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How to Design an RF Power Amplifier: Class J
This short video will provide an introduction to Class J Power Amplifiers and demonstrate a superior, time saving methodology to design and practically realize a Class J RF power amplifier. First,a theoretical approach will be used to design an ideal circuit from first principles and then circuit design tools will be utilized to synthesize a more realistic circuit topology from the ideal case. The design process will be illustrated using a commercially available GaN MMIC device from Qorvo.

视频演示 2015-05-07

Keysight N1501A Dielectric Probe Kit 10 MHz to 50 GHz - Technical Overview
Keysight's N1501A is a dielectric probe kit that is used to measure the intrinsic electrical properties of materials in the RF and microwave frequency bands.

技术总览 2015-05-07

PDF PDF 2.76 MB
Paperless Calibration - Application Note
Discusses the benefits of storing calibration records electronically rather than on paper in filing cabinets and explains why having a hard copy of these files is not necessary.

应用说明 2015-05-07

PDF PDF 86 KB
Evaluation of the Performance of a State-of-the-Art Digital Multimeter - White Paper
Describes several methods used to verify the performance of a very accurate automatically calibrated DMM, the HP 3458A.

应用说明 2015-05-07

PDF PDF 864 KB
Language of Specifications - Application Note
This paper explains some of the arcane language used in describing a product's characteristics.

应用说明 2015-05-07

PDF PDF 695 KB
PNA Family Microwave Network Analyzers - Configuration Guide
This configuration guide describes standard configurations, options, accessories, upgrade kits and compatible peripherals for the PNA Family microwave network analyzers.

配置指南 2015-05-06

PDF PDF 2.77 MB
Measurement Applications for the E6640A EXM Wireless Test Set - Solution Brochure
Covers technology-specific software applications for the EXM wireless test set, developed to help you expedite the manufacturing of your cellular and wireless connectivity devices.

手册 2015-05-06

PDF PDF 3.94 MB
Keysight Demonstrates LTE-Advanced Category 11 IP Data Throughput with UXM Wireless Test Set
Keysight announced verification of end-to-end IP data throughput for downlink rates of 587.5 Mbps with the E7515A UXM wireless test set. Using three component carriers (3CC) and 256 QAM in the downlink, Keysight achieved sustained bi-directional 3GPP UE category 11 data rates.

新闻资料 2015-05-06

M9195A PXIe Digital Stimulus/Response IVI Driver Help
Help file for the KtMDsr IVI Driver.

帮助文件 2015-05-05

ZIP ZIP 1.70 MB
53210A 350 MHz RF Counter Programmer's Reference
This file contains reference information to help you program the 53210A 350 MHz RF Counter over a LAN, USB, or GPIB interface using the instrument’s SCPI command set.

帮助文件 2015-05-05

ZIP ZIP 1.10 MB
PNA and PNA-X Series Vector Network Analyzers (VNAs) - Option 090 Product Fact Sheet
This product fact sheet highlights the features, benefits and specifications for the spectrum analyzer capability for the PNA Series.

促销资料 2015-05-05

PDF PDF 738 KB
53220A/53230A 350 MHz Universal Frequency Counter/Timer Programmer's Reference
This file contains reference information to help you program the 53220A / 53230A 350 MHz Universal Frequency Counter/Timer over a LAN, USB, or GPIB interface using the instrument’s SCPI command set.

编程和语法指南 2015-05-05

ZIP ZIP 1.17 MB
Sensitivity Analysis of One-port Characterized Devices in Vector Network Analyzer Calibrations
Results of a study on the use of characterized devices in microwave vector network analyzer (VNA) calibrations and measurements. A review of the theory of one-port characterized device calibration.

应用说明 2015-05-05

PDF PDF 290 KB
M9195A PXIe Digital Stimulus/Response Soft Front Panel
Background and how-to-use information on the module's Soft Front Panel.

帮助文件 2015-05-05

ZIP ZIP 24.24 MB
Spectrum Analysis and the Frequency Domain - Application Note
Teaching Lab #2: Spectrum Analysis and the Frequency Domain University Engineering Lab Series - Lab 2

应用说明 2015-05-05

Keysight EEsof EDA Newsletter - Product and Application News
Keep tabs on the latest product and application news and review the archives of the Keysight EEsof EDA Newsletter.

内部通讯 2015-05-05

Introduction to the FieldFox RF Analyzer - Application Note
Teaching Lab #1:Introduction to the FieldFox RF Analyzer University Engineering Lab Series - Lab 1

应用说明 2015-05-05

Power Flow and Directional Couplers - Application Note
Teaching Lab #6: Power Flow and Directional Couplers University Engineering Lab Series – Lab 6

应用说明 2015-05-05

Too Much Calibration? - White Paper
This paper explains the variables at work in the world of calibration - how they can be used to find the elusive balance point between cost and confidence, or "too much" and "not enough" calibration.

应用说明 2015-05-05

PDF PDF 569 KB
Establishing Traceability for Quantities Derived from Multiple Traceable Quantities - White Paper
Provides method of developing traceability for measurements (eg. phase noise) that have no SI units.

应用说明 2015-05-05

PDF PDF 413 KB
Tribology of Dental Enamel: Effect of Etching - Application Brief
In this summary, the nano-tribological behavior of the dental enamel as a function of acid etching is characterized using a nanoindenter.

应用说明 2015-05-04

PDF PDF 624 KB
N9912A FieldFox RF Analyzer - Data Sheet
This document contains a complete list of the technical specifications for the FieldFox N9912A Handheld RF Analyzer

产品资料 2015-05-04

PDF PDF 846 KB
Keysight Technologies to Demonstrate RF, Microwave, mmWave Design, Measurement Solutions at IMS 2015
Keysight announces it will demonstrate the latest RF, microwave and mmWave design and measurement solutions for R&D, manufacturing and service at the IEEE MTT-S International Microwave Symposium, Booth 739, Phoenix, May 17-22.

新闻资料 2015-05-04

The Revolutionary Impact of the Oliver and Pharr Technique - Application Note
Explanation of the Oliver-Pharr method and how it can be used to obtain an equivalent Vickers hardness number

应用说明 2015-05-04

PDF PDF 343 KB
Strain-Rate Sensitivity of Thin Metal Films by Instrumented Indentation – Application Note
A new technique for measuring strain-rate sensitivity by instrumented indentation is presented. This new technique is insensitive to thermal drift and can be used for thin films and other small volumes materials

应用说明 2015-05-03

PDF PDF 1.38 MB

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