voltages and using their ratio to determine the exact value of the unknown input voltage. This paper compares three DMM ratio measurement techniques for determining the traceable value and measurement uncertainty of an unknown input. It also demonstrates how ratio measurement techniques can be used to achieve traceable measurement uncertainties that approach an instrument’s 24-hour stability or Transfer accuracy specifications.

Application Note 2015-08-14

PDF PDF 570 KB
Power Supply Control Loop Response (Bode Plot) Measurements - Application Note
Unique to Keysight’s portfolio of measurements are frequency response measurements including Control Loop Response (Bode) and can be performed using InfiniiVision X-Series oscilloscopes.

Application Note 2015-08-13

Power Supply Rejection Ratio (PSRR) Measurements - Application Note
Power Supply Rejection Ratio (PSRR) measurements for power supply characterization, unique to Keysight’s portfolio of measurements, can be performed using InfiniiVision X-Series oscilloscopes.

Application Note 2015-08-13

Oscilloscope Measurement Tools to Help Debug Automotive Serial Buses Faster - Application Note
Keysight's InfiniiVision Series oscilloscopes offer some unique measurement capabilities for debugging and characterizing the physical layer of automotive serial buses.

Application Note 2015-08-01

W-CDMA Dynamic Power Analysis Using the 8960 - Application Note
This document illustrates how to use the dynamic power analysis measurement in the Keysight 8960 test set to measure user equipment (UE) power sequences.

Application Note 2015-07-31

PDF PDF 379 KB
Optimize Power Source Integrity Under Large Load Transients - Application Note
This application note discusses several ways to achieve the lowest possible voltage drop by selecting optimal load leads and power supplies and using local bypassing.

Application Note 2015-07-31

PDF PDF 1.37 MB
How to Take Fast, Simultaneous Measurements of Two or More Signals using BenchVue Software
Keysight BenchVue software for the PC accelerates your testing by providing multiple instrument measurement visibility and data capture with no programming necessary.

Application Note 2015-07-30

PDF PDF 1.15 MB
Making EMI Compliance Measurements - Application Note
This application note provides an overview of EMI compliance test requirements and measurement approaches.

Application Note 2015-07-25

Optimizing RF and Microwave Spectrum Analyzer Dynamic Range -- Application Note
The dynamic range of a spectrum analyzer is traditionally defined as the ratio, in dB, of the largest to the smallest signals simultaneously present at the input of the spectrum analyzer that allows measurement of the smaller to a given degree of uncertainty. The signals of interest can either be...

Application Note 2015-07-24

Preventive Maintenance Test with Insulation Resistance Test - Application Note
Preventive,maintenance,predictive,insulation,resistance,test,tester,U1450A This application note describes factors that affect insulation resistance, various insulation resistance test methods, and provides guidelines for selecting the appropriate test for the application.

Application Note 2015-07-24

Optimizing RF and Microwave Spectrum Analyzer Dynamic Range - Application Note
This application note defines the elements of spectrum analyzer measurement speed and shows how to choose solution bandwidth and data output format for fast measurements.

Application Note 2015-07-22

Characterizing Passive Components in Wireless Power Transfer (WPT) Systems - Application Note
This app note describes passive components used in wireless power transfer systems and their requirements as well as measurement solutions using Keysight network analyzers and impedance analyzers.

Application Note 2015-07-16

PDF PDF 2.46 MB
Dynamic Power Measurements for cdma2000 on the Keysight 8960 Wireless Test Set - Application Note
Power control is essential in CDMA devices. This application note explains how the use of dynamic power measurement can help ensure the in-field performance of CDMA wireless devices.

Application Note 2015-07-15

“Shotgunning”, a Bad Fit for Lead-Free Test
Shotgunning, a common repair technique in functional test, will be negatively affected by lead-free processes. This article explores the technique and draws broad conclusions regarding the impact of lead-free on electronics manufacturing test

Application Note 2015-07-14

PDF PDF 99 KB
New Pulse Analysis Techniques for Radar and EW - Application Note
This app note discusses the best tools for different types of pulse analysis, along with display and analysis techniques for various signals and measurement goals.

Application Note 2015-07-12

PDF PDF 2.86 MB
Optimizing VNA Settings for Testing of Next-generation Wireless Components - Application Note
This application note offers suggestions for optimizing network analyzer settings and ensuring better measurements. It covers basic settings and how to utilize advanced features to increase yields.

Application Note 2015-07-10

PDF PDF 1 MB
Programming with the N937xA PXIe Vector Network Analyzers - Application Note
This application note discusses the process of developing a C# application using an IVI driver as the programming remote driver for the M937xA PXIe vector network analyzer.

Application Note 2015-07-07

PDF PDF 4.75 MB

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