Discutez avec un expert

Technical Support

Electronic Measurement

Find by Product Model Number: Examples: 34401A, E4440A

1-14 of 14

Sort:
Millimeter-Wave FCC Part 15 Transmitter Compliance – OML
Millimeter-Wave FCC Part 15 Transmitter Compliance Test Solution from OML and Keysight

Brève de solutions 2014-05-07

Millimeter-wave spectrum analysis – OML
Millimeter-wave spectrum analysis from OML and Keysight

Brève de solutions 2014-05-07

Millimeter-wave S-parameter measurements – OML
Millimeter-wave S-parameter measurements from OML and Keysight

Brève de solutions 2014-05-07

X-Parameter Design Simulation Models - Modelithics
X-Parameter Design Simulation Models from Modelithics and Keysight.

Brève de solutions 2014-04-30

Magnetic Material Characterization – KEYCOM
Magnetic Material Characterization Solution from KEYCOM and Keysight.

Brève de solutions 2014-04-30

Millimeter Wave Frequency Extension for Vector Network Analyzers – Farran Technology
Millimeter wave frequency extension solutions for vector network analyzers from Farran Technology and Keysight

Brève de solutions 2014-04-29

Wideband Digital Pre-Distortion with Keysight SystemVue and PXI Modular Instrument
Digital Pre-Distortion (DPD) is essential for wideband communications systems based on LTE-Advanced and 802.11ac. Overcome DPD challenges with trusted commercial measurement and modeling tools.

Application Note 2012-10-15

Load Pull + NVNA = Enhanced X-Parameters for PA Designs
With high mismatch and technology-independent large-signal device models.

Application Note 2011-09-08

Fast Circuit Envelope Models for RFIC verification
Fast Circuit Envelope Models for RFIC verification Learn to verify 4G/LTE wireless RFIC transceivers 1000x faster using the GoldenGate “Fast Circuit Envelope” models in SystemVue.

Demo 2011-04-18

X-parameters Aid MMIC Design
Microwaves & RF article on how models based X-parameters can provide insights into the linear and nonlinear behavior of key components in wireless systems, including power amplifiers and mixers.

Journal 2010-07-15

X-parameters News
Press Releases related to Agilent's X-parameters

Press Materials 2009-08-21

MMIC Design Seminar Videos for ADS
A collection of Keysight EEsof EDA ADS video demos for MMIC Design

Demo 2009-07-14

Agilent Technologies Announces Breakthrough in X-Parameter Nonlinear Model Generation
Agilent Technologies Announces Breakthrough in X-Parameter Nonlinear Model Generation for Components Used in Wireless, Aerospace Defense Industries

Press Materials 2008-12-17

Data Mining 12-Port S-Parameters

Application Note 2008-08-11

PDF PDF 830 KB