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E4982A LCR Meter 1 MHz to 3 GHz - Product Fact Sheet
The Keysight E4982A LCR meter provides the best performance for the passive component manufacturing such as SMD inductors and EMI filters, where impedance testing at high frequencies is required.

Promotional Materials 2015-03-27

PDF PDF 488 KB
E4982A LCR Meter 1 MHz to 3 GHz - Brochure
This brochure introduces overview of the E4982A LCR meter.

Brochure 2015-03-26

PDF PDF 7.65 MB
Keysight Logic Analyzers
Keysight Logic Analyzers

Selection Guide 2015-03-26

PDF PDF 1.17 MB
Mobile Phone Load Pull Measurements - Maury Microwave
Automated Mobile Phone Load Pull Measurement Solution from Maury Microwave and Keysight

Brève de solutions 2015-03-26

PXI Products and Modular Reference Solutions

Demo 2015-03-26

Advanced Design System (ADS) Platform Support Roadmap
Keysight EEsof EDA Advanced Design System (ADS) platform support roadmap.

Selection Guide 2015-03-26

PDF PDF 74 KB
Power Supply Control Loop Response (Bode Plot) Measurements - Application Note
Unique to Keysight’s portfolio of measurements are frequency response measurements including Control Loop Response (Bode) and can be performed using InfiniiVision X-Series oscilloscopes.

Application Note 2015-03-26

PDF PDF 1.87 MB
Characterization of PCB Insertion Loss with a New Calibration Method - Application Note
In this application note a new method for characterizing PCB loss by using AFR with 1X Open fixtures is proposed.

Application Note 2015-03-26

PDF PDF 700 KB
N1810/1/2 Coaxial Switches - Technical Overview
This technical overview describes the N181X coaxial switch series. It includes a description of the many different options available that make the series very versatile. Also included are detailed line drawings and specification tables for each switch.

Technical Overview 2015-03-25

E5080A ENA Series Network Analyzer - Configuration Guide
This configuration guide describes standard configurations, options, accessories and peripherals for the E5080A network analyzers.

Configuration Guide 2015-03-25

PDF PDF 879 KB
E7515A UXM Wireless Test Set - User's and Programmer's Guide
This manual describes the following aspects of the E7515A UXM: - using the Application Switch Tool - setting up the programming connection for sending SCPI commands to each UXM software component - specifying RF Cable Compensation.

User Manual 2015-03-25

PDF PDF 1.21 MB
N7660B Signal Studio for Multi-emitter Scenario Generation (MESG) - Technical Overview
N7660B Signal Studio for multi-emitter scenario generation (MESG) provides Keysight-validated, performance-optimized signals that can be downloaded directly to one or more UXG agile signal generators.

Technical Overview 2015-03-25

PDF PDF 755 KB
E5071C Network Analyzer - Configuration Guide
This configuration guide describes standard configurations, options, accessories and peripherals for the ENA RF network analyzers.

Configuration Guide 2015-03-25

Keysight WaferPro Express
The Keysight WaferPro Express software performs automated wafer-level measurements of semiconductor devices such as transistors and circuit components. It provides turnkey drivers and test routines for a variety of instruments and wafer probers. Its user interface makes it easy to setup and run complex wafer-level test plans, while powerful customization capabilities are enabled by the new Python programming environment.

Product Tour 2015-03-24

Power Supply Rejection Ratio (PSRR) Measurements - Application Note
Power Supply Rejection Ratio (PSRR) measurements for power supply characterization, unique to Keysight’s portfolio of measurements, can be performed using InfiniiVision X-Series oscilloscopes.

Application Note 2015-03-24

PDF PDF 1.52 MB
Keysight Technologies Introduces Pulse Amplitude Modulation (PAM-4) Analysis Capability
Keysight Technologies, Inc. (NYSE: KEYS) today introduced measurement software designed to help engineers quickly and accurately characterize PAM-4 (pulse amplitude modulation with four amplitude levels) signals using the Keysight V-Series, Z-Series, and S-Series real-time oscilloscope platforms.

Press Materials 2015-03-24

Press Releases | About Keysight
Keysight news and resources - Press Releases

Press Materials 2015-03-24

PCI Express Receiver Testing Responds To New Challenges - Article
PCI Express Receiver Testing Responds To New Challenges

Article 2015-03-24

MIPI Design & Test - Brochure
Brochure shows how to anticipate design challenges with Keysight MIPI test solutions that promotes hardware and software standardization in mobile designs.

Brochure 2015-03-24

PDF PDF 6.16 MB
Achieving Higher Measurement Accuracy & Better Correlation for PCB Impedance Test - Application Note
Traditional method for PCB impedance measurements is difficult to meet accuracy required today. Measurement with full calibration is introduced to meet accuracy for the latest PCB impedance test.

Application Note 2015-03-24

PDF PDF 1.49 MB
Highly Integrated J-BERT Simplifies Testing for Next-Generation Data-Center, Long-Haul-Communication
Highly Integrated J-BERT Simplifies Testing for Next-Generation Data-Center, Long-Haul-Communication Applications

Press Materials 2015-03-24

Automated X-Ray Inspection System Keysight Technologies - Technical Overview
This is a technical datasheet. Keysight has developed a sealed ultra-high vacumn X-ray tube that provides stable output throughout a significantly long life.

Application Note 2015-03-24

PDF PDF 644 KB
N9071A and W9071A GSM/EDGE/EVO X-Series Measurement Application - Technical Overview
An overview of the GSM/EDGE/EVO (N/W9071A) X-Series measurement applications.

Technical Overview 2015-03-24

PDF PDF 3.94 MB
N9079A & W9079A TD-SCDMA X-Series Measurement Application - Technical Overview
The N9079A & W9079A X-Series measurement application adds one-button, standard-based power and modulation analysis for the design and manufacturing of TD-SCDMA devices.

Technical Overview 2015-03-24

PDF PDF 2.91 MB
Performing LTE & LTE-Advanced RF Measurements with E7515A UXM Wireless Test Set - Application Note
This application note provides insights into example test procedures for RF testing of LTE and LTE-A UEs based on 3GPP TS 36.521-1 V12.2.0 (2014-06).

Application Note 2015-03-24

PDF PDF 9.75 MB

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