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Using the VISA COM I/O API in .NET - Application Note
The Microsoft .NET architecture has many features that make it an excellent environment for Test & Measurement programmers. VISA COM I/O is an update of the older VISA C API to work in and with COM technology.

Notes d’application 2007-03-16

PDF PDF 345 KB
Migrating system software from GPIB to LAN/LXI (AN 1465-25) - Application Note
Migrating system software from GPIB to LAN/LXIis the sixth application note in a series designed to help you manage the shift to LXI from GPIB.

Notes d’application 2007-02-02

Next-generation Test Systems: Advancing the Vision with LXI - Application Note
This white paper provides an introduction to LXI, presents its advantages, and outlines usage models that expand the reach and capabilities-and perhaps the definition of test systems.

Notes d’application 2006-05-03

The ABC's of Arbitrary Waveform Generation
The ABC's of Arbitrary Waveform Generation

Notes d’application 2006-01-20

PDF PDF 684 KB
Using Generate Scenario Mode in the N7509A Waveform Generation Toolbox
Using the Generate Scenario Mode in the N7509A

Notes d’application 2005-07-20

PDF PDF 326 KB
Triggering the N6030A Arbitrary Waveform Generator
Triggering the PXI AWG

Notes d’application 2005-05-19

PDF PDF 172 KB
Trigger and Marker Interfacing on the N6030A
Markers and triggers on the PXI AWG

Notes d’application 2005-05-19

PDF PDF 68 KB
Using LAN in Test Systems: Applications (1465-14) - Application Note and Example Programs
Topics include balancing cost, convenience and security in three common LAN scenarios: sharing instruments, remote monitoring and data acquisition, and functional test systems. Includes downloadable example programs.

Notes d’application 2005-04-01

Using LAN in Test Systems: Setting up System I/O (AN 1465-15) - Application Note
This set of application notes shows you how to simplify test system integration by utilizing open connectivity standards such as local area networking (LAN). The collective goal of these notes is to help you produce reliable results, meet your throughput requirements and stay within your budget.

Notes d’application 2005-03-29

PDF PDF 263 KB
Test-System Understanding Drivers and Direct I/O (AN 1465-3) - Application Note
This application note answers common questions about the use of drivers and direct I/O to send commands from a PC application to the test instrument.

Notes d’application 2004-12-21

PDF PDF 374 KB
Using SCPI and Direct I/O vs. Drivers (AN 1465-13) - Application Note
Using SCPI and Direct I/O vs. Drivers, the fifth note in the series, outlines the relationship between input/output (I/O) software, application software and the ability to maximize instrument interchange and software reuse in present and future systems

Notes d’application 2004-12-13

PDF PDF 408 KB
Test-System Computer I/O Considerations (AN 1465-2) - Application Note
The first application note in the series, Introduction to Test-System Design, covers test-system philosophy and planning and discusses how test is used in three sectors: R&D, design validation and manufacturing

Notes d’application 2004-12-09

PDF PDF 189 KB
Using USB in the Test and Measurement Environment (AN 1465-12) - Application Note
Simplify test integration with USB interface. Whether you’re setting up an ad hoc system on a lab bench or designing a permanent solution for a manufacturing line, the three best choices today for connecting modern instrumentation to computers are GPIB, LAN, and USB.

Notes d’application 2004-11-19

PDF PDF 194 KB
System Developer Guide Using LAN in Test Systems - PC Configuration (AN 1465-11) - Application Note
Using LAN in Test Systems: PC Configuration,the third note in the series, describes the additional capabilities required to enable communication between a PC and LAN-enabled instrumentation. This note is a companion to Application Notes 1465-9 and 1465-10.

Notes d’application 2004-10-19

PDF PDF 204 KB
Using LAN in Test Systems - Network Configuration (AN 1465-10) - Application Note
The decision to use LAN in a test system delivers important benefits to your company and your team. From a business perspective, intense competition among equipment vendors has produced a wide selection of high quality, low-cost solutions for local area networking

Notes d’application 2004-09-14

Using LAN in Test Systems: Network Configuration - Application Note
This set of application notes shows you how to simplify test system integration by utilizing open connectivity standards such as local area networking (LAN).

Notes d’application 2004-09-14

Using LAN in Test Systems - The Basics (AN 1465-9) - Application Note
The basic purpose of any test system is to characterize and validate the performance of electronic components, assemblies or products. The complexity of this task depends on variables such as the physical nature of the device under test (DUT), the number of tests to be performed, the number of signals to be measured and the desired time per test.

Notes d’application 2004-07-29

PDF PDF 270 KB
How to use VXIplug&play Drivers with Keysight VEE, C/C++, VB, LabVIEW and LabWindows/CVI
This application note describes how to use VXIplug&play Drivers with Keysight VEE, C/C++, Visual Basic, LabVIEW, and LabWindows/CVI.

Notes d’application 2001-08-09

PDF PDF 237 KB

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