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Electronic Design Automation Software

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Keysight EEsof EDA Software and Modular Solutions for Universities
Keysight works in collaboration with universities to provide tools that enable education and research for the engineers of tomorrow. The brochure outlines available programs, software and hardware.

Brochure 2014-08-03

PDF PDF 1.44 MB
Solutions for Emerging 4G and WLAN Communications Systems - Application Note
This “Solutions for Emerging 4G and WLAN Communication Systems” application note explains how making Digital Pre-Distortion fast and practical for all engineers.

Notes d’application 2014-08-03

IC-CAP Platform Support Roadmap - Selection Guide
Integrated Circuit Characterization and Analysis Program (IC-CAP) platform support roadmap.

Guide de sélection 2014-08-02

Virtual Flight Testing of Radar System Performance Using SystemVue and STK - White Paper
Keysight SystemVue and AGI STK can be integrated to provide virtual flight testing of radar and electronic warfare algorithms, saving both time and money.

Notes d’application 2014-08-02

Simulation and Verification of Pulse Doppler Radar Systems - Application Note
Keysight SystemVue illustrates key algorithms in modern Pulsed Doppler radar system design, and also connects to Keysight sources and signal analyzers to verify hardware performance.

Notes d’application 2014-08-02

PDF PDF 10.44 MB
Simulating Envelope Tracking with Advanced Design System Software - Application Note
This example applies envelope tracking to an example amplifier to show techniques of using Advanced Design System (ADS) for this type of design.

Notes d’application 2014-08-02

PDF PDF 2.38 MB
IC-CAP Device Modeling Software - Technical Overview
This Technical Overview presents Keysight Technologies IC-CAP Device Modeling Software Release 2006. The IC-CAP software automates the process of accurate device characterization for today's RFIC designer.

Présentation technique 2014-08-02

W2349EP/ET ADS Electro-Thermal Simulator - Data Sheet
The ADS Electro-Thermal Simulator provides accurate, "temperature aware" IC simulation results by using device temperatures that take into account thermal coupling, and thermal characteristics.

Fiche signalétique 2014-08-02

Simulation of Airborne, Space Borne and Ship Based Radar Systems with Complex Environment
The presentation reviews several simulation techniques for accurately evaluating radar system performance and may reduce system deployment risks and costs. Handling moving Tx/Rx platforms for Airborne, Space-Borne and Ship based radars is key in determining system performance. It is important to include radar environmental scenarios for interference, clutter, jamming/deception, and radar cross section (RCS). These simulation techniques can be used to analyze advanced radar systems such as phased array, Multiple-Input Multiple-Output (MIMO), active/passive, and multi-static radar systems. Application examples will be demonstrated.

Démonstration de base 2014-08-01

Wideband Digital Pre-Distortion with Keysight SystemVue & PXI Modular Instrument - Application Note
Digital Pre-Distortion (DPD) is essential for wideband communications systems based on LTE-Advanced and 802.11ac. Overcome DPD challenges with trusted commercial measurement and modeling tools.

Notes d’application 2014-08-01

WaferPro Express Product Documentation
WaferPro Express Product Documentation

Manuel de l'utilisateur 2014-08-01

W1717 SystemVue Hardware Design Kit - Data Sheet
The SystemVue W1717EP/ET generates fully synthesizable, hierarchical RTL-level Verilog and VHDL that is bit-true, and cycle accurate.

Fiche signalétique 2014-08-01

Helping you focus where it counts in aerospace and defense - Brochure
This brochure covers the latest A/D test resources focused on Radar, EW, Satellite, MicComm and SDR.

Brochure 2014-08-01

PDF PDF 8.68 MB
Keysight Technologies Begins Operations
Keysight Technologies, Inc. announces the electronic measurement business of Agilent Technologies has begun operating under the Keysight name.

Dossier de presse 2014-08-01

Flexible RF Stimulus Response Validation of Emerging Communications Standards
IMS 2014 - Commercially available flexible simulation tools and flexible instruments can be readily used to create appropriate waveforms by specifying the top level parameters in the time or frequency domains. These can be used to test the emerging and existing RF/MW components and infrastructure and derive the required enhancements to the standards and infrastructure performance.

Démonstration de base 2014-08-01

Controlled Impedance Line Designer in ADS
The Controlled Impedance Line Designer in ADS enables signal integrity engineers to do pre-layout controlled impedance line design by optimizing the substrate stack up and the transmission line geometry.

Démonstration de base 2014-08-01

FPGA Prototyping Using Keysight SystemVue
This application note describes a top-down FPGA design flow using SystemVue for rapid prototyping of physical layer communications signal processing.

Notes d’application 2014-08-01

Simulating High-Speed Serial Channels with IBIS-AMI Models
This paper reviews some of the benefits and limitations of using IBIS models and introduces the new AMI extensions to the latest IBIS version 5.0 specification.

Notes d’application 2014-08-01

Keysight Technologies to Showcase Products, Present Technical Papers at EMC 2014
Keysight announces that it will demonstrate some of its focused products at EMC 2014, the IEEE International Symposium on Electromagnetic Compatibility, Raleigh Convention Center, Booth 323, Raleigh, North Carolina, Aug. 5-7.

Dossier de presse 2014-08-01

Performing Digital-IF/RF-Digital Bit Error Rate Measurement - Application Note
This Application Note describes how to use Keysight Instruments and ADS EDA software to verify RF performance measures such as BER and EVM for end-to-end digital-IF/RF-digital systems--from bits in to bits out.

Notes d’application 2014-07-31

PDF PDF 531 KB
Designing RFID Tags Using Direct Antenna Matching
This Article by Cory Edelman and Murthy Upmaka describes the design challenges involved in RFID design and also focuses on the use of integrated EDA tools to optimally address the challenges.

Article 2014-07-31

PDF PDF 1.09 MB
New LDMOS Model Delivers Powerful Transistor Library - Part 2
This Article presents that the CMC (LDMOS FET) model can be scaled for a larger device, with a good fit for signal, power and distortion performance as illustrated by a 60W Doherty PA design example.

Article 2014-07-31

PDF PDF 716 KB
RF SiP Design Verification Flow with Quadruple LO Down Converter SiP
This Article by HeeSoo Lee and Dean Nicholson outlines the design flow used for a System-in-Package component, using multiple die integrated into a single packaged device.

Article 2014-07-31

PDF PDF 517 KB
Using S-Parameter Data Effectively
This Article by Wilfredo Rivas-Torres focuses on how to incorporate Sparameters in the design process using a CAD approach.

Article 2014-07-31

PDF PDF 248 KB
New LDMOS Model Delivers Powerful Transistor Library - Part 1
This Article presents a new CMC LDMOS model that can accurately predicts both small-signal and nonlinear performance, and is scalable for devices of different sizes and power output capabilities.

Article 2014-07-31

PDF PDF 557 KB

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