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Automating On-Wafer Measurements with the new Agilent IC-CAP WaferPro
Originally broadcast Jan 27, 2011

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DesignCon 2014
Jan 28-31, 2014; Santa Clara Convention Center Download papers presented, order the AEF DVD

展覽會

DesignCon 2015
Jan 27-29, 2014; Santa Clara Convention Center

展覽會

DOCSIS 3.1 Signal Generation and Analysis Solution Webcast
Original broadcast June 25, 2014

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Innovations in EDA Webcast: Measurement-based FET modeling using Artificial Neural Networks (ANNs)
Original broadcast Feb 2, 2012

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Network Analysis Back to Basics Webcast
Recorded broadcast August 21, 2013

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Setting Up IC-CAP WaferPro For On-Wafer Measurements
Original broadcast June 22, 2011

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The Importance and Value of PXI Multi-Vendor Interoperability
Original broadcast March 28, 2012

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Tips, Techniques, and Examples on Using your System Power Supply to Improve Test Throughput Webcast
Live broadcast April 30, 2014; 10am PT / 1pm ET

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