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Nonlinear characterisation and modeling through pulsed IV/S-parameters
This web seminar will put examples and discuss the design flow from Pulsed IV and Pulsed S-Parameters to Compact Transistor Models.

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Semiconductor Parametric Test: Back to Basics Part 2
The "Back to Basics Part 2" seminar provides practical tips and techniques on making fast pulse IV measurements and practical capacitance measurement considerations.

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Radar Pulse Measurements using NEW Peak Power Analyzer
The new 8990A has higher performance coupled with more features offering better value. Seminar will highlight some key features and illustrate how the new peak power analyzer is used to perform efficient pulse characterization in various applications

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Increase spectral efficiency in coherent optical communication
With Social Networks and Visual Online Contents the data trafic is forecasted to reach 6.3 Exabytes per month by 2015. To handle this, Provider need to adapt their networks. The upcoming webinar proposes how to face this challenge.

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Optimise UE design for greater battery run-time
This web seminar will discuss the challenges of verifying battery consumption during different UE operating modes and the tools available to measure the effects in power consumption.

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Physical Layer design challenges for PCI Express® 3.0 and 2.0 designs
You will learn advanced techniques for PCI Express phy-layer validation covering the latest PCIe 3.0 specification requirements as well as practical extensions to PCIe 2.0 and 1.1 designs. This seminar analyzes transmitter and receiver performance.

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Power measurements & analysis using Agilent InfiniiVision 3000 X-Series oscilloscopes (Italiano)
The webcast will discuss in detail some power supply measurements that are commonly used and how Keysight’s InfiniiVision 3000 X-Series oscilloscope can help characterise switching power supplies automatically, consistently, and fast.

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What’s happening with IEEE std. 1149.1 Boundary Scan?
The IEEE is revamping it, in a big way. What does that mean to test engineers?

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Characterizing MIL-STD 1553 and ARINC 429 Serial Bus Networks
This webinar will discuss how modern Oscilloscopes are able to trigger and automatically decode MIL-STD 1553 and ARINC429 serial buses. In addition we will analyse physical layer characteristics and perform a pass/fail test using an eye-diagram.

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Debug Digital Designs Faster with Advanced Parametric Triggering
Advanced parametric triggering can help synchronize oscilloscope acquisitions and display complex signal activity. Find signal parametric violation conditions such as setup & hold, edge speed, pulse amplitude (runts), pulse width violations, etc.

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Debugging automotive serial buses using an Agilent InfiniiVision Series oscilloscope (Italiano)
We will give an overview of the timing and protocol structure of the LIN, CAN and FlexRay buses. We will show Keysight’s Hardware based decoding to capture random errors and time-correlate data transfer information with the physical layer.

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Overcome LTE-A UE Design Test Challenges with Agilent’s New UXM Webcast Slides
Slides from the February 13, 2014 webcast

研讨会演示 2014-02-13

PDF PDF 3.80 MB
Analyze, Validate and Debug High Speed Memory
This Webcast will demonstrate techniques and solutions for performing turn-on, interoperability, validation and compliance testing of high data rate DDR3 memory based products.

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Modern Remote and Wireless Test Setup and Considerations
This seminar describes remote/wireless test setups and configurations with LXI compliant instruments with low cost, off the shelf network products. We review local and long distance wireless test, security hurdles and using smart devices and clouds.

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802.11ac WLAN - Channel bandwidth power measurement application using Agilent 8990B PPA
This web seminar shows you how the Agilent 8990B peak power analyzer can be used for 802.11ac testing WLAN transmitter testing.

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Small signal, low level, DC Parametric measurements: Back to Basics Part 1
The "Back to Basics Part 1" seminar provides practical tips and techniques on making low level DC Parametric measurements.

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Accelerating USB 3.0 Product Development
Super speed USB presents new challenges for designers and developers. Whether you are designing host, hub or device, Electrical or protocol, Agilent offers a complete solution for debug and validate your design.

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Eliminate the need for cumbersome multi-instruments setups for stress testing devices
EMEA web seminar - Eliminate the need for cumbersome multi-instruments setups for stress testing devices

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Digitizer fundamentals: Design considerations to achieve superior measurements
More than just understanding banner specs such as bandwidth and sampling rate, this webinar will arm you with knowledge of digitizer technology and underlying specifications to ensure you make accurate measurements that meet your application needs.

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Debugging Serial Buses using an InfiniiVision Series Oscilloscope
EMEA Web seminar - Debugging Serial Buses using an InfiniiVision Series Oscilloscope

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8x8 MIMO and Carrier Aggregation Test Challenges for LTE Webcast
Original broadcast April 25, 2013

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Advanced Passive Intermodulation (PIM) Measurement System Webcast
Original broadcast August 29, 2013

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3GPP LTE Standards Update: Release 11, 12 and Beyond
Original broadcast October 25, 2012

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RF Streaming, Analysis and Playback in Aerospace & Defense Applications
Original broadcast Mar 15, 2012

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New Capabilities of Calibration Refresh Modules Webcast
Original broadcast July 19, 2013

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